G02B21/086

Upright and inverted microscope

A dual-configuration microscope is provided that may be converted into an upright or inverted microscope. The microscope includes a base and a body having a first portion and a second portion, wherein the body is rotatably coupled to the base. The microscope further includes an objective coupled to the first portion of the body, a condenser coupled to the second portion of the body and a stage positioned between the objective and the condenser. The microscope further includes a first and second knob configured to adjust the position of the objective, wherein the first knob is disposed proximal to the first portion of the body and the second knob is disposed proximal to the second portion of the body.

Method for determining an imaging function of a mask inspection microscope, and mask inspection microscope
11243392 · 2022-02-08 · ·

The invention relates to a method for determining an imaging function of a mask inspection microscope, wherein the mask inspection microscope comprises an imaging optical element, a tube, a recording device, an object stage, an illumination unit for measurement with transmitted light and an illumination unit for measurement in reflection, comprising the following method steps: a) measuring the intensities in the pupil plane of the imaging optical element in a reflective measurement, b) measuring the intensities in the pupil plane of the imaging optical element in a transmitted-light measurement, d) Determining the imaging function of the intensities of the imaging optical element, d) determining the imaging function of the intensities of the illumination optical element comprised in the illumination unit for the transmitted-light measurement. Furthermore, the invention relates to a mask inspection microscope for determining the deviation of an actual structure from a desired structure on an object, comprising an imaging optical element, a tube, a recording device, an additional optical module, an illumination unit for measurement with transmitted light, an illumination unit for measurement in reflection, and an object stage, wherein the object stage is configured to move to a position with a deviation of less than 100 nm, in particular of less than 20 nm, a calculation unit, in which the calculation unit is configured to calibrate the mask inspection microscope.

SAMPLE DETECTING DEVICE

A sample detecting device is used in cooperation with an image capturing device. The sample detecting device includes a first assembly and a second assembly. The first assembly includes a light emitting unit and a light-permeable unit. The light-permeable unit is disposed at one side of the light emitting unit. The first assembly and the second assembly match and connect with each other to form a sample containing space. The second assembly includes a body and a convex lens. The body has a first cavity portion and a second cavity portion. The light-permeable unit is disposed in the first cavity portion, and the convex lens is disposed in the second cavity portion. The light emitted from the light emitting unit sequentially passes through the light-permeable unit and the convex lens and leaves the body.

OPTICAL VIEWING DEVICE

An optical viewing device includes a first assembly and a second assembly. The first assembly includes a first body and a light source. The second assembly includes a second body, a convex lens and an image capturing module. The first body has a first connecting portion and a light output hole, and the first connecting portion is disposed on at least one side of the light output hole. The light source is disposed within the first body. The second body has a second connecting portion, which is disposed corresponding to the first connecting portion. The convex lens and the image capturing module are disposed within the second body, and the light outputted from the light output hole passes through the convex lens and then enters the image capturing module. The first connecting portion and the second connecting portion are connected with each other to form a chamber.

TESTING EQUIPMENT WITH MAGNIFYING FUNCTION

Embodiments disclose a device for testing biological specimen. The device includes a sample carrier and a detachable cover. The sample carrier includes a specimen holding area. The detachable cover is placed on top of the specimen holding area. The detachable cover includes a magnifying component configured to align with the specimen holding area. The focal length of the magnifying component is from 0.1 mm to 8.5 mm. The magnifying component has a linear magnification ratio of at least 1. Some embodiments further include a multi-camera configuration. These embodiments include a first camera module and a second camera module arranged to capture one or more images of the first holding area and the second holding area, respectively. The processor may perform different analytic processes on the captured images of different holding areas to determine an outcome with regard to the biological specimen.

Microscopic imaging device, microscopic imaging method, and microscopic imaging program
09772483 · 2017-09-26 · ·

To provide a microscopic imaging device capable of easily switching the imaging method. During sectioning observation and normal observation, a measuring object is irradiated with pattern measurement light and uniform measurement light generated by a light modulation element, respectively. The measuring object is irradiated with the pattern measurement light and the uniform measurement light through a common light path. During the sectioning observation, a spatial phase of the pattern is sequentially moved on the measuring object by a predetermined amount by the light modulation element, and sectioning image data indicating an image of the measuring object is generated based on a plurality of pieces of image data generated at a plurality of phases of the pattern based on the light receiving signal. During the normal observation, normal image data indicating an image of the measuring object is generated based on the light receiving signal.

Methods and systems for Fourier ptychographic imaging
09817224 · 2017-11-14 · ·

In one aspect, the present disclosure provides a system for Fourier ptychographic microscopy, the system comprising (i) an image capture apparatus including an objective lens, (ii) at least one processor, and (iii) data storage including program instructions stored thereon that when executed by the at least one processor, cause the system to: (a) capture, via the image capture apparatus, a plurality of initial images of an object, wherein each of the plurality of initial images of the object have a first resolution, and (b) process each of the plurality of initial images in Fourier space to generate a final image of the object having a second resolution, wherein the second resolution is greater than the first resolution.

PHASE CONTRAST MICROSCOPE
20170322405 · 2017-11-09 · ·

The phase contrast microscope includes: an illumination optical system 10 that emits illumination light for phase difference measurement to an observation target placed in a container; an adjustment optical system 20 that is provided between the illumination optical system 10 and the observation target S, has at least one optical element 21, and adjusts refraction of the illumination light due to a liquid surface shape of a liquid C in the container 60; an imaging unit 40 that images the observation target to which the illumination light has been emitted; and an adjustment optical system control unit 51 that adjusts optical characteristics of the adjustment optical system 20 based on uniformity of a density of an image captured by the imaging unit 40 and a density contrast.

Shearing interferometry measurement device for microscopy
11248901 · 2022-02-15 · ·

Object interference in biological samples generated by lateral shearing interference microscopes is addressed by a shearing microscope slide comprising a periodic structure having alternating reference and sample regions. In some embodiments, the reference regions are configured to provide references that remove sample overlap in a sheared microscopic measurement. A system for generating sheared microscopic measurements is also provided that comprises an inlet configured to receive a sample material, an outlet configured to release a portion of the sample material, and a periodic structure having a plurality of interleaved reference and sample channels. In some cases, the sample channels are configured to accommodate a flow of sample material from the inlet to the outlet and the reference channels are configured to provide references that remove sample overlap in a sheared microscopic measurement.

OBSERVATION APPARATUS AND OBSERVATION METHOD

Provided is an observation apparatus and an observation method with which it is possible to observe imaging subjects, such as cells or the like, without labeling the imaging subjects and without causing an increase in the apparatus size. Provided is an observation apparatus including: a light-source unit that emits illumination light upward from below a sample; and an image-capturing optical system that has an objective lens that collects transmitted light, which is the illumination light emitted from the light-source unit that has passed through the sample by being reflected above the sample and that captures, below the sample, the transmitted light collected by the objective lens.