A system and method for measuring a capacitance value of a capacitor are provided. In embodiments, a resistor is coupled to a terminal of the capacitor. A difference in voltage at the terminal between a first time and a second time during a discharge routine of the capacitor is measured. The discharge routine includes sinking a current through a discharge circuit coupled to the resistor from first to second. Integration of a difference in voltage at terminals of the resistor during the discharge routine between the first and second times is also measured. The capacitance value is computed based on the measured difference in voltage, the measured integration, and the resistance value of the resistor. The health of the capacitor is determined based on a difference between the computed capacitance value and a threshold value.

A system and method is provided for measuring a voltage drop at a node. In embodiments, a circuit includes an analog-to-digital converter, a current sink, and a controller. The input of the analog-to-digital converter and the input of the current sink is coupled to the node to be measured. A set point for the current sink is determined. The output of the analog-to-digital converter during the voltage drop is sampled. And a relative voltage drop value is computed by subtracting the sampled output of the analog-to-digital converter during the voltage drop from a sampled output of the analog-to-digital converter during a steady-state condition. The current sink operating at the set point during the steady-state condition and during the voltage drop.

A method for fabricating a MOMCAP includes steps as follows: An Nth metal layer is formed on a substrate according to an Nth expected capacitance value of the Nth metal layer. An Nth capacitance error value between an Nth actual capacitance value of the Nth metal layer and the Nth expected capacitance value is calculated. An N+1th expected capacitance value of an N+1th metal layer is adjusted to form an N+1th actual capacitance value according to the Nth capacitance error value, and the N+1th metal layer with an N+1th actual capacitance value is formed on the Nth metal layer according to the adjusted N+1th expected capacitance value, to make the sum of the Nth actual capacitance value and the N+1th actual capacitance value equal to the sum of the Nth expected capacitance value and the N+1th expected capacitance value. N is an integer greater than 1.

A physical quantity sensor includes a first element section in which first capacitances varying in accordance with a physical quantity have first saturation capacitance values at which the first capacitances are saturated by a first physical quantity, a second element section in which a second capacitances varying in accordance with the physical quantity have second saturation capacitance values at which the second capacitances are saturated by a second physical quantity smaller in absolute value than the first physical quantity, a multiplexer for outputting the first signals from the first element section and the second signals from the second element section, and a determination circuit that determines whether or not the level of the second signal input via the multiplexer reaches a threshold value which is a level of the second signal when the second physical quantity acts.

In accordance with a first aspect of the present disclosure, an integrated circuit is provided, comprising a current source and a reference capacitor, the integrated circuit being configured to: inject, using said current source, a first current in an external measurement capacitor and determine a first amount of time within which a resulting voltage on the measurement capacitor reaches a voltage threshold; inject, using said current source, a second current in the reference capacitor and determine a second amount of time within which a resulting voltage on the reference capacitor reaches said voltage threshold; detect a change of the capacitance on the measurement capacitor using a difference between the first amount of time and the second amount of time. In accordance with a second aspect of the present disclosure, a corresponding measurement method is conceived.

A frequency debugging board includes a bottom plate; a variable capacitor and a plurality of first probes that are all disposed on the bottom plate, two ends of the variable capacitor being each connected to a first probe; and a plurality of second probes and at least one switch that are all disposed on the bottom plate, any two adjacent second probes being connected to each other through a switch.

A method and a measuring device for detecting a leakage current in an ungrounded, single-phase alternating-current power supply system. A variable test resistance is switched between one of the outer conductors and ground and starting from a minimally admissible test-resistance value, at least one of three support test-resistance values is determined as support locations. In an equivalent circuit of the modeled alternating-current power supply system, an equations system is set up for describing the dependency of currents and voltages. An extrapolation on the test-resistance value zero leads to a calculated test current which corresponds to the leakage current to be detected. Consequently, a ground fault situation may be simulated without actually causing a dangerous ground fault.

A capacitance detection device includes: a sensor unit including a plurality of sensor elements; row control lines; column control lines; a control circuit supplying a charging voltage to the sensor element; and an equipotential circuit outputting a potential equal to the potential of the sensor element subject to measurement. The control circuit applies a charging voltage to the row control line connected to the sensor element and connects the column control line connected to the sensor element to the ground potential side. The control circuit causes the equipotential circuit to set a potential of at least one of the row control lines other than the row control line connected to the sensor element subject to measurement and the column control lines other than the column control line connected to the sensor element subject to measurement to a potential equal to the potential of the sensor element subject to measurement.

The present disclosure relates to a method for processing capacitance values generated by capacitive sensors with interdigitated electrodes supported by a seat of a vehicle.

A read-out circuit includes an operational amplifier configured to receive input voltage via a positive input terminal; a feedback capacitor connected between an output terminal of the operational amplifier and a negative input terminal of the operational amplifier; a sensor charging/discharging circuit configured to charge or to discharge a sensor capacitor included in a sensor during a first time; and a switching circuit configured to connect the sensor capacitor and the operational amplifier during a second time after the sensor capacitor is charged or discharged.