A hardfacing metal composition and method of restoring worn work string tubing by application of a hardfacing metal to the worn regions of the work string tubing.

A method for aligning test environments is provided. The method inlcudes: measuring, by a measurement device located in an anechoic chamber, a standard signal transmitted from a base station simulator and went through to a channel emulator, then output with noise added inside the channel emulator, to multiple antennas within the anechoic chamber; obtaining, by a computing device, measurement information based on the standard signal and the noise transmitted from the measurement device; determining, by the computing device, whether the measurement information is within a predetermined range of a target value; and transmitting, by the computing device, a control signal to the channel emulator to adjust the noise output from the channel emulator so that the computing device obtains desired measurement information based on the standard signal and the adjusted noise when the measurement information is not within the predetermined range of the target value.

The invention provides a signal isolation and transmission device, comprising a high-frequency amplitude modulation circuit, a signal demodulation circuit, a first H-field antenna and a second H-field antenna. The first H-field antenna and second H-field antenna are both loop antennas with an external conductive shielding layer, and an insulating layer is wrapped outside the conductive shielding layer. The annular parts of the first H-field antenna and second H-field antenna face and abut each other. The high-frequency amplitude modulation circuit is connected with a pin of the first H-field antenna, and a pin of the second H-field antenna is connected with the signal demodulation circuit. The signal to be tested is modulated onto a high-frequency carrier signal by the high-frequency amplitude modulation circuit, and then isolated and transmitted by the two H-field antennas, which greatly improves the anti-interference effect, reduces the attenuation degree and improves the coupling degree of the signals.

The present disclosure relates to a measurement system for a parallel measurement with multiple tones, comprising: an RF signal source being configured to generate a continuous wave, CW, signal having at least two CW tones, the RF signal source being configured to feed said CW signal to an output port of the system which is arranged for being connected to a device-under-test, DUT; an input port being arranged to receive a response signal from the DUT, the response signal having at least two tones which are based on the at least two CW tones; a conversion unit being configured to convert the response signal to an intermediate frequency, IF, signal by means of analog mixing, thereby converting the at least two tones of the response signal to at least two IF tones; an analog-to-digital converter being configured to convert the IF signal to a digital signal; a parallel processing unit being configured to isolate the at least two IF tones of the IF signal using a digital down conversion, DDC, technique; the parallel processing unit being further configured to perform a measurement on the at least two CW tones and the at least two IF tones to determine at least one scattering parameter of the DUT.

A high-frequency 5 measurement method includes generating a test signal (TS), which is a sine-wave signal having a predetermined frequency, in which a period (τ) during which the power level is at a first power level and a period (T-τ) during which the power level is at a second power level lower than the first power level 10 are periodically repeated, inputting the test signal (TS) to a device under test (10) as an input signal, and measuring the difference between an output signal (OUT) of the device under test (10) and an ideal value of the output signal (OUT).

A method for instantaneous load pull impedance pattern generation uses a phase-frequency-location equivalent of the natural behavior of slide screw tuners to skew the reflection factor phase with only small frequency changes. The method is generic and applies the same to all GHz range test frequencies. A simple calculation determines the tuning probe position and the impedance cloud is generated quasi instantaneously by switching between sidebands of the carrier test frequency without mechanically moving the tuning probe. Benign frequency behavior of the tuners allows for simple and accurate narrowband interpolation. Duration of load pull measurements is reduced from minutes to seconds.

A broadband measurement system and a measurement method for broadband property are provided. The signal measurement apparatus is used to transmit a measuring signal belonging to a first frequency domain from its measuring port. Two ports of the signal converter are used to connect with two measuring ports of the signal measurement apparatus. The first passive mixer of the signal converter is configured as bidirectional, and the second passive mixer of the signal converter is configured as bidirectional. Two mixers are used to convert the signals from the first frequency domain into a second frequency domain, and convert the signals from the second frequency domain into the first frequency domain.

A test apparatus and method for testing a semiconductor device. The semiconductor device includes an integrated circuit and a plurality of external radiating elements located at a surface of the device. The external radiating elements include at least one transmit element and receive element. The test apparatus includes a plunger. The plunger includes a dielectric portion having a surface for placing against the surface of the device. The plunger also includes at least one waveguide. Each waveguide extends through the plunger for routing electromagnetic radiation transmitted by one of the transmit elements of the device to one of the receive elements of the device. Each waveguide comprises a plurality of waveguide openings for coupling electromagnetically to corresponding radiating elements of the device. The dielectric portion is configured to provide a matched interface for the electromagnetic coupling of the waveguide openings to the plurality of external radiating elements of the device.

Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.

A time domain reflectometry measurement apparatus and method is provided. Measurement data of a time domain reflectometry measurement are analyzed with respect to previously acquired empirical measurement data of error-free or faulty devices with known failures. In this way, failures can be identified in the device under test without the need of opening the device.