The technology disclosed relates to inter-node execution of configuration files on reconfigurable processors using smart network interface controller (SmartNIC) buffers. In particular, the technology disclosed relates to a runtime logic that is configured to execute configuration files that define applications and process application data for applications using a first reconfigurable processor on a first node, and a second host processor on a second node. The execution includes streaming configuration data in the configuration files and the application data between the first reconfigurable processor and the second host processor using one or more SmartNIC buffers.

A processing system includes a processing core including a microprocessor, a memory controller configured to read software instructions for execution by the processing core, a plurality of safety monitoring circuits configured to generate a plurality of error signals by monitoring operation of the processing core and the memory controller, a fault collection and error management circuit implemented as a hardware circuit, and a connectivity test circuit. The fault collection and error management circuit is configured to receive the plurality of error signals from the plurality of safety monitoring circuits and generate one or more reaction signals as a function of the plurality of error signals. The connectivity test circuit is configured to, during a diagnostic phase executed by the processing system after executing a reset phase and before executing a software runtime phase, test connectivity between the plurality of safety monitoring circuits and the fault collection and error management circuit.

A monitoring circuit and a method for function monitoring is disclosed where the device includes the input being connected with a first subassembly that detects a frequency range of the status signal, with the first subassembly being connected with a second subassembly to implement a logical signal combination. The second subassembly is connected with a third subassembly generating a delayed output signal. The method compares a frequency fsw of the status signal with a lower first cutoff frequency f1 and an upper second cutoff frequency f2. When the frequency fsw of the status signal is located within the predetermined frequency range, the functional reliability signal is provided with a first voltage level, and when the frequency fsw of the status signal is located outside of the predetermined frequency range, the functional reliability signal is provided with a second voltage level that is different from the first voltage level.

In one embodiment, an apparatus includes at least one fabric to interface with a plurality of intellectual property (IP) blocks of the apparatus, the at least one fabric including at least one status storage, and a fabric bridge controller coupled to the at least one fabric. The fabric bridge controller may be configured to initiate a functional safety test of the at least one fabric in response to a fabric test signal received during functional operation of the apparatus, receive a result of the functional safety test via the at least one status storage, and send to a destination location a test report based on the result. Other embodiments are described and claimed.

An apparatus includes a main core processor configured to receive a first signal through a first main buffer, a second signal through a second main buffer, a third signal through a third main buffer and a fourth signal through a fourth main buffer, a shadow core processor configured to receive the first signal through a first shadow buffer, the second signal through a second shadow buffer, the third signal through a third shadow buffer and the fourth signal through a fourth shadow buffer, and a first glitch suppression buffer coupled to a common node of an input of the first main buffer and an input of the first shadow buffer.

The present invention discloses a method and a device to debug the Loongson CPU (a MIPS-structure CPU) and bridge chips. The device, including HT bus interfaces and the corresponding switches, connects the Loongson CPU and bridge chips through HT bus interfaces. Southbridge chips and northbridge chips with HT buses are selected in the following order: introducing the pins on the Loongson CPU and bridge chips into the debug device; debugging the pins on the Loongson CPU to identify whether there are any bugs with the pins; connecting the pins from the CPU and bridge chips to debug them. If the HT bus of the Loongson CPU fails to accord with the standard protocol, the problematic signal can be identified and further adjusted to improve the CPU. With the help of FPGA, multiple HT bus interfaces can be simulated. As a result, multiple chipsets can be linked to the Loongson CPU, which may be debugged simultaneously.

Methods and apparatus for automatic qubit calibration. In one aspect, a method includes obtaining a plurality of qubit parameters and data describing dependencies of the plurality of qubit parameters on one or more other qubit parameters; identifying a qubit parameter; selecting a set of qubit parameters that includes the identified qubit parameter and one or more dependent qubit parameters; processing one or more parameters in the set of qubit parameters in sequence according to the data describing dependencies, comprising, for a parameter in the set of qubit parameters: performing a calibration test on the parameter; and performing a first calibration experiment or a diagnostic calibration algorithm on the parameter when the calibration test fails.

Disclosed herein are vector index registers for storing or loading indexes of true and/or false results of conditional operations using multiple lane processing in vector processors. Each of the vector index registers store multiple addresses for accessing multiple positions in operand vectors in various types of operations that can leverage multi-lane processing.

An example system includes a processor that can receive a queue testing package. The processor can divide a hardware (HW) queue system to be tested into different types of queues. The processor can also generate a test using the different types of queues. The processor can further execute multiple instances of the generated test. The processor can also further compare results of the multiple instances of the test to detect a hardware fault in the hardware queue system.

A storage system and an operating method of the same are provided. A storage system may comprise, a host device including processing circuitry, a storage device configured to communicate with the host device, and the processing circuitry is configured to, generate a test power fault based on power fault setting information stored in a setting value table, and inject the test power fault into the storage device based on the power fault setting information.