A method for protecting a mobile terminal device from cyber security threats, including the steps of: detecting that the mobile terminal device is successfully connected only through one or both of a selected physical serial interface connected to a device for facilitating the testing or a wired network interface, which is connected to an electrical utility device. Prior to executing a test routine by the mobile terminal device, switching the mobile terminal device to a test state by: disabling an internal firewall, disabling one or more remaining network interfaces and serial interfaces, such that existing communications or connections are terminated and new communications and connections are prevented. Enabling communication to one or both of the selected physical serial interface and the wired network interface, performing the testing on the at least one electrical utility device according to the executed test routines under control of the mobile terminal device until completion.

In a general aspect, a method for executing a target operation combining a first input data with a second input data, and providing an output data can include generating at least two pairs of input words each comprising a first input word and a second input word and applying to each pair of input words a same derived operation providing an output word including a part of the output data resulting from the application of the target operation to first and second input data parts present in the pair of input words, and a binary one's complement of the output data part.

Disclosed is a method for protecting data information of an electronic device, comprising the following steps: 1) performing power-on detection on an electronic device of which production and installation are completed, detecting the stray capacitance of a signal line thereof, and recording same as a standard value of the signal line; 2) during a power-on operation, monitoring the stray capacitance of the signal line; 3) comparing the monitored capacitance value with the standard value, and entering step 4) when exceeding the set threshold value, otherwise entering step 2); and 4) erasing significant data in the electronic device. The method uses the manner of monitoring the stray capacitance to monitor the contact of outside foreign matter with the signal line, guarantees the security of data in the electronic device, and has the characteristics that the implementation process is simple and easy, safe and reliable, and the cost is low.

A chassis platform, such as processor or a system-on-chip (SoC), includes logic to implement a debug chassis security system including a policy generator to control access from a test access port. The policy generator may distribute a debug policy to at least one logic block that locally enforces the debug policy. The debug policy may include a delayed authentication policy in which debug assets are distributed and the chassis platform is initially locked to prevent debug access via the test access port. An authenticated debug user may unlock the chassis platform at a later time to enable debugging operations. The debug policy may also include a live execution policy and an immediate debug policy.

Disclosed are methods, systems and devices for implementing built-in self-test (BIST) to be performed by an untrusted party and/or in an unsecure testing environment. In an embodiment, a test access port (TAP) on a device may enable a party to initiate execution of one or more BIST procedures on the device. Additionally, such a TAP may enable loading of encrypted instructions to be executed by one or more processors formed on a device under test.

An integrated circuit (IC) includes functional logic therein that can be enabled by application of a predefined thermal cycle. The IC includes an enabling fuse operatively coupled to the functional logic, the functional logic being disabled unless enabled by activation of the enabling fuse. A set of thermal sensors are arranged in a physically distributed manner through at least a portion of the IC. A test control macro operatively couples to the set of thermal sensors and the enabling fuse for activating the enabling fuse to enable the functional logic in response to application of a thermal cycle that causes the set of thermal sensors to sequentially experience a thermal condition matching a thermal sequence enabling test. A related method and system for applying the predefined thermal cycle are also provided.

A network of storage units has a data path, which is at least a portion of the network. The network also has a dynamic time-varying or cycle-varying code generation unit and a code comparator unit that together make up an unlock signal generation unit; and a gateway storage unit. If the gateway storage unit does not store an unlock signal or the unlock signal generation unit does not generate and transmit an unlock signal, the gateway storage unit does not insert a data path segment in the data path. If the unlock signal generation unit is operated such that it generates an unlock signal, and it transmits that unlock signal to a gateway storage unit, and the gateway storage unit stores the unlock signal value, then the gateway storage unit inserts a data path segment into the data path.

An apparatus includes a database with device profiles, and a device programmer. The device programmer includes instructions. The instructions, when read and executed by a processor, cause the device programmer to identify a device identifier of an electronic device. The device programmer is further caused to, based upon the device identifier, access device data from the database. The device programmer is further caused to, based upon the device data, determine an area of memory of the electronic device that can be written. The device programmer is further caused to, based on the determination of the area of memory of the electronic device that can be written, write data to the area of memory.

A power glitch signal detection circuit, a security chip and an electronic apparatus are disclosed. The power glitch signal detection circuit includes a voltage sampling module, wherein the voltage sampling module includes: a first metal oxide semiconductor MOS transistor and a capacitor for sampling a power supply voltage, wherein a gate terminal of the first MOS transistor is connected to the capacitor, a source terminal of the first MOS transistor is connected to a ground voltage. The power glitch signal detection circuit further comprises a second MOS transistor and a signal output module. One terminal of the second MOS transistor is connected to a gate terminal of the first MOS transistor, another terminal of the second MOS transistor is connected to the power supply voltage, and a drain terminal of the second MOS transistor is connected to a drain terminal of the first MOS transistor.

Systems and techniques of the present disclosure may provide remote debugging of an integrated circuit (IC) device while preventing unauthorized access of device intellectual property (IP). A system may include an IC device that generates an encrypted session key and an interface that enables communication between the IC device and a remote debugging site. The interface may enable the IC device to send the encrypted the encrypted session key to initiate a remote debug process, receive an acknowledgement from the remote debugging session, and authenticate the acknowledgement. Further, the interface may enable to the IC device to initiate a secure debug session between the IC device and the remote debugging site.