The present invention discloses a detection method, a system, an electronic equipment, and a storage medium of product test data, where the detection method includes: obtaining historical test data of historical batches of products; screening the historical test data to obtain intermediate test data; grouping the intermediate test data based on preset test parameters to obtain first groups; obtaining distribution patterns of the first groups based on the intermediate test data of the first groups; when the distribution pattern is a preset distribution pattern, using the first group corresponding to the distribution pattern as a target group; and obtaining a target test limit value based on the intermediate test data corresponding to the target group. In the present invention, the test limit value can be adjusted dynamically and adaptively, and chip test data with abnormal data can be effectively detected in real time, which improves test quality of the chip.

A method includes identifying state holding pipeline stages in a pipeline path of a design for test (DFT) of an integrated circuit design, splitting each pattern of a plurality of patterns into a first part and a second part, reformatting the plurality of patterns to generate another plurality of patterns such that the first part and the second part of each pattern of the plurality patterns are included in different patterns of the another plurality of patterns. The length of the first part is a function of a number of the identified pipeline stages.

A method includes identifying state holding pipeline stages in a pipeline path of a design for test (DFT) of an integrated circuit design, splitting each pattern of a plurality of patterns into a first part and a second part, reformatting the plurality of patterns to generate another plurality of patterns such that the first part and the second part of each pattern of the plurality patterns are included in different patterns of the another plurality of patterns. The length of the first part is a function of a number of the identified pipeline stages.

According to one embodiment, an integrated circuit verification device includes: a condition property information generation unit configured to generate a plurality of condition properties that have information which imposes limitations on circuit operations or input signals, based on condition statements in a code list of a design data file; an exclusion code generation unit configured to generate, from the code list, exclusion code which is proved not to be statically covered, and a first exclusion code list to which the plurality of condition properties are applied; and an exclusion code comparison unit configured to generate a second exclusion code list from a difference between the exclusion code and the first exclusion code list.

According to one embodiment, an integrated circuit verification device includes: a condition property information generation unit configured to generate a plurality of condition properties that have information which imposes limitations on circuit operations or input signals, based on condition statements in a code list of a design data file; an exclusion code generation unit configured to generate, from the code list, exclusion code which is proved not to be statically covered, and a first exclusion code list to which the plurality of condition properties are applied; and an exclusion code comparison unit configured to generate a second exclusion code list from a difference between the exclusion code and the first exclusion code list.

Asynchronous completion notification is provided in a data processing system including one or more cores each executing one or more threads. A hardware unit of the data processing system receives and enqueues a request for processing and a source tag indicating at least a thread and core that issued the request. The hardware unit maintains a pointer to a completion area in a memory space. The completion area includes a completion granule for the hardware unit and thread. The hardware unit performs the processing requested by the request and computes an address of the completion granule based on the pointer and the source tag. The hardware unit then provides completion notification for the request by updating the completion granule with a value indicating a completion status.

Asynchronous completion notification is provided in a data processing system including one or more cores each executing one or more threads. A hardware unit of the data processing system receives and enqueues a request for processing and a source tag indicating at least a thread and core that issued the request. The hardware unit maintains a pointer to a completion area in a memory space. The completion area includes a completion granule for the hardware unit and thread. The hardware unit performs the processing requested by the request and computes an address of the completion granule based on the pointer and the source tag. The hardware unit then provides completion notification for the request by updating the completion granule with a value indicating a completion status.

A method, system, and computer program product for parallel regression to bypass regression process interruption are provided. The method identifies an RTL design. The RTL design is converted into a control data flow graph having a plurality of nodes and a plurality of arcs. A mapping table is generated with a machine learning database from a set of test cases based on the control data flow graph. The method selectively calls one or more test cases of the set of test cases to merge a branch to a main repository to bypass a portion of a regression process.

A method, system, and computer program product for parallel regression to bypass regression process interruption are provided. The method identifies an RTL design. The RTL design is converted into a control data flow graph having a plurality of nodes and a plurality of arcs. A mapping table is generated with a machine learning database from a set of test cases based on the control data flow graph. The method selectively calls one or more test cases of the set of test cases to merge a branch to a main repository to bypass a portion of a regression process.

An integrated circuit (IC) implements a radiation tolerance limiting feature (RTLF) to ensure that the IC, as manufactured, will fail one or more applicable radiation tolerance tests, for example by reducing or eliminating a required voltage or blocking a required signal. As a result, the IC can be manufactured by any suitable IC foundry, and exported without restriction. The RTLF can include a leakage component, such as an oxide dielectric capacitor, a radiation-sensitive MOSFET or SCR, or a photocurrent generating component. The RTLF can include redundancy to ensure reliability. A plurality of RTLFs can be included to ensure failure of any desired combination of applicable radiation tolerance tests, such as total radiation dosage, linear energy transfer events, radiation dose rate, and single event upset. The RTLF can be obfuscated within the IC design. The RTLF can include a testing output to ensure its functionality.