A hardware debug system includes a target chip comprising one or more target chip registers and one or more target chip ports, wherein at least one of the one or more target chip ports is used as a target chip debug port, and a debug host with one or more debug host ports, wherein at least one of the one or more debug host ports is connected to the target chip debug port via a hardware debug bus, wherein the debug host is configured to load at least one target chip setting into the one or more target chip registers that enables the target chip to boot via the hardware debug port using the hardware debug bus.

An integrated circuit comprises programmable resources; a plurality of hard blocks; and a programmable connector coupled to the programmable resources, the plurality of hard blocks; wherein the programmable connector is configurable to route signals between a first hard block and a second hard block in a first mode of operation and to route signals between the first hard and the programmable resources in a second mode of operation.

Devices and techniques are disclosed herein for debugging a device implemented on a die using non-test pins. An instruction to enable a debugging mode of operation is received with a memory device implemented at least in part on a die. In response to receiving the instruction, functionality of a first non-test pin of the die is modified to enable debugging data to be transmitted to a debugging component external to the die over the first non-test pin of the die. A debugging clock signal is established using a signal received at a second non-test pin of the die. Information including the debugging data is exchanged between the die and the debugging component using the first and second non-test pins of the die.

A memory having a first authentication code includes a communication port configured to transmit information including debug data to or receive the information including debug data from the external device; and a debug port controller that is usable for blocking of a communication path connecting to the communication port. The debug port controller is configured to receive an authentication request including a second authentication code from an external device, determine whether the second authentication code matches the first authentication code, and block the communication path if the second authentication code is not determined to match the first authentication code. The communication port may be configured to be disabled until the second authentication code matches the first authentication code.

An Automated Dynamic low voltage monitoring (LVM) based Low-Power (ADLLP) debug capability for a system-on-chip (SoC) as well as the open/closed-chassis platform for faster TTM (Time to Market) of the final platform or system. ADLLP Debug is achieved by detection of the probe connection between a target system (e.g., SoC) and debug host system. A user can dynamically override the power, clocks and LVM for intellectual property (IP) blocks not part of the debug trace by instructing a Power Management Controller (PMC) via the Inter Processor Communication (IPC) mailbox (or any other suitable mailbox driver) to set the registers in a Target Firmware (TFW) based on the probe and debug use-case.

Systems, apparatuses, and methods for implementing a multi-die clock stop trigger are described. A computing system includes a plurality of semiconductor dies connected together and sharing a global clock stop trigger signal which is pulled high via a resistor tied to a supply voltage. Each semiconductor die has a clock generation unit which generates local clocks for the die. Each clock generation unit monitors for local clock stop triggers, and if one of the local triggers is detected, the clock generation unit stops local clocks on the die and pulls the global clock stop trigger signal low. When the other clock generation units on the other semiconductor dies detect the global clock stop trigger at the logic low level, these clock generation units also stop their local clocks. Captured data is then retrieved from the computing system for further analysis.

A voltage monitoring circuit is disclosed. An apparatus includes a first physical interface circuit and a real-time oscilloscope circuit configured to monitor a first voltage provided to the first physical interface circuit. The real-time oscilloscope is configured to receive an indication that an error was detected in data transmitted from the first physical interface to a second physical interface circuit. The real-time oscilloscope is further configured to provide for debug, to a host computer external to the first interface, information indicating a state of the first voltage at a time at which the error was detected.

The present disclosure is directed to methods and systems for remote access hardware testing. A user can remotely control probes connected to an oscilloscope to collect signal measurements of test points on a circuit board. The user can control the probe point position on the circuit board using an application on a device to enter the test point locations. In some implementations, a user controls the probe machine using remote controls and a camera video feed to identify the test points on the circuit board and capture measurements. The hardware testing system can automate the measurement process with a script or by using machine learning to identify test points via a camera, controlling the probe machine, and capturing measurements of the test point.

A joint test action group transmission system includes a host terminal and a slave terminal. The slave terminal includes a test access port (TAP) circuit, an internal memory, and a memory interface controller. The TAP circuit includes a test data register set. The memory interface controller stores the data received from the TAP circuit to the internal memory. The host terminal transmits a set of download instruction bits to the TAP circuit to have the TAP circuit select the test data register set, and have the TAP circuit enter a data shift status to receive a data package through the test data register set. During the process of receiving the data package, the TAP circuit remains in the data shift status to receive the address and at least one piece of data stored in the data package continuously.

A processing system includes: main and shadow processing cores configured to operate in lockstep based on a core clock. The main processing core includes a main processing core and a main debug circuit. The shadow processing core includes a shadow functional core and a shadow debug circuit. A redundancy checker circuit is configured to assert an alarm signal when a discrepancy between outputs from the main and shadow functional cores is detected. A debug bus synchronizer circuit is configured to receive input debug data in synchrony with a debug clock, and provide synchronized debug data in synchrony with the core clock to a debug bus based on the input debug data, where the main and shadow debug circuits are configured to receive the synchronized debug data in synchrony with the core clock from the debug bus, and where the debug clock is asynchronous with respect to the core clock.