An electronic device may be provided with an antenna module having a substrate. A phased antenna array of dielectric resonator antennas and a radio-frequency integrated circuit for the array may be mounted to one or more surfaces of the substrate. The dielectric resonator antennas may include dielectric columns excited by feed probes. The feed probes may be printed onto sidewalls of the dielectric columns or may be pressed against the sidewalls by biasing structures. A plastic substrate may be molded over each dielectric column and each of the feed probes in the array. The feed probes may cover multiple polarizations. The array may include elements for covering multiple frequency bands. The dielectric columns may be aligned a longitudinal axis and may be rotated at a non-zero and non-perpendicular angle with respect to the longitudinal axis.

A method and a system for determining at least one contribution of at least one device under test (DUT) are described. The DUT may be part of a radio frequency (RF) device chain. The method includes capturing a first signal portion at a first node associated with an input of the DUT and capturing a second signal portion at a second node associated with an output of the DUT. The first signal portion and the second signal portion are captured quasi-simultaneously. The method may also include aligning the captured first signal portion and the captured second signal portion with each other temporally, and determining the contribution of the DUT by comparing the first signal portion and the second signal portion.

A testing system includes a testing device including a display screen. The testing device can display, via the display screen, a representation of a vehicle and oscillators of the vehicle. The testing device transmits a test request that identifies a selected oscillator of the plurality of oscillators for testing. A vehicle receives the test request. An electronic control unit of the vehicle instructs the selected oscillator to generate test signals. The testing calculates a performance metric of the test signals. The testing device determines whether the selected oscillator is properly placed, functioning at a predetermined threshold, or both. Improperly placed or improperly functioning oscillators can be adjusted or replaced.

A self-test system for PCIe and a method thereof are disclosed. In the system, a first circuit interconnect card and a second circuit interconnect card are inserted into CEM slots, respectively, and the first circuit interconnect card and the second circuit interconnect card are electrically connected to each other through a FFC, the central processing unit generates and provides differential signals to the first circuit interconnect card and the second circuit interconnect card; the first circuit interconnect card or the second circuit interconnect card provide differential signals to the second circuit interconnect card or the first circuit interconnect card through the first FFC interface and the second FFC interface, respectively, and the second circuit interconnect card or the first circuit interconnect card provides the differential signals to a central processing unit, so as to implement self-check for PCIe.

It is described an RF communication device comprising: i) an RF antenna functionality; ii) at least one antenna pad connected to the RF antenna functionality; iii) a further functionality which is not an RF antenna functionality; and iv) at least one non-antenna pad electrically connected to the further functionality.

The antenna pad and the non-antenna pad are arranged to be short-circuited with each other, and the non-antenna pad is electrically connected via a connection line to the further functionality within the RF communication device.

Further, a method of manufacturing an RF communication device is described.

A testing device includes a testing socket and a reflector. The testing socket defines an accommodating space. The reflector is disposed in the accommodating space and has a plurality of reflection surfaces non-parallel with each other. The reflection surfaces define a transmission space.

System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.

A layer arrangement for a phased array antenna comprises phase shifting units arranged between stacked dielectric layers with a tunable dielectric material sandwiched in-between. Each phase shifting unit comprises a transmission line with phase shifting capabilities that is electrically connected with bias lines to a biasing circuit. A dielectric layer is made from an optically transparent material. An overlapping section of the bias lines of each of the phase shifting units is made from an optically transparent and electroconductive material. The tunable dielectric material affects the transmission or reflection of light that illuminates the tunable dielectric material depending on the respective tuning state. Testing this layer arrangement comprises illuminating the layer arrangement by light while a predetermined electric bias potential is applied to at least some of the phase shifting units, and during which the light emission from the layer arrangement is detected and compared with an expected light emission.

A method for performing predictive maintenance of an amplifier module is described. At least one parameter of at least one amplifier module is acquired via a measurement data acquisition unit. The at least one parameter acquired is analyzed via a measurement data analyzing unit so as to predict the probability and/or time of default of the at least one amplifier module. Further, a system is described.

A new method for calibrating slide screw tuners, both using hexahedron vertically moving and disc-shaped eccentrically rotating reflective tuning probes, allows straightening the reflection factor phase response (anti-skewing); it uses a new scaling method and a new coordinate system of tuning probe control. The method is agnostic and self-regulating, it treats the tuner as a black box and depends on the test frequency. The result is improved mathematical interpolation and tuning results using reduced number of calibration points and allowing higher calibration speed.