A method for realizing an artificial neural network via an electronic integrated circuit (FPGA), wherein artificial neurons grouped into different interlinked layers for the artificial neural network, where a functional description is created for each neuron of the artificial neural network, taking into account a specifiable starting weighting, a synthesis is performed for each neuron based on the associated functional description with the associated specified starting weighting, a network list is determined as the synthesis result, in which at least a base element and a starting configuration belonging to the base element are stored for each neuron, a base element is formed as a lookup table (LUT) unit and an associated dynamic configuration cell, in which a current configuration for the LUT unit or the base element is stored, and where the network list is implemented as a starting configuration of the artificial neural network in the electronic integrated circuit.

Systems, machine readable media and methods are described for analyzing one or more physical systems using techniques that recognize patterns in underlying data and use the patterns to efficiently compute outputs using the patterns to reduce computations. The physical systems can be simulated with an estimation (e.g., an estimated power versus time waveform) that can be efficiently computed and then the estimation can be analyzed to detect patterns in the data. The detected patterns can each be analyzed with, in one embodiment, higher accuracy than the estimation to provide data that can be combined across multiple instances of each pattern to provide a higher accuracy evaluation of the system with a lower computational overhead.

Systems, machine readable media and methods are described for analyzing one or more physical systems using techniques that recognize patterns in underlying data and use the patterns to efficiently compute outputs using the patterns to reduce computations. The physical systems can be simulated with an estimation (e.g., an estimated power versus time waveform) that can be efficiently computed and then the estimation can be analyzed to detect patterns in the data. The detected patterns can each be analyzed with, in one embodiment, higher accuracy than the estimation to provide data that can be combined across multiple instances of each pattern to provide a higher accuracy evaluation of the system with a lower computational overhead.

A computer system is provided for protecting a circuit design for an application specific integrated circuit. The computer system includes a logic circuit replacement tool for identifying a module of logic circuitry for replacement in at least a portion of the circuit design. The logic circuit replacement tool generates a transformed circuit design for the application specific integrated circuit by replacing the logic circuitry in the module with a configurable circuit that performs a logic function of the logic circuitry when a bitstream stored in storage circuits in the configurable circuit configures the configurable circuit. The transformed circuit design includes the configurable circuit in the module.

A computer system is provided for protecting a circuit design for an application specific integrated circuit. The computer system includes a logic circuit replacement tool for identifying a module of logic circuitry for replacement in at least a portion of the circuit design. The logic circuit replacement tool generates a transformed circuit design for the application specific integrated circuit by replacing the logic circuitry in the module with a configurable circuit that performs a logic function of the logic circuitry when a bitstream stored in storage circuits in the configurable circuit configures the configurable circuit. The transformed circuit design includes the configurable circuit in the module.

A method of manufacturing a semiconductor device includes reducing errors in a migration of a first netlist to a second netlist, the first netlist corresponding to a first semiconductor process technology (SPT), the second first netlist corresponding to a second SPT, the first and second netlists each representing a same circuit design, the reducing errors including: inspecting a timing constraint list corresponding to the second netlist for addition candidates; generating a first version of the second netlist having a first number of comparison points relative to a logic equivalence check (LEC) context, the first number of comparison points being based on the addition candidates; performing a LEC between the first netlist and the first version of the second netlist, thereby identifying migration errors; and revising the second netlist to reduce the migration errors, thereby resulting in a second version of the second netlist.

A method of manufacturing a semiconductor device includes reducing errors in a migration of a first netlist to a second netlist, the first netlist corresponding to a first semiconductor process technology (SPT), the second first netlist corresponding to a second SPT, the first and second netlists each representing a same circuit design, the reducing errors including: inspecting a timing constraint list corresponding to the second netlist for addition candidates; generating a first version of the second netlist having a first number of comparison points relative to a logic equivalence check (LEC) context, the first number of comparison points being based on the addition candidates; performing a LEC between the first netlist and the first version of the second netlist, thereby identifying migration errors; and revising the second netlist to reduce the migration errors, thereby resulting in a second version of the second netlist.

A computer-implemented method of designing at least a portion of an electronic circuit schematic is described herein. The method comprises receiving requirements for an electronic circuit or at least a portion of an electronic circuit, creating a set of variables and constraints based on the requirements for the electronic circuit, wherein the constraints limit the possible value that may be assigned to the variables, assigning values to the variables using a solver such that the values of the variables satisfy the constraints, and outputting at least a portion of a designed electronic circuit schematic or circuit schematic specification that meets the requirements for the electronic circuit based on the assigned values of the variables.

A computer-implemented method includes receiving, by a processor, a physical design block and a physical hierarchy of a chip design of a chip. Further, the method includes extracting, by the processor, one or more features of a macro to be added to the chip design based on a logic synthesis of the chip design. Further, the method includes predicting, by the processor, specifications of the macro to be added to the chip design based on the physical design block, the predicting performed using a pre-trained machine learning model. Further, the method includes using, by the processor, the specifications of the macro to perform a physical synthesis of the chip design to determine a physical layout of the chip.

A computer-implemented method includes receiving, by a processor, a physical design block and a physical hierarchy of a chip design of a chip. Further, the method includes extracting, by the processor, one or more features of a macro to be added to the chip design based on a logic synthesis of the chip design. Further, the method includes predicting, by the processor, specifications of the macro to be added to the chip design based on the physical design block, the predicting performed using a pre-trained machine learning model. Further, the method includes using, by the processor, the specifications of the macro to perform a physical synthesis of the chip design to determine a physical layout of the chip.