A vehicle can capture data that can be converted into a synthetic scenario for use in a simulator. Objects can be identified in the data and attributes associated with the objects can be determined. The data can be used to generate a synthetic scenario of a simulated environment. The scenarios can include simulated objects that traverse the simulated environment and perform actions based on the attributes associated with the objects, the captured data, and/or interactions within the simulated environment. In some instances, the simulated objects can be filtered from the scenario based on attributes associated with the simulated objects and can be instantiated and/or destroyed based on triggers within the simulated environment. The scenarios can be used for testing and validating interactions and responses of a vehicle controller within the simulated environment.

A vehicle can capture data that can be converted into a synthetic scenario for use in a simulator. Objects can be identified in the data and attributes associated with the objects can be determined. The data can be used to generate a synthetic scenario of a simulated environment. The scenarios can include simulated objects that traverse the simulated environment and perform actions based on the attributes associated with the objects, the captured data, and/or interactions within the simulated environment. In some instances, the simulated objects can be filtered from the scenario based on attributes associated with the simulated objects and can be instantiated and/or destroyed based on triggers within the simulated environment. The scenarios can be used for testing and validating interactions and responses of a vehicle controller within the simulated environment.

Systems and methods disclosed include receiving defect data from a test of a semiconductor device comprising a circuit, the circuit comprising a cell, the cell comprising a first input, a second input and an output, and modeling a first plurality of cell defect modes of the cell with a first multiple input transition cell fault model (MTCFM), the cell defect modes associated with a first signal transition on the first input, and a second signal transition on the second input or the output. Systems and method further include correlating the first plurality of cell defect modes to the defect data to produce a probability of each of the first plurality of cell defect modes matching the defect data, and providing, to a user, an indication of each of at least one of the first plurality of cell defect modes having the probability exceeding a defect probability threshold.

A method of power test analysis for an integrated circuit design including loading test vectors into a first sequence of flip-flops in scan mode, evaluating the test vectors and saving results of the evaluating in a second sequence of flip-flops in scan mode, reading results out of the second sequence of flip-flops to a scan chain, and calculating power generation based on the results. In one embodiment, the test vectors are received from an automatic test pattern generator.

The present application relates to a simulation method and apparatus, a computer device and a storage medium. The method includes: acquiring RDC data and historical test data of products, the RDC data including repair schemes; allocating the repair schemes to failure cells in the historical test data according to a preset RA, and acquiring a corresponding simulation repair result; and obtaining a yield of the products based on the simulation repair result and the historical test data.

A system can include a nonlinear circuit and a voltage decoder. The nonlinear circuit can perform an operation on an input voltage. The operation can be changed. A voltage decoder can be communicatively coupled to the nonlinear circuit for receiving an output voltage from the nonlinear circuit that results from the operation performed on the input voltage. The voltage decoder can compare the output voltage to a threshold voltage and determine a result of the operation.

A system can include a nonlinear circuit and a voltage decoder. The nonlinear circuit can perform an operation on an input voltage. The operation can be changed. A voltage decoder can be communicatively coupled to the nonlinear circuit for receiving an output voltage from the nonlinear circuit that results from the operation performed on the input voltage. The voltage decoder can compare the output voltage to a threshold voltage and determine a result of the operation.

Method for testing an integrated circuit device (1), by defect modelling of the integrated circuit device (1), fault modelling of the integrated circuit device (1) based on the information obtained from the defect modelling, test development based on information obtained from the fault modelling, and executing the test on the integrated circuit device (1). Defect modelling of the integrated circuit device (1) comprises executing a physical defect analysis (10) of the integrated circuit device (1) to provide a set of effective technology parameters (Tp.sub.eff) modified from a set of defect-free technology parameters (Tp.sub.df) associated with the integrated circuit device (1), and executing an electrical modelling (11) of the integrated circuit device (1) using the set of effective technology parameters (Tp.sub.eff) to provide a defect-parametrized electrical model (16; 17) based on a defect-free electrical model of the integrated circuit device (1). The present methods allow parts-per-billion testing capabilities.

A simulation method, apparatus, and a storage medium are provided. The simulation method includes: obtaining a pre-built local simulation model of a capacitor array region, wherein the local simulation model is configured to represent first simulation parameters of the capacitor array region; creating a local parameter netlist of a non-capacitor array region, wherein the local parameter netlist includes second simulation parameters of the non-capacitor array region; creating an overall parameter netlist of a peripheral region based on the local simulation model and the local parameter netlist, wherein the overall parameter netlist represents overall simulation parameters of the peripheral region, and the overall simulation parameters include the first simulation parameters and the second simulation parameters; and performing simulation on the peripheral region based on the overall parameter netlist.

A simulation method, apparatus, and a storage medium are provided. The simulation method includes: obtaining a pre-built local simulation model of a capacitor array region, wherein the local simulation model is configured to represent first simulation parameters of the capacitor array region; creating a local parameter netlist of a non-capacitor array region, wherein the local parameter netlist includes second simulation parameters of the non-capacitor array region; creating an overall parameter netlist of a peripheral region based on the local simulation model and the local parameter netlist, wherein the overall parameter netlist represents overall simulation parameters of the peripheral region, and the overall simulation parameters include the first simulation parameters and the second simulation parameters; and performing simulation on the peripheral region based on the overall parameter netlist.