An improved selection of a specific position in a measured signal is provided. For this purpose, a coarse selection of a position is received and subsequently one or more specific events nearby the coarse position are identified. Accordingly, one of the identified events may be selected and precise positioning on the selected event is performed.

Methods are described to provide a new and improved display of phase identification measurements in a three-phase power distribution network, that is easier and more intuitive to interpret and define tagging reference phase. A short sequence of individual phase measurements are displayed as dots inside a static phase attribute display circle. The 3 primary, 12 secondary, and 6 three-phase attributes are displayed around the outside of the phase circle. When using a touch screen Smartphone or Tablet display device, the user simply touches inside the phase circle to rotate the dots around the center of the phase circle, so they line up with the known conductor phase attribute. This rotation defines the tagging reference phase for the circuit.

Methods are described to provide a new and improved display of phase identification measurements in a three-phase power distribution network, that is easier and more intuitive to interpret and define tagging reference phase. A short sequence of individual phase measurements are displayed as dots inside a static phase attribute display circle. The 3 primary, 12 secondary, and 6 three-phase attributes are displayed around the outside of the phase circle. When using a touch screen Smartphone or Tablet display device, the user simply touches inside the phase circle to rotate the dots around the center of the phase circle, so they line up with the known conductor phase attribute. This rotation defines the tagging reference phase for the circuit.

The present invention relates to an analysis of a waveform of a signal. A waveform of the signal is divided into multiple sections and a signal integrity identifier is assigned to each section. Accordingly, a representation of the respective signal integrity identifier may be provided for each section of the waveform. The representation of the signal integrity identifier may comprise an abstract representation, for example a graphical element, an alphanumeric element, a color or even an audio signal.

Methods for analyzing a measured signal, and a measurement unit for carrying out these methods, are provided. The method includes, acquiring at least a first segment and a second segment of the measured signal by a measurement unit; storing the at least a first segment and a second segment in an acquisition memory of the measurement unit; applying a filter on the at least a first segment and a second segment; and storing at least one segment of the at least a first segment and a second segment that corresponds to the filter into at least one of a display memory and a processor memory of the measurement unit.

The present invention relates to an analysis of a waveform of a signal. A waveform of the signal is divided into multiple sections and a signal integrity identifier is assigned to each section. Accordingly, a representation of the respective signal integrity identifier may be provided for each section of the waveform. The representation of the signal integrity identifier may comprise an abstract representation, for example a graphical element, an alphanumeric element, a color or even an audio signal.

A measurement system has an analog channel comprising an analog-to-digital converter for converting an external analog input signal into a corresponding digital input signal, an external trigger input for receiving an external trigger signal comprising a comparator configured to compare the external trigger signal against a trigger threshold signal for generating a binary trigger signal, and a digital signal processing unit. The digital signal processing unit comprises a digital trigger unit configured to receive the digital input signal and to generate at least one trigger event signal based on the digital input signal, and a trigger logic unit configured to receive the at least one trigger event signal and the binary trigger signal to generate a combined trigger signal. Further, a method for generating a trigger signal for a measurement system is described.

A method for operating an oscilloscope is described, wherein a waveform axis scale input value is detected. Further, a record length input value is detected. An oscilloscope operating point is determined relative to at least one predetermined operating mode limit. In addition, a method for operating an oscilloscope as well as an oscilloscope are described.

The invention relates to a method for investigating signal parameters in an electrical measuring device with a display element with the method steps: display of a detected signal on the display element, manual masking of at least one signal component of the signal by a user by means of a masking element of the measuring device and investigation of signal parameters from the masked signal component or from the unmasked signal component of the signal by the measuring device. At least one further signal parameter is also investigated alongside the time duration and the bandwidth of the masked signal component. According to the invention, a corresponding measuring device is also provided.

A waveform display device includes: an operation accepting unit for accepting operation by a user; and a display controller for generating waveform display screen including a program pattern waveform for program control and an actual measurement waveform based on measurement data obtained as a result of the program control, with the program pattern waveform and the actual measurement waveform being superimposed on each other, and a cursor indicating a section between a past time area showing a program pattern waveform and an actual measurement waveform in the past time and a future time area showing a future program pattern waveform. The operation accepting unit is configured to accept scroll operation for changing a position of the cursor in the waveform display screen. The display controller is configured to change the position of the cursor in the waveform display screen in accordance with the scroll operation.