Systems and processes herein may be configured to correlate manufacturing parameters and performance feedback parameters with individual absorbent articles manufactured by a converting apparatus. Embodiments of the systems herein may include inspection sensors configured to inspect substrates and/or component parts advancing along the converting line and communicate inspection parameters to a controller and historian. The systems may also include process sensors configured to monitor equipment on the converting line and communicate process parameters to the controller and historian. The systems herein may also be adapted to receive performance feedback parameters based on the packaged absorbent articles. The systems may correlate inspection parameters, process parameters, and/or performance feedback parameters with individual absorbent articles produced on the converting line. The controller may also be configured to perform various functions based on the performance feedback parameters.

Systems and methods for industrial process control coordination and implementation are disclosed. In some embodiments, a facility coordinator may be configured to: receive a facility prescription from a remote server; translate the facility prescription into one or more commands understood by one or more of a plurality of controllable devices; communicate the one or more commands to the one or more controllable devices; receive sensor data from one or more of a plurality of environmental sensors; determine based on the sensor data whether an aspect of an environment or one or more of the controllable devices violates one or more constraints; and in the event operational, safety, or physical constraints are or will soon be violated, determine a corrective action and send corrective action commands to one or more of the plurality controllable devices.

Systems and processes herein may be configured to correlate manufacturing parameters and performance feedback parameters with individual absorbent articles manufactured by a converting apparatus. Embodiments of the systems herein may include inspection sensors configured to inspect substrates and/or component parts advancing along the converting line and communicate inspection parameters to a controller and historian. The systems may also include process sensors configured to monitor equipment on the converting line and communicate process parameters to the controller and historian. The systems herein may also be adapted to receive performance feedback parameters based on the packaged absorbent articles. The systems may correlate inspection parameters, process parameters, and/or performance feedback parameters with individual absorbent articles produced on the converting line. The controller may also be configured to perform various functions based on the performance feedback parameters.

A surface treatment processing method includes: a shot processing step of performing shot processing of shooting shot media at a treatment target; a first inspection step of nondestructively inspecting at least one of a surface side state and an external dimension of the treatment target subjected to the shot processing, evaluating that the treatment target is passed when an inspection result is within a first normal range set in advance, evaluating that the treatment target is failed when the inspection result is out of a first allowable range set in advance to include the first normal range, and evaluating that the treatment target is to be additionally processed when the inspection result is out of the first normal range but within the first allowable range; and an additional processing step of performing the shot processing again on the treatment target which is evaluated to be additionally processed.

The present invention provides methods and systems for manufacturing process control of photovoltaic products. Some embodiments relate to a method for tracking wafers for photovoltaic products with respect to which production tool processed them and their position within that production tool. Some embodiments relate to measuring and characterizing the critical-to-quality parameters of the partially-finished photovoltaic products emerging from the production tool in question. Some embodiments relate to display and visualization of the measured parameters on a computer screen, such that the parameters of each production unit can be directly observed in the context of which production tools processed them, which location within a specific production tool they were located in during processing, and which batch, or in the case of continuous processing, what time, the unit(s) was/where processed.

A method for measuring components produced by a production device includes selecting components to be measured from multiple components. The selection is made according to at least one selection parameter. The at least one selection parameter includes a sampling frequency. The method includes determining at least one production parameter. The at least one production parameter includes a production condition. The method includes adapting the sampling frequency based on the production parameter or a change in the production parameter. Adapting includes reducing the sampling frequency in response to one or more production parameters not changing by more than a predetermined amount.

A control system that can adjust a period required for detecting an abnormality occurring in a control object is provided. The control system includes: feature quantity creating means that creates a feature quantity from data which is acquired from the control object based on a first parameter associated with elements defining the feature quantity; deviation acquiring means that acquires a degree of deviation between the feature quantity created by the feature quantity creating means and a group of feature quantities stored by a storage means based on a second parameter associated with a range in the group of feature quantities; abnormality detecting means that detects an abnormality occurring in the control object based on the degree of deviation acquired by the deviation acquiring means and a threshold value; and instruction means that instructs the deviation acquiring means to start execution based on an execution cycle of the deviation acquiring means.

Systems and methods for industrial process control coordination and implementation are disclosed. In some embodiments, a facility coordinator may be configured to: receive a facility prescription from a remote server; translate the facility prescription into one or more commands understood by one or more of a plurality of controllable devices; communicate the one or more commands to the one or more controllable devices; receive sensor data from one or more of a plurality of environmental sensors; determine based on the sensor data whether an aspect of an environment or one or more of the controllable devices violates one or more constraints; and in the event operational, safety, or physical constraints are or will soon be violated, determine a corrective action and send corrective action commands to one or more of the plurality controllable devices.

A method for defect mitigation is disclosed. The method may include receiving defect data for one or more defects of one or more samples. The defect data may include a defect location, a defect size, a defect shape, or a relationship between the defect and a component of the one or more samples. The method may include identifying at least one defect as a disqualifying defect based on the received defect data and one or more predetermined thresholds. Upon identifying the defect as a disqualifying defect, the method may include generating a tool readable index configured to cause one or more downstream fabrications tool to adjust one or more downstream fabrication steps corresponding to the disqualifying defect based on the generated tool readable index. The method may include providing the generated tool readable index to the one or more downstream fabrication tool.

A press and a process for operating it, has an upper tool and a lower tool for shaping a workpiece and a work unit including a press drive and/or a drawing device, is controllable by a controller, to perform the shaping process. The controller outputs, to the work unit, press process values, which define the sequence of events of the shaping process. Workpiece parameters characterize, for example, the material and/or the shape and/or at least one dimension and/or quality of the workpiece, which still has to be shaped or has already been shaped. The controller is assigned a composition matrix which contains, for each defined workpiece parameter and for each defined press process value, an individually changeable function, to describe the relationship between every one of the defined workpiece parameters and the defined press process values. This composition matrix allows a quick and rapid adjustment and adaptation of the press.