A robot system for non-destructive testing (NDT) of a test object, including: a transducer holder and an NDT transducer to perform an NDT on the surface of the test object; a memory to store a predefined trajectory of the NDT transducer; a force-sensing device to provide measurements of the contact forces and/or contact moments between the surface of the test object and the NDT transducer and/or the transducer holder; a controller to generate an actuation signal based on the predefined trajectory; and a positioning device to control the position and/or orientation of the NDT transducer relative to the test object based on the actuation signal. Consequently, the position and/or orientation of the NDT transducer relative to the test object and the contact forces and/or contact moments between the NDT transducer and/or the transducer holder and the test object can be automatically adapted to improve the quality of the NDT measurement.

Disclosed is a flexible coil circuit for a non-destructive inspection probe. The coil circuit is made of multiple layers of thin flexible ceramic material, each ceramic layer having a metallization layer deposited thereon. The circuit is capable of continuous operation at temperatures up to 350° C. The metallized layers are able to slide freely over one another as the probe is flexed, enabling the probe to conform to the circumference of pipes as small as 2 inches in diameter.

A non-destructive inspection apparatus includes a robotic device, an end effector coupled to the robotic device, and a controller coupled to the robotic device and the end effector. The controller is configured to determine, based on an amount of linear actuator extension of a sensor of the end effector and an amount of rotation of the sensor about a first axis of rotation and a second axis of rotation, a displacement of the sensor relative to a center point of the end effector surface so as to determine location information of the sensor, wherein sensor data for a location on a surface of a test article is sensed and correlated with the determined location information of the sensor. The robotic device controls movement of the end effector and is configured to determine, during the movement of the end effector, positional information for the center point of the end effector surface.

The present invention relates to a scanner having a flexible probe which is an apparatus capable of being utilized for an inspection on a weld zone of a general ferrite material and a stainless material and allowing an inspection to be performed on a fitting weld zone where it is difficult for a general phased array ultrasonic testing (PAUT) probe to approach. A scanner having a flexible probe according to the present invention includes a probe fixing body (110) which moves while coming into contact with a surface of a bent fitting pipe and to which a probe body (101) is fixed, a flexible connecting chain part (120) installed to be connected to one end of the probe fixing body (110) and having a freely bendable structure, a sensor installation part (130) installed on an end of the flexible connecting chain part (120) and configured to move while pressed against the surface of the fitting pipe, a sensor (140) which is connected to the probe body (101) in a flexible state and of which an end is installed on the sensor installation part (130) and scans a weld zone of the fitting pipe, and an encoder part (150) installed to be connected at one side of the probe fixing body (110) and configured to move while pressed against the fitting pipe and detect a moving distance and a position.

According to one embodiment, an inspection device includes a transmitter configured to transmit a first ultrasonic wave, a receiver on which the first ultrasonic wave is incident, and a receiving-side waveguide located between the receiver and an inspection position. The receiver is configured to output a signal corresponding to the incident first ultrasonic wave. The inspection position is between the transmitter and the receiver. The first ultrasonic wave passes through the receiving-side waveguide. An inspection object passes through the inspection position along a second direction crossing a first direction. The first direction is from the transmitter toward the receiver. The receiving-side waveguide includes at least one of a first structure or a second structure. In the first structure, the receiving-side waveguide includes a tubular member and an inner member. The inner member is located inside the tubular member. In the second structure, the receiving-side waveguide includes a tubular member.

Methods, systems and apparatuses are disclosed for non-destructively a substrate using ultrasound waves, and enhancing resolution of imaging created from ultrasound signals that are back reflected from a substrate surface second, or back surface by maintaining the incident angles of the ultrasonic beams at the substrate second surface such that the ultrasonic beams strike the substrate second surface at an angle that is substantially perpendicular to the complex geometric profile of the substrate second surface by supplying known spatial coordinates to the system to maintain the incident angles of the ultrasonic beams at a predetermined angle relative to the substrate second surface.

An ultrasonic inspection device for inspection of a structure. The device includes a body with a first side and a second side that are on opposing sides of a gap. The gap is sized to receive the structure. A probe is attached to the first side and transmits ultrasonic signals at the structure. A reflector plate is attached to the second side and is fixed relative to the probe and reflects the signals that pass through the structure. The probe is configured to detect the signals that reflect off the structure and to detect the signals that pass through the structure and reflect off the reflector plate. The received signals provide for pulse echo and through transmission inspection of the structure.

A stabilized ultrasonic probe includes a housing, at least one ultrasonic transducer, a flexible delay line, and a stabilizing element. The housing can be tubular and extend from a proximal to a distal end and define a cavity therein. The transducer can be positioned within the housing. The delay line can include recessed and tip portions. The recessed portion can be within the cavity and extend from the transducer(s) to the housing distal end. The tip portion can extend from the housing distal end to a distal terminal end of the delay line. The stabilizing element can be coupled to the housing distal end and extend distally from the housing distal end to a target facing surface. The stabilizing element can circumferentially surround at least part of the delay line tip portion. A stabilizing element modulus can be greater than or equal to a delay line modulus.

A stabilized ultrasonic probe includes a housing, at least one ultrasonic transducer, a flexible delay line, and a stabilizing element. The housing can be tubular and extend from a proximal to a distal end and define a cavity therein. The transducer can be positioned within the housing. The delay line can include recessed and tip portions. The recessed portion can be within the cavity and extend from the transducer(s) to the housing distal end. The tip portion can extend from the housing distal end to a distal terminal end of the delay line. The stabilizing element can be coupled to the housing distal end and extend distally from the housing distal end to a target facing surface. The stabilizing element can circumferentially surround at least part of the delay line tip portion. A stabilizing element modulus can be greater than or equal to a delay line modulus.

Ultrasonic flaw detection uses a phased-array ultrasonic-flaw-detection probe. The flaw detection probe is placed such that the center of curvature of the flaw detection probe coincides with a reference center of curvature of a subject. The flaw detection probe is translated along a scan direction. The flaw detection probe emits an ultrasonic beam such that the position upon which the ultrasonic beam converges coincides with the center of curvature of the curve of the outline of the cross section of the subject at the scan position, receives the resulting reflected beam, and estimates the length of a flaw in the circumferential direction of the subject. In addition, the estimated length of the flaw is corrected using a correction coefficient corresponding to the distance between the center of curvature of the reference scan position and the center of curvature of the scan position in the thickness direction of the subject.