Patent classifications
G01R13/0254
Bus decode and triggering on digital down converted data in a test and measurement instrument
A test and measurement instrument including a digital down converter configured to receive a bus signal and output in-phase and quadrature-phase baseband component waveform data, a trace generator configured to receive the in-phase and quadrature-phase baseband component waveform data and generate at least one radio frequency versus time trace, a decoder configured to receive the at least one radio frequency versus time trace and decode the bus signal based on the at least one radio frequency versus time trace and a wireless modulation scheme, and a trigger configured to capture at least a portion of the bus signal based on the decoded bus signal.
Categorization of acquired data based on explicit and implicit means
A method of classifying waveform data includes receiving input waveform data at a test and measurement system, accessing a repository of reference waveform data and corresponding classes, analyzing the input waveform data and the reference waveform data to designate a class of the input waveform data, and using the class designation to provide information to a user. A test and measurement system has a user interface, at least one input port, a communications port, a processor, the processor configured to execute instructions causing the processor to: receive input waveform data through at least one of the input port or the user interface; access a repository of reference waveform data; analyze the input waveform data using the reference waveform data; designate a class of the input waveform data; and use the class to provide information to the user about the input waveform.
Abstracting of digital acquisition memory
An abstracted digital memory acquisition circuit, including an analog input configured to receive an analog signal, an analog-to-digital converter configured to receive the analog signal and convert the analog signal to a first digital signal, a digital input configured to receive a second digital signal, a controller configured to receive the first digital signal and the second digital signal and output a stream of bits, the stream of bits including the first digital signal and the second digital signal, and a control signal, and an output configured to electrically connect to a digital input of a test and measurement instrument and output the stream of bits and the control signal.
AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION
An automated test equipment comprises a main test flow control configured to operate a test flow in multiple device communication units and/or to provide the trigger configuration information to a local compute unit. The automated test equipment further comprises a device communication unit comprising a trigger generation unit configured to generate a trigger signal. The trigger generation unit further configured to extract payload data from a protocol-based data stream received from the device under test, and to generate the trigger signal in response to the extracted payload data or in response to one or more protocol events. A method and a computer program for testing one or more devices under test in an automated test equipment are also disclosed.
System and method for reducing error in time domain waveform of a signal under test (SUT)
A method and system provide for measuring a repeating waveform of a SUT. The method includes repeatedly sampling first and second copies of the SUT to provide first SUT waveforms including first noise introduced by a first digitizer and second SUT waveforms including second noise introduced by a second digitizer; pairing the first and second SUT waveforms to provide corresponding pairs of first and second digital samples; organizing the pairs of first and second digital samples into groups of sample pairs corresponding to sampling times; for each group, calculating a covariance of the first and second digital samples to estimate a signal variance of the SUT, and scaling the first and second digital samples to preserve a mean of the group while adjusting a variance of the group to match the estimated signal variance of the SUT at the corresponding sampling time; and reassembling the groups into the SUT waveform.
Measurement device with arbitrary waveform generator and trigger unit
A measurement device comprising a housing, a measurement channel, a trigger unit connected to the measurement channel, and an arbitrary waveform generator housed within the housing is disclosed. The measurement channel comprises an acquisition unit. The trigger unit is configured to detect a predetermined trigger event in a signal processed by the measurement channel. The trigger unit is configured to control the acquisition unit, and the trigger unit is configured to control the arbitrary waveform generator. Moreover, a measurement system and a method for operating a measurement device are disclosed.
Measurement system and method for generating a trigger signal for a measurement system
A measurement system has an analog channel comprising an analog-to-digital converter for converting an external analog input signal into a corresponding digital input signal, an external trigger input for receiving an external trigger signal comprising a comparator configured to compare the external trigger signal against a trigger threshold signal for generating a binary trigger signal, and a digital signal processing unit. The digital signal processing unit comprises a digital trigger unit configured to receive the digital input signal and to generate at least one trigger event signal based on the digital input signal, and a trigger logic unit configured to receive the at least one trigger event signal and the binary trigger signal to generate a combined trigger signal. Further, a method for generating a trigger signal for a measurement system is described.
Method and evaluation unit for determining a time of a flank in a signal
The invention relates to a method for determining a time of a flank in a signal, wherein the method comprises a step of reading the signal and has a master clock rate for operating a digital evaluation unit for evaluating the time of the flank. The method also comprises a step of forming a data word representing the signal, using a deserializer of a SERDES cell, wherein the data word has a plurality of bits, and wherein a sampling clock rate is applied to the SERDES cell for sampling the signal, which sampling clock rate is higher than the master clock rate, wherein one flank or two flanks of the sampling clock rate are used for sampling the signal. Finally, the method comprises a step of determining the time of the flank in the signal using the data word and the master clock rate in the evaluation unit.
Signal detection and monitoring
A method, system, and computer program product for detecting and monitoring a signal is provided. The method includes detecting an alignment point for a periodic signal segment of a periodic signal generated by an apparatus being monitored for standard functionality In response, the apparatus is activated from a period prior to the alignment point to an end point of the periodic signal segment and a first point of the periodic signal segment is located. Likewise, a second point of an additional periodic signal segment of the periodic signal is located. The periodic signal is normalized based on results of locating the first point and the second point.
Method for analyzing a measured signal and oscilloscope
A method for analyzing a measured signal is described wherein at least a first segment and a second segment of said measured signal are acquired by a measurement device. At least said first segment and said second segment are stored in an acquisition memory of said measurement device. A search criterion is applied on at least said first segment and said second segment. At least a first timing event corresponding to said search criterion is stored into a memory, said first timing event being found in at least one of said segments. Further, an oscilloscope is described.