In an approach to creating a press-fit force analysis, one or more computer processors retrieve a force press-fit data from a press-fit machine based on a press cycle. One or more computer processors calculate a deformation force of the press cycle based on the press-fit data and storing the deformation force. One or more computer processors create a predictive control model based on the deformation force and determine if a corrective action is required based on at least one of a raw material quality data, machine setting data, a completed lot quality data or the predictive control model. One or more computer processors determine if a corrective action is required and alert a downstream process to take the corrective action. One or more computer processors schedule a material kitting.

A quality improvement support apparatus that supports improvement in quality of a product produced by a production facility, including: a display unit that displays production condition information in which identification information, operation instruction state information, and a condition evaluation index are associated with each other for each operation instruction, the identification information identifying an improvement target that is a production member or a component included in the production facility and that is to be improved to improve quality of the product, the operation instruction state information indicating a state of an operation instruction to perform an operation in relation to the improvement target, the condition evaluation index being an index for evaluating conditions of the production facility relating to the quality of the product; and an additional operation instruction accepting unit accepting an additional operation instruction for additionally giving an instruction to perform an operation on the production facility.

A method and system for generating a physical layout for a grating coupler integrated in a photonically-enabled circuit are disclosed herein. In some embodiments, the method receives a parametrized wavelength, a parametrized first refractive index, a parametrized second refractive index, a parametrized taper length, a parametrized width, a parametrized grating length, and a parametrized incident angle of the optical beam incident onto the grating coupler and generates a physical layout for the grating coupler based on the received parametrized inputs, the generating of the physical layout is according to a predefined model, and outputs the physical layout of the grating coupler for manufacturing under a semiconductor fabrication process.

A method for manufacturing system data analysis, preferably including receiving a query, determining a set of digests, and/or determining a query result. The method can optionally include merging the set of digests and/or providing the query result. A system for manufacturing system data analysis, preferably including a set of machines, a plurality of digests, and/or a set of computing systems.

A quality improvement support apparatus that supports improvement in quality of products produced by a production facility includes a display unit that displays production condition information in which quality information regarding the quality occurring or detected in a production step performed by the production facility is arranged in time series in association with a production member or a component included in the production facility, wherein, in the production condition information, the quality information of each product or a plurality of the products occurring or detected in relation to the production member or the component included in the production facility is arranged in an order in which the products are produced.

A management apparatus of a production facility, including: a facility condition collecting unit collecting facility condition information regarding conditions of the production facility from the production facility; an operation instruction creating unit creating operation instruction information indicating an instruction to perform an operation relating to the production facility on the facility condition information; an instruction transmitting unit transmitting the operation instruction information to a target; an operation information receiving unit receiving operation information regarding status of response to the operation instruction information; a management state information creating unit creating management state information including the operation instruction information, the operation information, and the production facility condition information; and an additional operation instruction issuing unit receiving additional operation instruction information indicating an instruction to perform an additional operation on the management state information, and causing the operation instruction creating unit to create operation instruction information including the additional operation instruction information.

Disclosed systems and methods may support fabric-independent multi-patterning. A system may include a coloring constraint access engine and a fabric-independent multi-patterning engine. The coloring constraint access engine may be configured to access a set of coloring constraints to apply to geometric elements of a circuit design without accessing a fabric layer that defines a layout of the geometric elements of the circuit design, the coloring constraints applicable to multi-patterning the geometric elements of the circuit design to support manufacture of circuit layers using multiple manufacturing steps (e.g., via complementary lithographic masks). The fabric-independent multi-patterning engine may be configured to perform, independent of the fabric layer, a pattern coloring process according to the set of coloring constraints to determine a respective color assignment for the geometric elements of the circuit design.

A manufacturing management device includes a determination section configured to determine the necessity of maintenance on any of the multiple production devices during production by the production line; and a conveyance management section configured to stop loading circuit boards, at a predetermined time, onto a reference device among the multiple production devices when it is determined that maintenance is necessary, the reference device being positioned upstream in the production line from a maintenance target device having a cause for maintenance.

A method in an automated Surface Mount Device (SMD) warehouse configured to store bins at predetermined positions within said automated Surface Mount Device (SMD) warehouse, the method comprising receiving a bin at a port of said automated Surface Mount Device (SMD) warehouse and scanning an identity tag attached to said bin to obtain a bin ID.

A service system and a server capable of increasing an operation rate of a production base are provided. The server acquires operation information of a component mounter in a mounting work from a host computer in the production base. The server generates analyzed result data obtained by analyzing the operation information based on the types of the manufacturers (component manufacturer and the package manufacturer) of electronic component and the package. The server transmits the generated analyzed result data to host computers in the other production bases.