The embodiments of the present disclosure relate to a Fabry-Perot cavity, a manufacturing method thereof, an interferometer and a measuring method for wavelength of light. The Fabry-Perot cavity includes two parallel substrates and a liquid crystal layer between the two parallel substrates, and a sealed cavity is defined between the two substrates; wherein the two substrates comprise a first substrate and a second substrate, light could enter through the first substrate and run out from the second substrate via the liquid crystal layer, and a deflection angle of the liquid crystal layer could be changed by applying various voltage between the two substrates.

The present invention relates to a wavelength-tunable type etalon comprising a liquid crystal layer, which comprises: a first substrate; a second substrate; a reflective coating film; a transparent electrode; an alignment layer, which is independently formed while covering the opposing surface of the transparent electrode; a liquid crystal layer, which is disposed in a space between each of the alignment layer s; and a sealing member, which is provided for sealing of the liquid crystal layer; and a method for manufacturing the same.

Provided is a tunable electro-optic filter including a reflective structure including a first reflective layer including a first pattern layer having a first meta-surface structure disposed on a first side of the liquid crystal layer and a second reflective layer including a second pattern layer having a second meta-surface structure disposed on a second side of the liquid crystal layer. Each of the first meta-surface structure and the second meta-surface structure includes multiple dielectric materials which are alternately stacked, and a thickness of each dielectric material gradually increases. Alternately, the tunable electro-optic filter may include a pattern layer having a meta-surface structure disposed on at least a side of the liquid crystal layer.

Disclosed are articles, embodiments, and methods of formation related substrates which exhibit a tunable interference pattern (e.g., structural color) upon reflection of incident electromagnetic radiation.