A touch control test device and a touch control test method are provided, and the touch control test device includes: a telescopic mechanism with an adjustable length; a touch control component connected to the telescopic mechanism so that the telescopic mechanism is configured to drive the touch control component to tap the touch screen; an acquisition unit configured to acquire an actual detection coordinate point where the touch control component taps the touch screen; a calculation unit configured to calculate a touch control coordinate error between a target coordinate point corresponding to the actual detection coordinate point where the touch control component taps the touch screen and the actual detection coordinate point. The touch test device can achieve a tap touch control test of the touch screen.

A test circuit for testing a monitoring circuit includes: a ramp generator configured to generate a ramp signal in response to an activated first control signal; a counter configured to count pulses of a clock signal in response to the activated first control signal; at least one register configured to store an output value of the counter based on a change in at least one output signal generated by the monitoring circuit in response to the ramp signal in a test mode; and a controller configured to generate the first control signal and verify the monitoring circuit based on a ratio of a value stored in the at least one register to a duration during which the first control signal is activated.

An electronic device is provided. The electronic device includes an electronic unit, a sensing circuit and a circuit. The sensing circuit is electrically connected to the electronic unit through a sensing node. The circuit is electrically connected to the sensing node. The circuit is configured to apply a voltage to the sensing node.

A sensor test apparatus capable of efficiently testing a sensor is provided. A sensor test apparatus 30 which tests the pressure sensor 90 includes an application unit 40 including an application device 42 including a socket 445 to which the sensor 90 is electronically connected, a pressure chamber 43 which applies pressure to the sensor 90, and a heat sink 443,462 which applies a thermal stress to the sensor 90, the test unit 35 which tests the sensor 90 via the socket 445, and the conveying robot 33 which conveys the sensor 90 into and out of the application unit 40.

A testing system includes a testing device including a display screen. The testing device can display, via the display screen, a representation of a vehicle and oscillators of the vehicle. The testing device transmits a test request that identifies a selected oscillator of the plurality of oscillators for testing. A vehicle receives the test request. An electronic control unit of the vehicle instructs the selected oscillator to generate test signals. The testing calculates a performance metric of the test signals. The testing device determines whether the selected oscillator is properly placed, functioning at a predetermined threshold, or both. Improperly placed or improperly functioning oscillators can be adjusted or replaced.

A large current flowing when energization by normal load drive control is performed at the time of a load short-circuit is prevented. A load drive device 100 includes drive switches 61 and 62 that turn on or off the current supplied from a power source to a load 70, a switch drive circuit 20 that transmits a drive signal to the drive switches 61 and 62 based on a control command from an arithmetic device 10, and a constant current source 40 that supplies the current to the load 70 without passing through the drive switches 61 and 62. Then, the switch drive circuit 20 performs control so as not to turn on either the drive switches 61 or 62 when the voltage between both ends of the load 70 becomes equal to or less than the determination value in a state where the drive switches 61 and 62 are turned off and in a state where the current is supplied from the constant current source 40 to the load 70.

A diagnostic voltage or current path can be used for each MEMS actuator control channel to detect and diagnose faults in the actuator control signal path. Multiple measurement points provide additional capabilities of isolating faults among multiple subassemblies or components in the control signal path. The diagnostic voltage or current path uses ADC(s) and multiplexers to monitor multiple control channels and/or multiple measurement points in each control channel. Digitized voltages, or currents in the case of magnetic actuators, read from the diagnostic ADC are compared to expected values to detect and isolate faults.

Embodiments of the present disclosure relate to a touch display device and, more particularly, to a touch display device having a structure capable of enabling efficient testing and reducing the number of test pads.

An inspection apparatus for inspecting a backside irradiation type imaging device formed on an inspection object includes: a stage on which the inspection object is mounted such that the stage faces a rear surface of the backside irradiation type imaging device, wherein the stage includes: a transmitter including a flat plate formed of a light transmitting material, and configured to mount the inspection object on the transmitter; and a light emitter disposed at a location facing the inspection object with the transmitter interposed between the light emitter and the inspection object, and configured to emit light toward the transmitter, and wherein the transmitter transmits the light from the light emitter while diffusing the light.

A power delivery system includes a power sourcing equipment, a powered device and a transmission cable. When the power sourcing equipment is electrically connected to the powered device via the transmission cable, an over-current detecting circuit in the power sourcing equipment is configured to detect over-current occurrence of the powered device. Meanwhile, the power sourcing equipment is configured to determine the functionality of the over-current detecting circuit based on its specific pin and provide single fault protection when the over-current detecting circuit fails.