A printed circuit board (PCB) test apparatus and testing method are described. The PCB test apparatus includes a motor connected to a gearbox that includes a gear that is directly connected to an output shaft. The test apparatus includes two printed circuit board connections for testing an electric-component connector that includes two circuit boards. One connection port includes a plurality of contact pins for attaching one of the PCBs while the other connector port is part of a position encoder that includes a diametrically magnetized magnet that tests the other PCB's ability to detect changes in magnetic fields. The apparatus is configured such that both PCBs of the electric-component connector are tested in tandem.

A multi-chip package capable of testing internal signal lines including a printed circuit board, a first semiconductor chip mounted on the printed circuit board and including a test circuit, and second semiconductor chips mounted on the printed circuit board and electrically connected to the first semiconductor chip via a plurality of internal signal lines may be provided. The test circuit may be configured to enable circuits of the first semiconductor chip connected to pads contacting the plurality of internal signal lines, transmit complementary data to at least two pads from among the pads, and form a current path in the circuits connected to the at least two pads, thereby detecting a short-circuit between the internal bonding wires.

The present disclosure relates to a system and related methods, apparatuses, and computer program products for testing components of an aerosol delivery device. For example, a system for testing a control board for an aerosol delivery device may include a control board for an aerosol delivery device and a test apparatus. The test apparatus may provide a test initiation signal to the control board. The control board may execute an onboard diagnostic test to test operation of the control board in response to the test initiation signal. The control board may provide diagnostic information generated based on execution of the onboard diagnostic test to the test apparatus. The test apparatus may determine, based on the diagnostic information, whether the control board is faulty.

The system includes an integrated sequenced arrangement of parametric type instruments, automated guided prober test instruments, and a test instrument system using analog signature analysis for identifying faults in circuit card assemblies, under control of a software system with a mass interconnect system.

A method includes receiving from a user, via a user interface, coverage-event characteristics. Using a processor, output data of test runs executed on a device-under-test is analyzed to identify one or a plurality of coverage events that possess the coverage-event characteristics and to identify one or a plurality of contributing test runs in said test runs that contributed to said one or a plurality of coverage events. Information on said one or a plurality of contributing test runs is outputted via an output device.

In an example, a control binary sequence (CBS) determined during simulating a design under test (DUT) is obtained. Simulating included using a constraint random stimulus generator (CRSG) biased by a coverage biaser. The CBS includes first enabled bits that correspond to respective constraint problems solved by the CRSG and biased by the coverage biaser and from which a designated message was triggered during the simulating. A reduced CBS that has second enabled bits that are a subset of the first enabled bits is constructed. A simulation result generated by re-simulating the DUT is obtained. Re-simulating includes selectively, for each constraint problem, restoring solving steps of the CRSG that were performed during the simulating when a corresponding bit of the reduced CBS is an enabled bit. The reduced CBS is assigned as a triggering CBS that triggered the designated message when the simulation result includes the designated message.

The present disclosure relates to a system and related methods, apparatuses, and computer program products for testing components of an aerosol delivery device. For example, a system for testing a control board for an aerosol delivery device may include a control board for an aerosol delivery device and a test apparatus. The test apparatus may provide a test initiation signal to the control board. The control board may execute an onboard diagnostic test to test operation of the control board in response to the test initiation signal. The control board may provide diagnostic information generated based on execution of the onboard diagnostic test to the test apparatus. The test apparatus may determine, based on the diagnostic information, whether the control board is faulty.

Various embodiments related to identifying a candidate defect region in a semiconductor device are disclosed. For example, one embodiment includes receiving an electrical test mismatch reported for a scan chain; generating a physical representation of portion of a logical design of the semiconductor device, the physical representation including location information for physical instantiations of logical cells and logical interconnections included in the portion of the logical design; identifying a suspect logical region in the physical representation, the suspect logical region including a portion of the logical cells and the logical interconnections electrically connected with the scan chain; generating a candidate defect region within the semiconductor device, the candidate defect region being defined, via the physical representation, to include the physical instantiations of logical cells and logical interconnections included in the suspect logical region; and displaying the candidate defect region.

In one embodiment, a test system comprises: a test partition configured to perform test operations; a centralized test controller for controlling testing by the test partition; and a test link interface controller configured to communicate between the centralized test controller and the test partition, wherein the test link interface controller controls dynamic changes to external pads associated with the test operations. The test link interface controller dynamically selects between an input direction and output direction for the external pads. The test link interface includes a pin direction controller that generates direction control signals based on the state of local test controller and communicates the desired direction to a boundary scan cell associated with the pin. The boundary scan cell programs the pad to either input or output direction depending on direction control signals. The input direction corresponds to driving test data and the output direction corresponds to observing test data.

A method for testing. An external clock frequency is generated. Test data is supplied over a plurality of SSI connections clocked at the external clock frequency, wherein the test data is designed for testing a logic block. A DSTA module is configured for the logic block that is integrated within a chip to a bandwidth ratio, wherein the bandwidth ratio defines the plurality of SSI connections and a plurality of PSI connections of the chip. The external clock frequency is divided down using the bandwidth ratio to generate an internal clock frequency, wherein the bandwidth ratio defines the external clock frequency and the internal clock frequency. The test data is scanned over the plurality of PSI connections clocked at the internal clock frequency according to the bandwidth ratio, wherein the plurality of PSI connections is configured for inputting the test data to the plurality of scan chains.