A method includes identifying device description files corresponding to first and second field devices associated with an industrial process control system. The method also includes comparing multiple field device characteristics of the first and second field devices using the device description files. The method further includes identifying any differences between the device characteristics of the first field device and the device characteristics of the second field device. In addition, the method includes determining a compatibility of the first and second field devices based on any identified differences. The field device characteristics can relate to field device attributes, field device function blocks, and function block parameters of the first and second field devices.