Systems and methods are provided for detecting gaps in composite parts. One method includes radiating a beam of x-rays in a firing direction towards surface of a multi-layer Carbon Fiber Reinforced Polymer (CFRP) part, acquiring data indicating intensity of sidescatter radiation received at an x-ray detector that extends along the CFRP part in the firing direction, and examining the acquired data for gaps at the CFRP part based on differences in intensity indicated by the data.

A spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle, a sample stage configured to support a sample such that the sample is offset from the Rowland circle, an x-ray source configured to emit unfocused x-rays toward the sample stage, and a position-sensitive detector that is tangent to the Rowland circle. A method performed via a spectrometer includes emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer; scattering, via the crystal analyzer, the x-rays that impinge on the crystal analyzer; and detecting the scattered x-rays via a position-sensitive detector that is tangent to the Rowland circle.

A wavelength dispersive X-ray fluorescence spectrometer includes a single one-dimensional detector (10) having detection elements (7) arranged linearly, and includes a detector position change mechanism (11) for setting a position of the one-dimensional detector (10) to either a parallel position at which an arrangement direction of the detection elements (7) is parallel to a spectral angle direction of a spectroscopic device (6) or an intersection position at which the arrangement direction intersects the spectral angle direction. At the parallel position, a receiving surface of the one-dimensional detector (10) is located at a focal point of focused secondary X-rays (42). At the intersection position, a receiving slit (9) is disposed at the focal point of the focused secondary X-rays (42), and the receiving surface is located at a traveling direction side of the focused secondary X-rays (42) farther from the spectroscopic device (6) than the receiving slit (9).

An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).

Disclosed is an arrangement of an X-ray detector and a shielding element shielding X-rays (RX) for increasing the spatial resolution of the X-ray detector, wherein the X-ray detector includes at least one detector line having at least one detector element arranged along the detector line, the shielding element including one or more regions opaque to X-rays (RX) and at least one region transparent to X-rays (RX), the shielding element arranged above the receiving surface for the X-rays (RX) of the at least one detector element, and the shielding element and the at least one detector element are movable relative to each other, so that the effective receiving surface for X-rays (RX) of the at least one detector element is correspondingly variable.

An X-ray imaging inspection system for inspecting items comprises an X-ray source 10 extending around an imaging volume 16, and defining a plurality of source points 14 from which X-rays can be directed through the imaging volume. An X-ray detector array 12 also extends around the imaging volume 16 and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor 20 is arranged to convey the items through the imaging volume 16.

Embodiments of the present application provides a ray scanning apparatus, which includes: a conveying device for conveying an object under inspection to pass through a scanning region of the ray scanning apparatus; a ray source assembly including a plurality of ray source modules, each of the ray source modules including at least one ray source point emitting a ray beam; and a detector assembly for detecting rays transmitting through the object under inspection during scanning and including a plurality of detector sets.

A scan head design uses 1:1 (one-to-one) imaging micro-lens arrays to transfer the object plane X-ray image from a CR-plate onto a linear photosensor. The scan-head includes a housing having therein, an array of red light emitting diodes (LEDs), a microlens array, and a sensor. The housing faces the CR-plate and the scan-head is translated across the CR-plate to read out the X-ray image therein. The scan head is compact and provides for improved spatial resolution and reduced power requirements.

A scanner comprises an electromagnetic wave source; a collimator positioned to alter the electromagnetic waves emitted from the electromagnetic wave source into an electromagnetic beam; and a detector positioned to measure one or more levels of electromagnetic energy of the electromagnetic beam, wherein a collimator element is spatially adjustable in at least one axis via one or more adjusting mechanisms to change the one or more levels of electromagnetic energy measured the detector.

An inspection sorting apparatus includes an X-ray tube with an anode electrode and a cathode electrode, a tank housing the X-ray tube and having insulation oil contained therein, and the anode electrode and the cathode electrode are supplied with a predetermined voltage to generate X-ray. An inspection sorting apparatus has an abnormal discharge determination unit, an LCD display, and a notification control unit. The abnormal discharge determination unit individually detects a first abnormal discharge which is an abnormal discharge inside the X-ray tube, and a second abnormal discharge which is an abnormal discharge inside the tank outside the X-ray tube. The LCD display outputs notification information prompting an administrator to replace the X-ray tube or the tank. The notification control unit causes the LCD display to output the notification information in accordance with a detection result from the abnormal discharge determining unit.