Patent classifications
G01R19/16557
Test and measurement system, differential logic probe, single ended logic probe and method for operating a test and measurement system
A test and measurement system for testing a device under test comprises a logic probe with a first probe tip for contacting the device under test, a logic receiver unit connected to the first probe tip for receiving a digital signal from the device under test via the first probe tip, and a DC voltage measuring unit connected to the first probe tip for measuring a DC voltage at the device under test via the first probe tip.
DIFFERENTIAL SIGNAL MEASUREMENT SYSTEM AND METHOD
A differential signal measurement system is provided. The differential signal measurement system includes a measurement device, with at least one differential signal input, a differential connection interface configured to connect the at least one differential signal input of the measurement device to a device under test, and a differential signal source, with at least one differential signal output, configured to generate at least one differential output signal. The differential connection interface is further configured to pass the at least one differential output signal to the at least one differential signal input of the measurement device, and the measurement device is configured to capture the at least one differential output signal.
Battery status detection method and network device using the same
The present invention provides a battery status detection method, which includes the following steps: iteratively executing the following steps: obtaining a current voltage value and a previous voltage value of a battery; calculating a difference between the current voltage value and the previous voltage value; adjusting a low battery state indicator according to the difference; and determining whether to output a low battery warning signal according to the low battery state indicator.
Discrete input determining circuit and method
A discrete input determining circuit is disclosed, which includes an input biasing network connected to a discrete input for providing a first input voltage, a voltage divider network for dividing the first input voltage into a second input voltage and a third input voltage, a first comparator, wherein a non-inverting input terminal of the first comparator receives the second input voltage, and a second comparator, wherein an inverting input terminal of the second comparator receives the third input voltage, wherein an inverting input terminal of the first comparator and a non-inverting input terminal of the second comparator receive a reference voltage, and an output terminal of the first comparator and an output terminal of the second comparator are configured to provide a logic output. A discrete input determining method is also disclosed.
Detection circuit for an active discharge circuit of an X-capacitor, related active discharge circuit, integrated circuit and method
An active discharge circuit discharges an X capacitor and includes a sensor circuit that generates a sensor signal indicative of an AC voltage at the X capacitor. A processing unit generates a reset signal as a function of a comparison signal. A comparator circuit generates the comparison signal by comparing the sensor signal with a threshold. A timer circuit sets a discharge enable signal to a first logic level when the timer circuit is reset via a reset signal. The timer circuit determines the time elapsed since the last reset and tests whether the time elapsed exceeds a given timeout value. If the time elapsed exceeds the given timeout value, the timer circuit sets the discharge enable signal to a second logic level. A dynamic threshold generator circuit varies the threshold of the comparator circuit as a function of the sensor signal.
SEMICONDUCTOR DEVICE
A semiconductor device is provided which can detect a fluctuation of a power supply voltage. The semiconductor device includes a counter circuit that outputs a signal when a period during which a power supply voltage of a system to be monitored is lower than or equal to a first voltage value exceeds a predetermined time, a first flag circuit that sets a first flag based on the signal, a second flag circuit that sets a second flag when the power supply voltage becomes a second voltage value or lower, and a circuit that outputs a reset signal that resets the system when both the first and the second flags are set. The first voltage value and the second voltage value are higher than a minimum voltage that guarantees normal operation of the system. The first voltage value is higher than the second voltage value.
DISCRETE INPUT DETERMINING CIRCUIT AND METHOD
A discrete input determining circuit is disclosed, which includes an input biasing network connected to a discrete input for providing a first input voltage, a voltage divider network for dividing the first input voltage into a second input voltage and a third input voltage, a first comparator, wherein a non-inverting input terminal of the first comparator receives the second input voltage, and a second comparator, wherein an inverting input terminal of the second comparator receives the third input voltage, wherein an inverting input terminal of the first comparator and a non-inverting input terminal of the second comparator receive a reference voltage, and an output terminal of the first comparator and an output terminal of the second comparator are configured to provide a logic output. A discrete input determining method is also disclosed.
TEST AND MEASUREMENT SYSTEM, DIFFERENTIAL LOGIC PROBE, SINGLE ENDED LOGIC PROBE AND METHOD FOR OPERATING A TEST AND MEASUREMENT SYSTEM
A test and measurement system for testing a device under test comprises a logic probe with a first probe tip for contacting the device under test, a logic receiver unit connected to the first probe tip for receiving a digital signal from the device under test via the first probe tip, and a DC voltage measuring unit connected to the first probe tip for measuring a DC voltage at the device under test via the first probe tip.
Bidirectional voltage differentiator circuit
A bidirectional voltage differentiator circuit comprises start-up circuitry, sensing circuitry, and output circuitry coupled to logic circuitry. The start-up circuitry acts to start-up the sensing circuitry when the circuit is powered on, and accelerates the response of the sensing circuitry thereafter. The sensing circuitry senses variation in an input voltage applied to an input node. Responsive to the voltage variation sensed by the sensing circuitry, the output circuitry produces a state change at a first or second output node. The logic circuitry receives the states of the output nodes and produces a logic output signal to indicate the occurrence of the variation sensed in the input voltage. The voltage sensing circuit is operable to sense variation of the input voltage regardless of whether the voltage is rising or falling and without regard to the DC value of the input voltage.
BIDIRECTIONAL VOLTAGE DIFFERENTIATOR CIRCUIT
A bidirectional voltage differentiator circuit comprises start-up circuitry, sensing circuitry, and output circuitry coupled to logic circuitry. The start-up circuitry acts to start-up the sensing circuitry when the circuit is powered on, and accelerates the response of the sensing circuitry thereafter. The sensing circuitry senses variation in an input voltage applied to an input node. Responsive to the voltage variation sensed by the sensing circuitry, the output circuitry produces a state change at a first or second output node. The logic circuitry receives the states of the output nodes and produces a logic output signal to indicate the occurrence of the variation sensed in the input voltage. The voltage sensing circuit is operable to sense variation of the input voltage regardless of whether the voltage is rising or falling and without regard to the DC value of the input voltage.