The present invention relates to an atomic force microscope for evaluating a surface of a sample, comprising a sample holder, having a first zone suitable for receiving the sample mounted in a stationary manner, a probe having a tip able to be positioned facing the surface of the sample, the microscope being configured to allow an adjustment of a position of the tip relative to the surface, and a support, the sample holder having at least one second zone, separate from the first zone and stationary relative to the support, the sample holder being deformable so as to allow a relative movement of the first zone with respect to the second zone, and the microscope comprising a detector able to detect a movement of the first zone relative to the second zone.

All fluids, when placed within a Kukharev region at a moment of gravitational resonance, form vibrations of different frequencies within themselves. If, at the same moments of gravitational resonance, forced oscillations of the same frequency are provided as a treatment on a living organism, a double resonance is formed within the fluid, and a sharp increase in the amplitude of oscillations within the fluid formed as a result of the double resonance in turn causes the destruction of the fluid. The method is determined utilizing Kukharev region data on the particular fluid desired to be destroyed or otherwise removed from the living organism. By further fine-tuning the forced oscillation (i.e., the directed radiation), the natural oscillations of the base fluid can be further adjusted to modify the fluid's properties.

All fluids, when placed within a Kukharev region at a moment of gravitational resonance, form vibrations of different frequencies within themselves. If, at the same moments of gravitational resonance, forced oscillations of the same frequency are provided as a treatment on a living organism, a double resonance is formed within the fluid, and a sharp increase in the amplitude of oscillations within the fluid formed as a result of the double resonance in turn causes the destruction of the fluid. The method is determined utilizing Kukharev region data on the particular fluid desired to be destroyed or otherwise removed from the living organism. By further fine-tuning the forced oscillation (i.e., the directed radiation), the natural oscillations of the base fluid can be further adjusted to modify the fluid's properties.

Active cantilever probes having a thin coating incorporated into their design are disclosed. The probes can be operated in opaque and/or chemically harsh environments without the need of a light source or optical system and without being significantly negatively impacted by corrosion. The probes include a substrate that has a cantilever, a thermomechanical actuator associated with the cantilever, a piezoresistive stress sensor disposed on the cantilever, and a thin coating disposed on the cantilever and the piezoresistive stress sensor. The coating is bonded to the substrate, is thermally conductive, and has a low thermal resistance. Further, the thin coating is configured to have little to no impact on one or more of a mass of the active probe, a residual stress of the cantilever, or a stiffness of the active probe. Techniques for performing topography and making other measurements in an opaque and/or chemically harsh environment are also provided.

Active cantilever probes having a thin coating incorporated into their design are disclosed. The probes can be operated in opaque and/or chemically harsh environments without the need of a light source or optical system and without being significantly negatively impacted by corrosion. The probes include a substrate that has a cantilever, a thermomechanical actuator associated with the cantilever, a piezoresistive stress sensor disposed on the cantilever, and a thin coating disposed on the cantilever and the piezoresistive stress sensor. The coating is bonded to the substrate, is thermally conductive, and has a low thermal resistance. Further, the thin coating is configured to have little to no impact on one or more of a mass of the active probe, a residual stress of the cantilever, or a stiffness of the active probe. Techniques for performing topography and making other measurements in an opaque and/or chemically harsh environment are also provided.

An apparatus and method of analysis including at least one microscope means operable to characterize the surface of a sample in use, at least a first conduit to convey one or more solvents to the sample and a further conduit to convey at least part of the solution from the sample. At least one pump means delivers solvent to the sample and/or removes solution from the same.

An apparatus and method of analysis including at least one microscope means operable to characterize the surface of a sample in use, at least a first conduit to convey one or more solvents to the sample and a further conduit to convey at least part of the solution from the sample. At least one pump means delivers solvent to the sample and/or removes solution from the same.

A method of performing atomic force microscopy (AFM) measurements, uses an ultrasound transducer to transmit modulated ultrasound waves with a frequency above one GHz from the ultrasound transducer to a top surface of a sample through the sample from the bottom surface of the sample. Effects of ultrasound wave scattering are detected from vibrations of an AFM cantilever at the top surface of the sample. Before the start of the measurements, a drop of a liquid is placed on a top surface of the ultrasound transducer. The sample is placed on the top surface of the ultrasound transducer, whereby the sample presses the liquid in the drop into a layer of the liquid between the top surface of the ultrasound transducer and a bottom surface of the sample. The AFM measurements are started after a thickness of the layer of the liquid has stabilized.

A method of performing atomic force microscopy (AFM) measurements, uses an ultrasound transducer to transmit modulated ultrasound waves with a frequency above one GHz from the ultrasound transducer to a top surface of a sample through the sample from the bottom surface of the sample. Effects of ultrasound wave scattering are detected from vibrations of an AFM cantilever at the top surface of the sample. Before the start of the measurements, a drop of a liquid is placed on a top surface of the ultrasound transducer. The sample is placed on the top surface of the ultrasound transducer, whereby the sample presses the liquid in the drop into a layer of the liquid between the top surface of the ultrasound transducer and a bottom surface of the sample. The AFM measurements are started after a thickness of the layer of the liquid has stabilized.

Techniques for determining a characteristic of a sample using an atomic force microscope including a cantilever having a probe attached thereto, including positioning the sample within a cell and sliding the probe over a sliding zone of the sample within the cell. Lateral and vertical deformations of the cantilever are detected using the atomic force microscope as the probe is slid over the sliding zone. One or more characteristics are determined based on the detected lateral deformations of the cantilever.