A circuit includes a guard trigger circuit that includes a first input node adapted to be coupled to a first state signal, a second input node adapted to be coupled to a second state signal and an output node. The circuit also includes a reset synchronizer circuit that includes an input node coupled to the output node of the guard trigger circuit, a clock node adapted to be coupled to a clock signal and an output node. The circuit further includes a timeout circuit including an input node coupled to the output node of the reset synchronizer circuit, a clock node adapted to be coupled to the clock signal and an output node. The circuit still further includes a reset requestor circuit that includes a first input node coupled to the output node of the guard trigger circuit, a second node coupled to the output node of the timeout circuit.

A quantum prediction AI system includes a quantum prediction circuit adapted to receive an input vector representing a subset of a time-sequential sequence; encode the input vector as a corresponding qubit register; apply a trained quantum circuit to the qubit register; and measure one or more qubits output from the quantum prediction circuit to infer a next data point in the series following the subset represented by the input vector.

A quantum prediction AI system includes a quantum prediction circuit adapted to receive an input vector representing a subset of a time-sequential sequence; encode the input vector as a corresponding qubit register; apply a trained quantum circuit to the qubit register; and measure one or more qubits output from the quantum prediction circuit to infer a next data point in the series following the subset represented by the input vector.

A multi-power distributed storage system including a first power source; a second power source electrically connected to a common bus with the first power source; a single input port inverter electrically connected to the common bus. The system including a controller configured to communicate with at least the second power source, and the single input port inverter. The second power source including a plurality of battery banks and a plurality of bi-directional DC/DC converters configured to charge and discharge the plurality of battery banks and provide DC to the single input port inverter.

A multi-power distributed storage system including a first power source; a second power source electrically connected to a common bus with the first power source; a single input port inverter electrically connected to the common bus. The system including a controller configured to communicate with at least the second power source, and the single input port inverter. The second power source including a plurality of battery banks and a plurality of bi-directional DC/DC converters configured to charge and discharge the plurality of battery banks and provide DC to the single input port inverter.

A ruggedized edge computing assembly is provided, which includes an edge computing device having a processor configured to control a controlled device. The ruggedized edge computing assembly includes a field connector configured to connect to the edge computing device via a plurality of pins and to the controlled device via a coupling. The ruggedized edge computing assembly further includes a housing overmolded around each of the field connector and the edge computing device. The housing includes two portions which are a field connector portion configured to accommodate the field connector and an edge computing device portion configured to accommodate the edge computing device. The two portions are configured to interlockingly engage together at an interface.

A ruggedized edge computing assembly is provided, which includes an edge computing device having a processor configured to control a controlled device. The ruggedized edge computing assembly includes a field connector configured to connect to the edge computing device via a plurality of pins and to the controlled device via a coupling. The ruggedized edge computing assembly further includes a housing overmolded around each of the field connector and the edge computing device. The housing includes two portions which are a field connector portion configured to accommodate the field connector and an edge computing device portion configured to accommodate the edge computing device. The two portions are configured to interlockingly engage together at an interface.

An integrated circuit includes a memory configured to store a plurality of functions; a mapping interface configured to perform a mapping from a received first signal to a first function of the plurality of functions; and a state machine configured to, in response to said mapping, execute the first function; wherein the integrated circuit is arranged to, in dependence on the execution of the first function at the state machine, modify said mapping between the first signal and the first function so as to re-map the first signal to a second function of the plurality of functions such that, on receiving a subsequent first signal, the state machine is configured to execute the second function.

An integrated circuit includes a memory configured to store a plurality of functions; a mapping interface configured to perform a mapping from a received first signal to a first function of the plurality of functions; and a state machine configured to, in response to said mapping, execute the first function; wherein the integrated circuit is arranged to, in dependence on the execution of the first function at the state machine, modify said mapping between the first signal and the first function so as to re-map the first signal to a second function of the plurality of functions such that, on receiving a subsequent first signal, the state machine is configured to execute the second function.

Methods, systems, and apparatus for operations for performing a biometric recognition attack test on a biometric recognition device. An example method includes obtaining a biometric feature object for performing the biometric recognition attack on the biometric recognition device; Perform the biometric recognition attack test on the biometric recognition device, comprising: controlling a mechanical arm to place the biometric feature object in a recognition area of the biometric recognition device; and controlling the mechanical arm to press the biometric feature object to the biometric recognition device to trigger the biometric feature object to input the biometric features in the feature attachment part into the biometric recognition device through the conductive part; obtaining an attack test result corresponding to the biometric feature object; and determining a test result of the biometric recognition attack test performed on the biometric recognition device.