A test and measurement system is disclosed that includes an input for receiving a digital bus conducting a plurality of digital values, a display, and a memory. The memory stores hit frequencies for the digital values, and stores data indicating the digital values. The test and measurement system also includes at least one processor coupled to the display and the memory. The processor causes the display to depict the digital values and hit frequencies of the digital values by depicting persistence of the digital values over time and by depicting decay of the digital values over time.

The present invention provides a method for 3D waveform mapping of full-parallel structure, first, a 3D waveform mapping database is created according to the size of a 3D waveform image, the number of bits of probability value and the ADC's resolution of data acquisition module, then the 3D waveform mapping database is divided into M.sub.tM.sub.a independent mapping storage areas along the time axis and the amplitude axis, and each independent mapping storage area is assigned a RAM, then RAMs are selected and addresses are calculated based on the sampling values and the structure of created 3D waveform mapping database, finally, parallel mappings are performed simultaneously on the time axis and the amplitude axis according to the selected RAMs and calculated addresses. Thus, the mapping time are shorten, especially in vector mapping mode, several RAMs are used for mapping, so the WCR of DSO is improved.

The present invention provides a method for 3D waveform mapping of full-parallel structure, first, a 3D waveform mapping database is created according to the size of a 3D waveform image, the number of bits of probability value and the ADC's resolution of data acquisition module, then the 3D waveform mapping database is divided into M.sub.tM.sub.a independent mapping storage areas along the time axis and the amplitude axis, and each independent mapping storage area is assigned a RAM, then RAMs are selected and addresses are calculated based on the sampling values and the structure of created 3D waveform mapping database, finally, parallel mappings are performed simultaneously on the time axis and the amplitude axis according to the selected RAMs and calculated addresses. Thus, the mapping time are shorten, especially in vector mapping mode, several RAMs are used for mapping, so the WCR of DSO is improved.

A tool is presented herein capable of performing several electrical measurements and generating several electrical outputs. The tool can be configured to perform measurements and provide outputs most commonly utilized when developing and diagnosing failures of a hardware platform based around a microcontroller. The tool can have a form factor and a header configuration compatible for mating with an external microcontroller or minicomputer developer board such as Arduino, UDOO, Raspberry Pi, TI LaunchPad, STM Nucleo, BeagleBone, etc.

A tool is presented herein capable of performing several electrical measurements and generating several electrical outputs. The tool can be configured to perform measurements and provide outputs most commonly utilized when developing and diagnosing failures of a hardware platform based around a microcontroller. The tool can have a form factor and a header configuration compatible for mating with an external microcontroller or minicomputer developer board such as Arduino, UDOO, Raspberry Pi, TI LaunchPad, STM Nucleo, BeagleBone, etc.

A measuring device is used to increase a contrast of a plurality of measured values displayed in a spectrogram or spectral histogram and contains a data-acquisition unit, a computer unit and a statistic unit. The data-acquisition unit is embodied to detect a plurality of measured values to be displayed. The statistic unit is embodied to calculate a distribution which contains the frequency of occurrence for every level value of the measured values to be displayed. The computer unit is embodied to specify a dynamic range, over which the contrast extends. In this context, a specified proportion of the level values which image the noise are not used for the specification of the dynamic range.

The present invention relates to a measurement or inspection apparatus which can be adjusted depending on a color of a plugged-in cable. In this manner the display of measurement values and the colour of the plugged-in cable can be coordinated to each other such that a simple assignment between measurement values and cable can be performed.

A test and measurement system is disclosed that includes an input for receiving a digital bus conducting a plurality of digital values, a display, and a memory. The memory stores hit frequencies for the digital values, and stores data indicating the digital values. The test and measurement system also includes at least one processor coupled to the display and the memory. The processor causes the display to depict the digital values and hit frequencies of the digital values by depicting persistence of the digital values over time and by depicting decay of the digital values over time.

A method for reducing a number of bits used for a frequency value of a measuring signal stored in each memory cell of a display memory in a measuring device determines the frequency value in each memory cell by assigning the frequency of sampled values in several measuring portions of a measured signal within an update cycle of the display to a corresponding memory cell. It then displays each pixel of the display with a brightness or a color corresponding to the frequency value in the corresponding memory cell after each update cycle. The determined frequency value is a sum of a first frequency value, which is determined in a number of first measuring portions of the measured signal within the update cycle, and at least one compressed second frequency value, which is determined by compression of a corresponding compressed second frequency value with a compression factor. Each uncompressed second frequency value can be determined in a corresponding part of a number of second measuring portions of the measured signal within the update cycle.

An embodiment of the present disclosure provides a signal analysis interaction method, a signal analysis apparatus, an electronic device, and a computer-readable storage medium. The method includes displaying a signal analysis item configuration interface in the screen; obtaining a first control operation via the signal analysis item configuration interface to determine one or more analysis items to be performed; displaying a waveform image of at least one obtained signal according to the obtained signal; displaying a selection area in response to a second control operation, where the selection area is configured to indicate an area selected through the second control operation; obtaining a parameter of a signal selected through the second control operation according to an image in the selection area; and performing the one or more analysis items to be performed according to the parameter of the signal and displaying a performing result.