Examples of an electronic device are described. In some examples, the electronic device includes a first shared line of a plurality of first contacts to respectively connect to a plurality of integrated circuits, a plurality of second lines of respective second contacts to respectively connect to the plurality of integrated circuits, and a third shared line of a plurality of third contacts to respectively connect to the plurality of integrated circuits. In some examples, the electronic device includes circuitry to determine whether one of the third contacts is connected to an integrated circuit based on a state of the first shared line and a state of one of the second lines that is associated with the one of the third contacts.

A testing device includes a measuring unit, a testing board supporting the measuring unit and connected to the measuring unit, and a connecting interface coupled to the testing board. The connecting interface includes connecting terminals protruding in a direction away from the testing board, and is connected to a device under test (DUT) via the connecting terminals. When the DUT is connected to the connecting interface, the measuring unit supplies a constant electric current via the testing board and the connecting interface to the DUT for a preset duration to result in a voltage, measures the voltage, and determines, based on a result of measurement of the voltage, an electrical connection status of the DUT.

A testing device includes a measuring unit, a testing board supporting the measuring unit and connected to the measuring unit, and a connecting interface coupled to the testing board. The connecting interface includes connecting terminals protruding in a direction away from the testing board, and is connected to a device under test (DUT) via the connecting terminals. When the DUT is connected to the connecting interface, the measuring unit supplies a constant electric current via the testing board and the connecting interface to the DUT for a preset duration to result in a voltage, measures the voltage, and determines, based on a result of measurement of the voltage, an electrical connection status of the DUT.

A battery state determination device that determines a state of a connection terminal of a battery includes: a current detection unit configured to detect a value of current flowing into or a value of current flowing out of the battery, and a determination unit configured to determine that the connection terminal of the battery is disconnected based on the current value detected by the current detection unit during charging of the battery without using voltage values of the battery.

A battery state determination device that determines a state of a connection terminal of a battery includes: a current detection unit configured to detect a value of current flowing into or a value of current flowing out of the battery, and a determination unit configured to determine that the connection terminal of the battery is disconnected based on the current value detected by the current detection unit during charging of the battery without using voltage values of the battery.

The present disclosure relates to a testing device comprising a bracket including a first groove and a second groove parallel to each other, wherein the first groove and the second groove run through an inner surface of the bracket perpendicularly to a thickness direction of the testing device; a plate assembly including a first plate and a second plate parallel to each other, wherein the first plate is disposed within the first groove and fits closely within the first groove along a length direction and a thickness direction of the testing device, the second plate is disposed within the second groove, with a gap present in the second groove along a length direction and/or a thickness direction of the testing device; a connector array including a plurality of connector assemblies disposed on the plate assembly in a predetermined pattern, wherein each of the plurality of connector assemblies is connected between the first plate and the second plate; and a displacing tool disposed on the bracket and/or the plate assembly and configured to displace the second plate relative to the first plate within the second groove along a length direction and/or a thickness direction of the testing device. The testing device may simulate various different axial deviations and/or angular deviations of the opposed printed circuit boards, and may be used to test the performance parameters such as low PIM, return loss and insertion loss between the printed circuit boards and the connectors under different axial deviations and/or angular deviations.

The present disclosure relates to a testing device comprising a bracket including a first groove and a second groove parallel to each other, wherein the first groove and the second groove run through an inner surface of the bracket perpendicularly to a thickness direction of the testing device; a plate assembly including a first plate and a second plate parallel to each other, wherein the first plate is disposed within the first groove and fits closely within the first groove along a length direction and a thickness direction of the testing device, the second plate is disposed within the second groove, with a gap present in the second groove along a length direction and/or a thickness direction of the testing device; a connector array including a plurality of connector assemblies disposed on the plate assembly in a predetermined pattern, wherein each of the plurality of connector assemblies is connected between the first plate and the second plate; and a displacing tool disposed on the bracket and/or the plate assembly and configured to displace the second plate relative to the first plate within the second groove along a length direction and/or a thickness direction of the testing device. The testing device may simulate various different axial deviations and/or angular deviations of the opposed printed circuit boards, and may be used to test the performance parameters such as low PIM, return loss and insertion loss between the printed circuit boards and the connectors under different axial deviations and/or angular deviations.

A test apparatus for verifying plugging force of an electrical component having sockets for receiving one or more corresponding plugs in a push fit arrangement. The test apparatus includes a load plate with a support surface orthogonal to first and a second axes. A holder retains the first electrical component on the load plate. A plurality of load cells supports the load plate at spaced locations. A plugging force applied to the first electrical component via the second electrical component is transferred to the plurality of load cells. A processor is provided for receiving load cell data corresponding to the force applied to each load cell respectively. The processor determines the magnitude of the plugging force and the location at which the plugging force is applied to the first electrical component relative to the first and second axes of the load plate.

A test apparatus for verifying plugging force of an electrical component having sockets for receiving one or more corresponding plugs in a push fit arrangement. The test apparatus includes a load plate with a support surface orthogonal to first and a second axes. A holder retains the first electrical component on the load plate. A plurality of load cells supports the load plate at spaced locations. A plugging force applied to the first electrical component via the second electrical component is transferred to the plurality of load cells. A processor is provided for receiving load cell data corresponding to the force applied to each load cell respectively. The processor determines the magnitude of the plugging force and the location at which the plugging force is applied to the first electrical component relative to the first and second axes of the load plate.

The invention relates to a reflectometry system for detecting faults on a hardened multipoint connector of an electrical network, of the type that comprises a measuring probe, characterized in that it comprises an interfacing and impedance matching part that is electrically suitable for mounting on the connector to be tested and comprises a body provided with at least one element in the form of a collector ring for the contact masses of the connector and a measuring opening for the probe of the reflectometry system.