Provided is an abnormality detection system that includes a first controller configured to control a substrate processing apparatus and a second controller configured to control a device provided in the substrate processing apparatus according to an instruction from the first controller, thereby detecting an abnormality in the device. The second controller includes a storage unit configured to collect status signals for the device for a predetermined time and at a predetermined sampling interval in a predetermined cycle and accumulate the collected status signals for the device, and the first controller includes an abnormality determination unit configured to acquire the accumulated status signals for the device from the second controller at a time interval equal to or longer than the predetermined time, and determine presence or absence of an abnormality in the device.

A method and a system for providing operator information in an Surface Mount Technology (SMT) system comprising an SMT information database, a SMT pick and place machine and an identity tag scanner, the method comprising: receiving a bin in said SMT pick and place machine, wherein said bin is adapted to comprise vertically oriented bin load units, wherein said bin load unit has an pallet identity tag attached to the bin load units upwards facing surface; starting SMT production on said SMT pick and place machine; scanning individual identity tags attached to bin load units comprising component tape reels to obtain bin load units IDs.

A method in an automated Surface Mount Device (SMD) warehouse configured to store bins at predetermined positions within said automated Surface Mount Device (SMD) warehouse, the method comprising receiving a bin at a port of said automated Surface Mount Device (SMD) warehouse and scanning an identity tag attached to said bin to obtain a bin ID.

A work management device includes an operator information memory section, a work item memory section, an operator detection sections, and a work instruction section. The operator detection sections are installed at a plurality of spots of the electronic component mounting line and detect the operators near the spots. In a case in which the operator detection section detects the operator, when operator information regarding the operator is identical to operator information in the operator information memory section and the work item group of the work item memory section includes one work item or a plurality of work items which are able to be performed by the operator detected by the operator detection section, the work instruction section instructs the operator detected by the operator detection section in one work item or a plurality of work items selected from the one work item or the plurality of work items.

A setup support device capable of editing a setup list in accordance with a change in a production schedule or the like, thereby enabling more efficient setup of a component mounter. The setup support device includes a list editing section for performing editing to increase or decrease production jobs included in a setup list in accordance with a request from an operator who performs setup at the component mounter or a change in a production schedule, and a guidance section for issuing setup guidance for the production jobs to the operator based on the edited setup list.

There is provided a board work machine (a component mounting machine) including a data registration section for registering in advance multiple data (ultra-high precision data, high precision data, normal precision data) for each characteristic of a member constituting a base material for a circuit board in accordance with the type and characteristic of the member; a work performing section (a part camera) for performing work using the member or performing work on the member while selecting one item of data from the multiple data for reference; and an automatic data switching section for automatically switching among the multiple member data that the work performing section refers to in accordance with the performing situation of the work performed by the work performing section.

An information processing device includes: a memory; and a processor coupled to the memory and configured to: acquire information on production of substrates and equipment information on a mounting line in which a component is mounted on the substrates; and optimize, based on the information on the production of the substrates and the equipment information on the mounting line, a plurality of factors that affect a time to complete the production of the substrates.

Methods and apparatus for the positioning of a feature of a tray such that a robot may place a component in the feature are disclosed.

A work management device manages a board work line having multiple board work machines for performing work on a board. The work management device includes a problem detection section configured to detect that a problem has occurred in any of the multiple board work machines; a handling method database configured to accumulate handling methods for problems; an updating section configured to update handling methods for problems at any time; and a work instruction section configured to extract and indicate to an operator a handling method for a problem from the handling method database when the problem detection section detects that the problem has occurred.

A method for initializing individual exposure field parameters of an overlay controller is disclosed including initializing a first control thread having a first context associated with a first product type, wherein a first layout of first exposure fields is defined for the first product type for processing in a stepper. The method further includes remapping a set of previous control state data for a set of control threads associated with other product types different than the first product type into the first layout. The other product types have layouts of second exposure fields different than the first layout. An initial set of control state data for the first control thread associated with the first product type is generated using the remapped previous control state data. The stepper is configured for processing a first substrate of the first product type using the initial set of control state data.