Patent classifications
G01R31/2836
Activation of an electrical consumer
A device (100) for activating an electrical consumer (105) includes a controllable current source (140) for providing a control current, a switching unit (115) for controlling a consumer current as a function of the control current, and a sampling unit (145) for determining a time delay between an activation of the current source (140) and the enabling or interruption of the current flow by the switching unit (115). Furthermore, a processing unit (135) is provided, which is configured to determine that the current source (140) is defective if the time delay lies outside a predetermined range.
PUF method using and circuit having an array of bipolar transistors
A method of identifying a component by a response to a challenge is disclosed, the component comprising an array of bipolar transistors connectable in parallel so as to have a common collector contact, a common emitter contact and a common base contact, the challenge comprising a value representative of a total collector current value, the method comprising: receiving the challenge; supplying the total collector current to the common collector contact; detecting instability in each of a group of the transistors; and determining the response in dependence on the group. A circuit configured to operate such a method is also disclosed.
Interface unit, conveying system and method
The invention relates to an interface unit, a conveying system and a method. The interface unit comprises an input circuit for the signal determining the safety of the conveying system. The interface unit further comprises means for testing the operating condition of the input circuit.
Apparatus for detecting malfunction and method therefor
Provided is an apparatus for detecting malfunction, the apparatus detecting malfunction of a display device for displaying a charging state of a vehicle battery according to a control signal. The apparatus for detecting malfunction according to an embodiment of the present invention comprises: an interrupt generation unit for generating an interrupt signal if the control signal satisfies a preset event; a voltage detection unit for detecting a voltage value of the control signal by converting an analog value of the control signal into a digital value; and a determination unit for detecting at least one among whether or not the display device has malfunction and a malfunction type on the basis of at least one among whether or not the display device operates, whether or not the interrupt signal is generated, and the voltage value of the control signal.
OPHTHALMIC DEVICE WITH BUILT-IN SELF-TEST CIRCUITRY FOR TESTING AN ADJUSTABLE LENS
An ophthalmic device includes an enclosure that is compatible for wearing in or on an eye. An adjustable lens is disposed within the enclosure. Driver circuitry is disposed within the enclosure and coupled to drive the adjustable lens and change its optical power. Built-in-self-test (BIST) circuitry is disposed within the enclosure and coupled to the adjustable lens. The BIST circuitry includes an impedance measurement circuit coupled to selectively measure an impedance of the adjustable lens. A controller is disposed within the enclosure and includes BIST control logic that measures the impedance of the adjustable lens with the impedance measurement circuit to determine a health status of the adjustable lens.
SEMICONDUCTOR DEVICE
A semiconductor device includes a wiring substrate including a first surface and a second surface opposite to the first surface, a semiconductor chip including a plurality of chip electrodes and mounted over the wiring substrate, a first capacitor arranged at a position overlapping with the semiconductor chip in plan view and incorporated in the wiring substrate, and a second capacitor arranged between the first capacitor and a peripheral portion of the wiring substrate in plan view. Also, the second capacitor is inserted in series connection into a signal transmission path through which an electric signal is input to or output from the semiconductor chip.
Detecting deterioration of an electrical circuit in an aggressive environment
We disclose a circuit board that hosts at least first and second types of resistance sensors. The resistance of each sensor of the first type tends to increase, and the resistance of each sensor of the second type tends to decrease if the sensor is exposed to an aggressive environment. The circuit board also hosts a control circuit that operates to monitor respective resistances of the various resistance sensors and to process the digital values representing the resistances to estimate the working condition of one or more other electrical circuits located on the circuit board and/or in relatively close proximity to the circuit board in the corresponding equipment cabinet. The control circuit further operates to transmit out an appropriate alarm message if the estimated working condition is deemed unsatisfactory.
CIRCUIT INSPECTION METHOD AND SAMPLE INSPECTION APPARATUS
An object of the present invention relates to detecting a signal caused by a faulty point part of which the identification has been difficult with conventional EBAC. In an embodiment of the present invention, at least one probe is brought into contact with a sample on which a circuit is formed, the sample is scanned with a charged particle beam while power is supplied via the probe to the circuit identified by a contact of the probe, and a change in resistance value of a faulty point heated locally is measured via the probe. According to the present invention, even a signal caused by a high-resistance faulty point or a faulty point embedded in the sample can be easily detected.
DETERMINING IMPEDANCE-RELATED PHENOMENA IN VIBRATING ACTUATOR AND IDENTIFYING DEVICE SYSTEM CHARACTERISTICS BASED THEREON
A method, including determining a change in an actuator impedance based on a change in an electrical property of a system of which the actuator is apart, and determining one or more system characteristics based on the change in the actuator impedance.
Fault tolerance decision-making method and system for sensor failure of vehicular wheel hub driving system
The present invention belongs to the technical field of electric automobiles and particularly relates to a fault tolerance decision-making method and system for sensor failure of a vehicular wheel hub driving system. The method comprises a current sensor failure diagnostic process, a position/velocity sensor failure diagnostic process and a selection process for a wheel hub motor fault tolerance control method. The system comprises a current sensor failure diagnostic module, a position/velocity sensor failure diagnostic module and a selection module for a wheel hub motor fault tolerance control method. The position/velocity sensor failure diagnostic module further comprises a fault tolerance control switching module. The present invention has the characteristics of establishing a control strategy decision-making mechanism oriented to random complicated current and position sensor failure conditions and designing a multivariable decision-making model according to a vehicular velocity range and a sensor fault condition to realize a fault tolerance control process compatible with a full velocity range.