Systems and methods presented herein include a robotic wearable device testing system with a track drive system that includes one or more tracks having a plurality of attachment pads configured to attach to one or more wearable devices. Each track of the one or more tracks is configured to move along a path defined by the track. In addition, the robotic wearable device testing system includes a tap point drive system that includes one or more tap point sliders configured to slide laterally with respect to the track drive system. Each tap point slider of the one or more tap point sliders includes a tap point configured to wirelessly communicate with the one or more wearable devices when the one or more wearable devices are in close proximity with the tap point. Each tap point slider of the one or more tap point sliders also includes an electronic interference door configured to block wireless signals between the one or more wearable devices and the tap point. The robotic wearable device testing system also includes control circuitry configured to control relative movement of the one or more tracks and the one or more tap point sliders to position one or more wearable devices attached to respective attachment pads of the plurality of attachment pads in close proximity with a tap point of the one or more tap point sliders, and to control movement of the electronic interference door to allow or block the wireless signals between the one or more wearable devices and the tap point of the one or more tap point sliders.

A Rogowski coil in a sensor unit has voltage induced by a conductor surrounded by the Rogowski coil. The voltage is integrated to represent current which is converted to digital data representing current in the conductor and sent wirelessly to a multimeter. The sensor unit may receive control signals from the multimeter and a remote control apparatus. A plurality of sensor units may be networked and controlled by the remote control apparatus.

A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox (105) of the test-and-measurement probe, through a wired connection or wirelessly.

Described herein are antenna-coupled radio frequency (RF) probes with replaceable tips. In the described embodiments, test signals are coupled onto a probe tip wafer via an on-tip antenna, thus the probe tip is decoupled from the probe body. This allows for separate fabrication of the probe body and the probe tip. As such, the probe tip can be made available as a “commodity” and the user can simply replace a worn-out or damaged probe tip, providing significant savings in per-unit cost and operation cost of the new contact probes. The decoupling of probe tip and probe body allows for manual replacement of probe tip without the need for extremely accurate alignment which is typically required in extremely high frequency probes. Manual replacement of the tips is only possible due to the much less stringent alignment requirements afforded by the antenna coupling from the probe body to the probe tip.

The disclosure describes a process and apparatus for accessing devices on a substrate. The substrate may include only full pin JTAG devices (504), only reduced pin JTAG devices (506), or a mixture of both full pin and reduced pin JTAG devices. The access is accomplished using a single interface (502) between the substrate (408) and a JTAG controller (404). The access interface may be a wired interface or a wireless interface and may be used for JTAG based device testing, debugging, programming, or other type of JTAG based operation.

A programmable semiconductor device contains a wireless communication block (“WCB”) capable of facilitating wirelessly field programmable gate array (“FPGA”) programming download as well as functional logic implementation. In one aspect, WCB detects an FPGA access request for initiating an FPGA reconfiguration from a remote system via a wireless communications network. Upon receiving a configuration bitstream for programming the FPGA via the wireless communications network, the configuration bitstream is forwarded from WCB to a configuration download block (“CDB”) for initiating a configuration process. CDB subsequently programs at least a portion of configurable logic blocks (“LBs”) in FPGA in response to the configuration bitstream.

A test assembly for testing an antenna-in-package (AiP) device includes a socket over a circuit board, where the socket includes an opening for receiving the AiP device; a plunger configured to move along sidewalls of the opening, where during testing of the AiP device, the plunger is configured to cause the AiP device to be pressed towards the circuit board such that the AiP device is operatively coupled to the circuit board via input/output connections of the AiP device and of the circuit board; and a loadboard disposed within the socket and between the plunger and the AiP device, where the loadboard includes a coupling structure configured to be electromagnetically coupled to a transmit antenna and to a receive antenna of the AiP device, so that testing signals transmitted by the transmit antenna are conveyed to the receive antenna externally relative to the AiP device through the coupling structure.

Embodiments relate to functional test methods useful for fabricating products containing Light Emitting Diode (LED) structures. In particular, LED arrays are functionally tested by injecting current via a displacement current coupling device using a field plate comprising of an electrode and insulator placed in close proximity to the LED array. A controlled voltage waveform is then applied to the field plate electrode to excite the LED devices in parallel for high-throughput. A camera records the individual light emission resulting from the electrical excitation to yield a function test of a plurality of LED devices. Changing the voltage conditions can excite the LEDs at differing current density levels to functionally measure external quantum efficiency and other important device functional parameters.

Testing devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave (mmW) transmission and/or reception. A DUT may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections (e.g., wired) for input/output signals, power, and control and may also provide positioning. Radio frequency (RF) characteristics of the DUT may be tested over-the-air using an array of antennas or probes in the radiating Fresnel zone of the DUT's antennas. Each of the antennas or probes of the array may incorporate a power detector (e.g., a diode) so that the RF radiating pattern may be measured using DC voltage measurements. Measured voltage measurements may be compared to an ideal signature, e.g., voltage measurements expected from an ideal or model DUT.

A system and method for testing a tractor trailer is disclosed. The system includes a housing having connections for establishing an electrical and pressure connection to the electrical system and ABS of a tractor trailer, respectively, a circuit board that generates electrical signals and pressure signals corresponding to the connections, an electronic device for displaying the electrical signals and pressure signals, a wireless transceiver for transmitting the electrical signals and pressure signals to the electronic device, and a memory for storing the transmitted electrical signals and pressure signals. The method includes connecting the tractor trailer electrical system and ABS connections to the housing, powering on the tractor trailer, querying an electrical signal and/or pressure signal of the electrical system and ABS, wirelessly transmitting the electrical signal and/or pressure signal to an electronic device, and displaying the electrical signal and/or pressure signal on the electronic device.