Symbolic backend for execution of quantum programs is provided. A parser receives an input qasm and parses it as a circuit graph. A layering component segments the circuit graph into multiple layers. An evaluation engine reads respective layers, translates the respective layers into a mathematic expression over qubits, and performs a simplification of the input qasm. A checker determines whether the input qasm and the simplified qasm are equivalent.

Systems, computer-implemented methods, and computer program products to facilitate external port measurement of qubit port responses are provided. According to an embodiment, a computer-implemented method can comprise terminating, by a system operatively coupled to a processor, one or more qubit ports with different electrical connections. The computer-implemented method can also comprise determining, by the system, one or more qubit port responses from external port responses based on the terminating. In some embodiments, the computer-implemented method can further comprise determining, by the system, a multiport admittance function corresponding to at least two of the one or more qubit ports.

Systems, computer-implemented methods, and computer program products to facilitate external port measurement of qubit port responses are provided. According to an embodiment, a computer-implemented method can comprise terminating, by a system operatively coupled to a processor, one or more qubit ports with different electrical connections. The computer-implemented method can also comprise determining, by the system, one or more qubit port responses from external port responses based on the terminating. In some embodiments, the computer-implemented method can further comprise determining, by the system, a multiport admittance function corresponding to at least two of the one or more qubit ports.

A method for determining a quality factor of an electrostatically actuated oscillator, the oscillator having a resonance frequency, the method including generating an excitation voltage defined as being the sum of a sinusoidal voltage and a voltage pulse; applying the excitation voltage at the input of the oscillator; acquiring in the time domain a response voltage present at the output of the oscillator after having ceased applying the excitation voltage at the input of the oscillator; determining the quality factor of the oscillator from the response voltage acquired at the output of the oscillator.

A microelectromechanical system (MEMS) sensor testing device, system and method are provided. The testing device includes a socket having a plurality of pads configured to receive a respective plurality of pins of the MEMS sensor, a body having a plurality of operable positions associated with a respective plurality of orientations of the MEMS sensor and circuitry which performs a method for testing the MEMS sensor in the plurality of operable positions. The method includes, for each position of the plurality of operable positions, outputting an indication of the position to the plurality of operable positions, receiving one or more measurements made by the MEMS sensor at the respective position and determining whether the one or more measurements satisfy a reliability criterion. The method includes generating a report based on the plurality of measurements and indicating whether the plurality of measurements satisfy a plurality of reliability criteria, respectively.

A method, apparatus, and product comprising: obtaining a representation of a quantum circuit; determining that a qubit is a candidate auxiliary qubit by estimating that a state of the qubit at a first cycle is identical to a state of the qubit at a second cycle; identifying a function section in the quantum circuit based on the qubit, the function section commencing at a beginning cycle, the beginning cycle is ordered before the second cycle, the function section ending at an ending cycle, the ending cycle is ordered after the first cycle, the ending cycle is ordered after the commencing cycle, the function section utilizing the qubit as an auxiliary qubit; and outputting an indication of the function section.

An apparatus for determining a single decision function [d%(x%)] is configured to obtain measurements [x] from a plurality of devices under test corresponding to stimulating signals applied to the plurality of devices under test. The stimulating signals correspond to a set of tests performed on the plurality [N] of devices under test. The apparatus may further determine a subset of tests from the set of tests, such that the subset of tests is relevant for indicating whether the plurality of devices under test pass the set of tests. The apparatus may also determine the single decision function applicable to measurements from an additional device under test tested using the subset of tests, such that the single decision function is adapted to predict a test result [%(x%)] for the set of tests on the basis of the subset of tests.

A fast algorithm is used to study the transient behavior due to a step-like pulse applied to a nano-chip. This algorithm is carried out on a computer and consists of two parts: The algorithm I reduces the computational complexity to T.sup.0N.sup.3 for large systems as long as T<N; The algorithm II employs the fast multipole technique and achieves scaling T.sup.0N.sup.3 whenever T<N.sup.2 beyond which it becomes T log.sub.2 N for even longer time. Hence it is of order O(1) if T<N.sup.2. Benchmark calculation has been done on graphene nanoribbons with N=10.sup.4 and T=10.sup.8. This new algorithm allows many large scale transient problems to be solved, including magnetic tunneling junctions and ferroelectric tunneling junctions that could not be achieved before, and using less computing capacity.

An integrated circuit includes a supply terminal to receive a supply voltage and a test terminal that operates in an input mode and an output mode. A test interface of the integrated circuit operates in a normal mode requiring a serial write to the test terminal to access test locations in the integrated circuit. The test interface also operates in an automatic mode in which addresses for test locations are auto incremented by toggling the supply voltage from a high voltage level to a low voltage level and back to the high voltage level. In an input mode, with the supply voltage at the low voltage level, the test pin receives configuration and address information. In output mode, with the supply voltage at the high voltage level, the test pin supplies test information corresponding to the address information received.

A method for determining a quality factor of an electrostatically actuated oscillator, the oscillator having a resonance frequency, the method including generating an excitation voltage defined as being the sum of a sinusoidal voltage and a voltage pulse; applying the excitation voltage at the input of the oscillator; acquiring in the time domain a response voltage present at the output of the oscillator after having ceased applying the excitation voltage at the input of the oscillator; determining the quality factor of the oscillator from the response voltage acquired at the output of the oscillator.