A system for evaluating at least one state of a process is provided the system having means for segmenting the process into a plurality of process segments, one or more sensors configured to capture information related to each process segment of the plurality of process segments generated by the segmenting means, the information comprising a plurality of samples, and processing means configured to process the plurality of samples related to each process segment of the plurality of segments, and, based on the processing, provide an indication associated with the at least one state of the process.

A manufacturing process system comprises any number of assembly stations and test stations, a model unit, and any number of final products is provided. Any of a sample test method and the statistical distribution monitoring method performed by the model unit is configured to monitor the model quality after it is deployed and reduce potential unnecessary costs, such as warranty claim costs as a result of sending bad units to the customers, and rework costs as a result of predicting a good part as bad and wasting additional testing efforts on the bad parts. Further, both methods are configured to maximize the probability of detecting hazardous issues, while having control of the false alarm rate.

[Problem] To provide a manufacturing process analysis method for specifying a hindering factor that causes a variation in product performance and for stabilizing product performance.

[Solution ] A manufacturing process analysis method comprises: a step (S1) for collecting product data indicating the quality of a product and process data indicating manufacturing conditions of a product; a step (S2) for standardizing the process data so that the data are converted into an intermediate function; a step (S3) for performing principal component analysis on the intermediate function to derive a principal component load amount and a principal component score of the process data; a step (S4) for applying cluster analysis to the principal component score to classify manufacturing process lots into a plurality of groups; a step (S5) for determining relative merit of each group on the basis of product data soundness corresponding to the principal component score belonging to the group; and a step (S6) for specifying a hindering factor that contributes to the relative merit of the group

Embodiments disclosed herein generally relate to a method, system, and non-transitory computer readable medium for classifying an outlier in time series data collected by a sensor positioned in a substrate processing chamber. The client device receives time series data from the sensor positioned in the substrate processing chamber. The client device converts the time series data to a bounded uniform signal. The client device identifies signal sub-segments that do not match an expected behavior. The client device classifies the identified sub-segments that do not match the expected behavior.

The invention relates to a device (10) for at least one industrial automated process (110), in particular a weighing and/or packing and/or arranging and/or packing process, comprising: at least one sensor (30) for determining at least one process data value which is relevant to the entire process by detecting at least one partial process parameter of the device (10), which parameter is relevant to the entire process, a processing device (40), which is electrically connected to the sensor (30) for processing the process data value, an interface device (50) for data connection and for forwarding the process data value to at least one individual machine (2a, 2b, 2c) located upstream and/or downstream in the process (110), wherein the total process (110) can be evaluated with reference to the process data value by comparison with a pre-defined process instruction (130).

An information processing apparatus comprises a position and orientation estimation unit configured to estimate each of positions and orientations of a first part and a second part, based on an image including the first part and the second part to which the first part is assembled; and a determination unit configured to determine assembly success/failure of the first part with respect to the second part based on each of the positions and orientations of the first part and the second part.

A wafer-like semiconductor sensor includes a wafer-like base formed of a plurality of layers of chemically-hardened glass and an electronics module mounted to a recessed pocket in the base and containing a sensor.

The invention relates to a monitoring method (100) for monitoring a winding process on a winding device (1), comprising: providing (104) a correlation of an irregularity (12) of a web material (11) to a running parameter (13) of the reel (10) for an unwinding process. The invention further relates to a control method (200) for performing an unwinding process on an unwinding device, comprising: obtaining (201) a correlation of an irregularity (12) of a web material (11) to at least one running parameter (13) of a reel (10) from a winding process. Furthermore, the invention relates to a processing method (300) for performing a process of processing a web material (11). Furthermore, the invention relates to a winding device (1) for performing a winding process of a web material (11) to a reel (10), an unwinding device (2) for performing an unwinding process of a web material (11) of a reel (10) and a processing system (3) for processing a web material (11).

To test object image data IMG1, images (possible-defect images D1 to D3) representing possible defects detected by an image processing unit 22 are added. Adjacent to sliders L1 and L2, a histogram H1 indicating the number of detected possible defects for each wall thickness and a histogram H2 indicating the number of detected possible defects for each size are displayed, respectively. When a checkbox CB1 corresponding to a type of defect is selected by an operation unit 14, only images of possible defects of the selected type are displayed on the test object image IMG1. When the sliders L1 and L2 are operated by the operation unit 14, only images of possible defects within a wall thickness range selected by the slider L1 and within a size range selected by the slider L2 are displayed, and images of possible defects outside the ranges are erased.

The present invention provides a modular system and method for real-time evaluation and monitoring of a machining production line overall performances, calculated from each given metal workpiece, consumable tool and machine. The present invention is configured for an iterative and incremental calculation and evaluation of the machining production-line overall performances, by incrementally evaluating individual workpiece's performances, consumable tools'performances and machine's performances, extracted from the data of a plurality of workpieces and machines. The present invention is further configured for comparing the workpiece's performances to a similar workpiece's best performance, extracted from the evaluation of a plurality of the data similar workpieces. The present invention is further configured for the identification of significant process faults and their cause. The present invention is further configured for the analysis of the applied engineering-plan effectiveness, using a defined engineering score.