A system for inspection of electrical circuits, which electrical circuits include a multiplicity of conductors which are mutually spaced from each other, the system including a voltage driver operative to apply different electrical voltages to a plurality of conductors from among the multiplicity of conductors, which plurality of conductors are in spatial propinquity to each other, a sensor operative to sense at least one characteristic of a test region defined thereby with respect to the electrical circuits, the sensor lacking sufficient spatial resolution to distinguish between the locations of individual ones of the plurality of conductors and a defect indicator responsive to at least one output of the sensor for ascertaining whether a defect exists in the plurality of conductors.

A system for inspection of electrical circuits, which electrical circuits include a multiplicity of conductors which are mutually spaced from each other, the system including a voltage driver operative to apply different electrical voltages to a plurality of conductors from among the multiplicity of conductors, which plurality of conductors are in spatial propinquity to each other, a sensor operative to sense at least one characteristic of a test region defined thereby with respect to the electrical circuits, the sensor lacking sufficient spatial resolution to distinguish between the locations of individual ones of the plurality of conductors and a defect indicator responsive to at least one output of the sensor for ascertaining whether a defect exists in the plurality of conductors.

An over the air measuring device is provided. The over the air measuring device comprises N feed antenna devices, a measuring device, adapted to perform over the air measurements on a device under test, selectively using any one of the N feed antenna devices, and a guide rail adapted to movably hold the N feed antenna devices. The N feed antenna devices are independently movable along the guide rail.

An over the air measuring device is provided. The over the air measuring device comprises N feed antenna devices, a measuring device, adapted to perform over the air measurements on a device under test, selectively using any one of the N feed antenna devices, and a guide rail adapted to movably hold the N feed antenna devices. The N feed antenna devices are independently movable along the guide rail.

A method for the non-destructive detecting of ageing symptoms of a component having regularly recurring structures, includes the following steps: a) scanning the component in the region of the recurring structures in a plurality of scanning planes which extend parallel to one another to create at least one scanning image set having a plurality of two-dimensional scanning images, wherein the scanning images show a plurality of inhomogeneities; b) automatically identifying those inhomogeneities that form recurring patterns, and those inhomogeneities that do not follow a recurring pattern, using a suitable algorithm; and c) detecting ageing symptoms exclusively on the basis of those inhomogeneities which are identified in step b) and do not follow a recurring pattern.

A method for the non-destructive detecting of ageing symptoms of a component having regularly recurring structures, includes the following steps: a) scanning the component in the region of the recurring structures in a plurality of scanning planes which extend parallel to one another to create at least one scanning image set having a plurality of two-dimensional scanning images, wherein the scanning images show a plurality of inhomogeneities; b) automatically identifying those inhomogeneities that form recurring patterns, and those inhomogeneities that do not follow a recurring pattern, using a suitable algorithm; and c) detecting ageing symptoms exclusively on the basis of those inhomogeneities which are identified in step b) and do not follow a recurring pattern.

A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source; a second photoconductive element configured to receive a pulse; and a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element. At least one of the first and second photoconductive elements is provided on a different substrate to that of the transmission line arrangement.

Probe systems and methods of characterizing optical coupling between an optical probe of a probe system and a calibration structure. The probe systems include a probe assembly that includes an optical probe, a support surface configured to support a substrate, and a signal generation and analysis assembly configured to generate an optical signal and to provide the optical signal to the optical device via the optical probe. The probe systems also include an electrically actuated positioning assembly, a calibration structure configured to receive the optical signal, and an optical detector configured to detect a signal intensity of the optical signal. The probe systems further include a controller programmed to control the probe system to generate a representation of signal intensity as a function of the relative orientation between the optical probe and the calibration structure. The methods include methods of operating the probe systems.

Probe systems and methods of characterizing optical coupling between an optical probe of a probe system and a calibration structure. The probe systems include a probe assembly that includes an optical probe, a support surface configured to support a substrate, and a signal generation and analysis assembly configured to generate an optical signal and to provide the optical signal to the optical device via the optical probe. The probe systems also include an electrically actuated positioning assembly, a calibration structure configured to receive the optical signal, and an optical detector configured to detect a signal intensity of the optical signal. The probe systems further include a controller programmed to control the probe system to generate a representation of signal intensity as a function of the relative orientation between the optical probe and the calibration structure. The methods include methods of operating the probe systems.

An analysis device analyzes inspection results of an inspection object which includes inspection target devices having respective electrodes on which needle marks are formed. The analysis device includes a display part for displaying an image, and an image generation part for generating an image to be displayed on the display part. The image generation part generates an analysis image based on information on inspection results with respect to the needle marks. The analysis image includes a needle mark scatter plot image showing positions of the needle marks with respect to the electrodes in each inspection target device in an overlapped manner, an inspection object map image showing a surface of the inspection object and showing needle mark inspection results with respect to the inspection target devices, and a captured image of the electrodes. Display contents of the images are linked with each other.