A JTAG interface in an IC includes a test mode select (TMS) pin receiving a TMS signal, a testing test access port (TAP) having a TMS signal input, a debugging test access port (TAP) having a TMS signal and glue logic coupled to receive a first output from the testing TAP and a second output from the debugging TAP. A flip-flop receives input from the testing TAP and the debugging TAP through the glue logic. A first AND gate has output coupled to the TMS signal input of the debugging TAP, and receives input from an output of the flip-flop and the TMS signal. An inverter has an input coupled to receive input from the flip-flop. A second AND gate has output coupled to the TMS signal input of the testing TAP, and receives input from the TMS signal and output of the inverter.

An integrated circuit device includes a first partition and a second partition. The integrated circuit device also includes a Joint Test Action Group (JTAG) system that controls at least a portion of the integrated circuit device via logic signals. The JTAG system includes a JTAG interface that receives logic signals and a first JTAG hub instantiated in the first partition communicatively coupled to the JTAG interface. The integrated circuit device further includes a second JTAG hub instantiated in the second partition communicatively coupled to the first JTAG hub via a bridge.

Methods and measurements systems are disclosed relating to dynamic measurement prioritization by multiple software interfaces. A first software interface with a low priority may be conducting a first measurement on a device under test (DUT) through a driver connected to a measurement device. A second software interface with a higher priority may initiate a request to conduct a second measurement on the DUT. In response, the driver may automatically determine that the second software interface has a higher priority than the first software interface and may halt the first measurement and conduct the second measurement. The driver may notify the first software interface that its access to the measurement hardware has been revoked, and the first software interface may enter a monitoring mode to monitor the results of the second measurement.

A circuit arrangement includes one or more input buffers disposed on a system-on-chip (SoC) and configured to receive and store streaming debug packets. One or more response buffers are also disposed on the SoC. A transaction control circuit is disposed on the SoC and is configured to process each debug packet in the one or more input buffers. The processing includes decoding an operation code in the debug packet, and determining from an address in the debug packet, an interface circuit of multiple interface circuits to access a storage circuit in a subsystem of multiple sub-systems on the SoC. The processing further includes issuing a request via the interface circuit to access the storage circuit according to the operation code, and storing responses and data received from the interface circuits in the one or more response buffers.

The invention relates to a real-time oscilloscope with a built-in time domain reflectometry (TDR) and/or time-domain transmission (TDT) function for measurements of a device under test (DUT). The real-time oscilloscope comprises at least one built-in generator and at least one real-time measurement channel. The built-in generator is in communication with the real-time measurement channel and the device under test (DUT) and is configured to generate incident signals. The real-time measurement channel is configured to capture incident signals transmitted to and reflected by and/or transmitted by the device under test (DUT).

A system-on-chip (SoC) includes: a plurality of processors configured to store respective debugging information in response to respective information extraction commands received in a deadlock state, the plurality of processors having different architectures; a system bus connected to the plurality of processors; and an SoC manager configured to generate the respective information extraction commands differently according to an architecture of each of the plurality of processors in response to detecting occurrence of the deadlock state, and transmit the respective information extraction commands to the plurality of processors through a bus separate from the system bus.

Methods and apparatus are disclosed for programming reconfigurable logic devices such as FPGAs in a multi-tenant server environment. In one example, a computing host includes one or more processors configured to execute a supervisor process and two or more user processes and a single FPGA integrated circuit configured into a plurality of partitions. The partitions include a host logic partition that is accessible only to the supervisor process executing on the computing host, and two or more accelerator partitions. Each of the accelerator partitions is configured to include a virtual debug unit with a logic analyzer that collects logic signals generated by logic within the respective accelerator partition and sends debug data indicating values of the logic signals to one of the user processes. In some examples, the host logic partitions and/or the accelerator partitions can be independently reprogrammed of each other within their respective portions of the single FPGA.

A method and apparatus for non-intrusive on-chip debugging is disclosed. The method and apparatus also support remote protocol to directly communicate with a host machine running a debugger software, without any additional debug controllers in between. And scan-chain is not required for said method and apparatus.

This disclosure describes a reduced pin bus that can be used on integrated circuits or embedded cores within integrated circuits. The bus may be used for serial access to circuits where the availability of pins on ICs or terminals on cores is limited. The bus may be used for a variety of serial communication operations such as, but not limited to, serial communication related test, emulation, debug, and/or trace operations of an IC or core design. Other aspects of the disclosure include the use of reduced pin buses for emulation, debug, and trace operations and for functional operations.

An example of a system includes a host interface, a set of non-volatile memory cells assigned a first logical address range, and one or more control circuits coupled to the host interface and coupled to the set of non-volatile memory cells. The one or more control circuits are configured to generate debug data and send the debug data through the host interface in response to a command received through the host interface. The command is directed to a second logical address range, the second logical address range assigned exclusively for debug data.