Contactor arrangement of an IC test handler, comprising: a contactor unit which has test contacts for contacting an IC in test and for temporarily pressing the IC against the test contacts, a plunger head, which has a recessed central region corresponding to the geometrical configuration of the IC, such that those surface of the IC which is adjacent to the upper surface of the plunger head does not touch the plunger head surface, and a contactor unit interface, which includes a vacuum suction system for actively attracting the IC to an IC contact surface of the contactor unit interface, that corresponds with an adjacent surface of the IC having IC device contacts and, thus, towards the test contacts of the contactor unit.

The invention relates to a test block intended to be implanted in the circuit connecting an apparatus to be tested such as an electricity meter or a protective relay and a power source supplying the apparatus to be tested such as an intensity sensor and/or a voltage sensor. The test block comprises a base including a plurality of inner electric circuits capable of allowing the transmission of information from the power source to the apparatus to be tested and a protective cover intended to be assembled in a dismountable manner with the base in order to form a closed enclosure in which the inner electric circuits are housed. The base and the protective cover are configured such that the removal of the protective cover gives access to a receiving site delimited by the base and capable of receiving by plugging a test plug independent of the test block and electrically linked to a test equipment, in particular a voltmeter and/or an ammeter and/or a dummy current source. A test appliance is also described.

There is described a test block intended to be implanted in the circuit connecting an apparatus to be tested such as an electricity meter or a protective relay and a power source supplying the apparatus to be tested such as an intensity sensor and/or a voltage sensor, the test block comprising a base including a plurality of inner electric circuits capable of allowing the transmission of information from the power source to the apparatus to be tested and a protective cover intended to be removably assembled with the base in order to form a closed enclosure in which the inner electric circuits are housed. The base and the protective cover are configured such that the removal of the protective cover gives access to a receiving site delimited by the base and capable of receiving, by plugging, a test plug independent of the test block and electrically linked to a test equipment, in particular a voltmeter and/or an ammeter and/or a dummy current source. The base and the protective cover comprise electrically conductive elements linked to each other and configured so as to ensure a continuity and magnetic shielding closure such that the enclosure delimited by the base and the protective cover is a Faraday cage protecting the inner electric circuits relative to the magnetic fields external to the enclosure delimited by the base and the protective cover.

A mechanical reliability testing platform for tri-post insulators in a GIL device includes a horizontal-GIL-arrangement-form fixed-tri-post-insulator mechanical reliability verification testing platform for a horizontal dynamic insertion and extraction test, and a turning-GIL-arrangement-form fixed-tri-post-insulator mechanical reliability verification testing platform for a vertical dynamic insertion and extraction test. A driving unit is employed to realize the insertion and extraction of the conducting rod of the sliding-tri-post-insulator GIL form unit at the contact holder, so as to simulate the reciprocating forces on the fixed tri-post insulator induced by the thermal expansion and contraction of the pipe during the actual operation of the GIL, and simulate the working condition of the fixed tri-post insulator under abnormal forces when the GIL experience foundation settlement.

A probe that enables a circuit board for electronic components, which is a measurement subject, to be disposed more densely. The probe is capable of simultaneously measuring a plurality of locations. The probe includes a plurality of main body portions having central conductors that make contact with connectors, and a first member that binds the plurality of main body portions together. A recess portion, having a base surface from which tip ends of the plurality of central conductors project, is provided in the first member. The recess portion has a sloped surface that flares outward from a base portion of the recess portion toward an opening in the recess portion.

A calibrated test and measurement cable for connecting one or more devices under test and a test and measurement instrument, including a first port structured to electrically connect to a first signal lane, a second port structured to electrically connect to a second signal lane, a third port structured to electrically connect to a test and measurement instrument, and a multiplexer configured to switch between electrically connecting the first port to the third port and connected the second port to the third port. The first and second signal lanes can be included on the same device under test or different devices under test. An input can receive instructions to operate the multiplexer.

A semiconductor chip is provided with first and second electrode pads, a first current detector, and a third electrode pad. The first and second electrode pads are both to be wire-bonded to a first lead terminal. The first current detector is connected between the first and second electrode pads. The third electrode pad is wire-bonded to a second lead terminal. A first closed circuit is configured by the first lead terminal, the first electrode pad, the first current detector, and the second electrode pad. An induced current flows through the first closed circuit when a current generating an induced electromotive force is applied to the third electrode pad. The first current detector is configured to output different values depending on whether the induced current exceeds a threshold value or not.

An electrical plug for testing an electrical mains socket is provided. The plug comprises a pin for engagement with a pin receptor of the mains socket. The pin comprises first and second electrical contacts, each comprising a surface portion to engage with a different respective region of the receptor. The first and second contacts are electrically isolated from one another at the pin. An electrical testing system and a method of testing an electrical mains socket is provided. The testing system comprises the electrical plug and a first circuit connected to the contacts and configured to measure an electrical resistance therebetween. The method includes providing the electrical plug and measuring an electrical resistance between the electrical contacts. A further method is provided for testing an electrical mains plug comprising a pin, by providing an electrical socket with a pin receptor having first and second regions electrically isolated from one another.

The present invention discloses a test platform for high-frequency cable, comprising conductive contacts and clamps for pressing a conductor of the cable on the conductive contact, and comprising a splitter seat, which comprises a top surface and a plurality of varied sides, the conductive contacts are respectively arranged on the sides, the clamps are arranged at a peripheral of the splitter seat and is opposite to the conductive contact, the splitter seat is further provided with a splitter channel, and the splitter channel slantingly connects the top surface to the sides. The present invention adopts a splitter seat with a polyhedral structure, which may shorten the stripped length, and prevent for vertically bending the core, thereby reducing the damage to the cable structure to the greatest extent, and greatly increasing the test frequency.

A circuit assembly for forming and testing batteries connected in parallel and in series includes a parallel test management device (PTMD) that connects to each battery and includes a main relay and a current transducer in series and an auxiliary relay in series with a current limiting resistor, which are parallel to the main relay. Parallel battery groups are formed by connecting multiple PTMD-battery combinations and a voltage equalizer in parallel. Multiple parallel battery groups are connected in series. A high-current, high-density battery testing system (BTS) connects to a battery formation rack that uses a double-sided PCB and double-polarity edge connector sockets for receiving a battery tray on a PCB having an edge connector for forming and testing over 1,000 batteries. This smart battery tray replaces a bulky, complicated engagement system and reduces the requirement for BTS channels and cables substantially. An aging rack monitors battery voltage on the smart battery tray. The equalizers and BTS pass current through the batteries simultaneously. The current through batteries and the voltage drop across the current transducer are about zero at the end of charge and discharge. Battery capacity and coulombic efficiency are measured using CCCV charge and CCCV discharge rather than CCCV charge and CC discharge.