Patent classifications
G01N2223/5015
High resolution X-ray Diffraction Method and Apparatus
An X-ray diffraction apparatus for high resolution measurement combines the use of an X-ray source with a target having an atomic number Z less 50 with an energy resolving X-ray detector having an array of pixels and a beta radiation multilayer mirror for selecting the K-beta radiation from the X-ray source and for reflecting the K-beta radiation onto the sample where it is diffracted onto the energy resolving X-ray detector. The sample may in particular be in transmission. The sample may be a powder sample in a capillary.
Scanning method
A scanning method, which is a method of identifying a change in the density of an object, includes arranging a source of ionizing radiation and an array of radiation detectors Dn, where n is an integer from 1 to N, capable of detecting the radiation in such a way that radiation counts are counted by the detectors as the source and detectors are rotated around the object. Detectors are arranged in conjugate pairs so that missing data due to a malfunctioning detector may be filled in from its conjugate.
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS
An inspection sorting apparatus includes an X-ray tube with an anode electrode and a cathode electrode, a tank housing the X-ray tube and having insulation oil contained therein, and the anode electrode and the cathode electrode are supplied with a predetermined voltage to generate X-ray. An inspection sorting apparatus has an abnormal discharge determination unit, an LCD display, and a notification control unit. The abnormal discharge determination unit individually detects a first abnormal discharge which is an abnormal discharge inside the X-ray tube, and a second abnormal discharge which is an abnormal discharge inside the tank outside the X-ray tube. The LCD display outputs notification information prompting an administrator to replace the X-ray tube or the tank. The notification control unit causes the LCD display to output the notification information in accordance with a detection result from the abnormal discharge determining unit.
X-RAY SIDESCATTER INSPECTION OF LAMINATES
Systems and methods are provided for detecting gaps in composite parts. One method includes radiating a beam of x-rays in a firing direction towards surface of a multi-layer Carbon Fiber Reinforced Polymer (CFRP) part, acquiring data indicating intensity of sidescatter radiation received at an x-ray detector that extends along the CFRP part in the firing direction, and examining the acquired data for gaps at the CFRP part based on differences in intensity indicated by the data.
X-RAY SCANNING FOR INSPECTION OF PACKAGES ON GROUND
A portable scanner is presented that is especially suited for x-ray inspection of packages that are left behind on rough terrain. An x-ray source and a linear detector are used to implement a transmissive x-ray imaging of an object or a package. A special feature of this invention is that the linear detector is first placed horizontally on the ground or the rough terrain and vertically moved upwards to implement the scan. The detector may be moved upwards either in an angular movement or in a linear motion.
METHOD FOR OPERATING AN X-RAY DEVICE AND ASSOCIATED X-RAY DEVICE
A method is disclosed for operating an x-ray device, in particular a computed tomograph, including a controller and a number of detector units coupled thereto for signaling purposes. Each of the detectors includes a functional unit and a number of detector elements coupled thereto. In an embodiment of the method, a synchronized clock signal for activating the detector elements is created from a control signal of the controller on the functional unit side.
ARTICULATED SEGMENTED X-RAY DETECTOR SYSTEM AND METHOD
A system, method and an apparatus are provided for imaging a target object, such as, e.g. a pipeline or aircraft, and may include an articulated segmented x-ray detector comprising a plurality of individual x-ray detector segments, which may be CMOS detectors or other type of semiconductor detector, articulately connected to one another. The articulately connections permit rotation of each x-ray detector segments which also permits conformity to the shape of a target object. A camera controller may be connected to each of the plurality of individual x-ray detector segments for receiving image data from each individual x-ray detectors. A flexible mat containing x-ray blocking objects may be connected to the articulated segmented x-ray detector to provide reference potions in the image data and for use in processing the image data.
System, method, and apparatus for x-ray backscatter inspection of parts
Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The x-ray backscatter apparatus comprises an x-ray source and an x-ray collimator. The x-ray collimator comprises a plurality of emission apertures and a detection aperture. The x-ray backscatter apparatus further comprises an x-ray intensity sensor that is fixed to the x-ray collimator over the detection aperture such that any portion of an uncollimated x-ray emission collimated into the detection aperture is detected by the x-ray intensity sensor. The x-ray backscatter apparatus additionally comprises an emission alignment adjuster that is operable to adjust a position of the uncollimated x-ray emission relative to the plurality of emission apertures and the detection aperture in response to a position, relative to the detection aperture, of a peak intensity of the uncollimated x-ray emission passing into the detection aperture, detected by the x-ray intensity sensor.
X-RAY ANALYZER
An X-ray analyzer includes an analyzing crystal configured to spectrally disperse characteristic X-rays for each wavelength, the characteristic X-rays being generated by a sample irradiated with the excitation ray, and a plurality of detection elements arranged to each detect intensity of a characteristic X-ray for each wavelength, the characteristic X-ray being spectrally dispersed by the analyzing crystal. An angle between a direction of the characteristic X-ray spectrally dispersed at a middle point of an effective surface of the analyzing crystal and an array direction of the plurality of detection elements is less than 80 degrees or 100 degrees or more.
X-ray inspection device
Provided is a highly reliable X-ray inspection device having two line sensors, in which accurate inspection results can be obtained even when there is displacement of the mounting position of the line sensors. The X-ray inspection device is provided with a conveyor unit for conveying an article, an X-ray emitter, a first line sensor, a second line sensor, a detection unit, and a corrected-image generation unit. The X-ray emitter emits X-rays to the article conveyed by the conveyor unit. The first line sensor detects, in a low energy band, X-rays that have passed through the article. The second line sensor detects, in a high energy band, X-rays that have passed through the article. The detection unit detects positional displacement of the second line sensor with respect to the first line sensor in horizontal direction and vertical direction.