A method of identifying, in a circuit design of an electronic circuit, a source of side channel leakage of the electronic circuit. The method comprises: a) simulating over a leakage time interval an operation of the circuit in response to at least one stimulus, thereby deriving for each one of the at least one stimulus per circuit part of the electronic circuit a respective simulated leakage quantity circuit part response over the leakage time interval; b) obtaining for each one of the at least one stimulus an expected leakage quantity response over the leakage time interval from a processing of each one of the at least one stimulus by a leakage model, the leakage model modelling a leak-quantity at a processing of a secure asset; c) determining respective circuit part correlations over the leakage time interval between the respective simulated leakage quantity circuit part responses and the expected leakage quantity responses; d) ranking the circuit parts based on the circuit part correlations between the respective simulated leakage quantity circuit part responses and the expected leakage quantity responses and e) identifying as the source of side channel leakage the circuit part for which a highest one of the circuit correlations has been determined between the expected leakage quantity responses and the respective simulated leakage quantity circuit part responses.

A floating body SRAM cell that is readily scalable for selection by a memory compiler for making memory arrays is provided. A method of selecting a floating body SRAM cell by a memory compiler for use in array design is provided.

An IC is provided. The IC includes an input pin, a controller, a timer, a first memory, a processor, at least one output pin, an output module coupled to the output pin, and a direct memory access (DMA) device coupled between the output module and the first memory. The controller is configured to provide a first control signal in response to a command from the input pin. The timer is configured to periodically provide a trigger signal according to the first control signal. The processor is configured to store first data in the first memory. The DMA device is configured to obtain the first data from the first memory in response to the trigger signal, and transmit the first data to the output module. The output module is configured to provide the first data to the output pin according to a transmission rate.

An IC is provided. The IC includes an input pin, a controller, a timer, a first memory, a processor, at least one output pin, an output module coupled to the output pin, and a direct memory access (DMA) device coupled between the output module and the first memory. The controller is configured to provide a first control signal in response to a command from the input pin. The timer is configured to periodically provide a trigger signal according to the first control signal. The processor is configured to store first data in the first memory. The DMA device is configured to obtain the first data from the first memory in response to the trigger signal, and transmit the first data to the output module. The output module is configured to provide the first data to the output pin according to a transmission rate.

Disclosed in the present invention is a method for optimizing circuit timing based on a flexible register timing library. First, registers are simulated respectively in a case of a plurality of groups of an input signal conversion time, a clock signal conversion time, and a register load capacitance, corresponding actual propagation delays at this time are obtained by changing setup slack and hold slack of the registers, and actual propagation delays of the registers under specific input signal conversion time, clock signal conversion time, register load capacitances, setup slack, and hold slack are obtained through linear interpolation, to establish a flexible register timing library; and then static timing analysis is performed on all register paths in a circuit by using the library, a minimum clock cycle under a condition of satisfying that a setup time margin and a hold time margin are both greater than zero is found by changing the setup slack and hold slack of the registers, thereby improving the performance of the circuit without changing the design of the circuit and without increasing the area overheads of the circuit.

Disclosed in the present invention is a method for optimizing circuit timing based on a flexible register timing library. First, registers are simulated respectively in a case of a plurality of groups of an input signal conversion time, a clock signal conversion time, and a register load capacitance, corresponding actual propagation delays at this time are obtained by changing setup slack and hold slack of the registers, and actual propagation delays of the registers under specific input signal conversion time, clock signal conversion time, register load capacitances, setup slack, and hold slack are obtained through linear interpolation, to establish a flexible register timing library; and then static timing analysis is performed on all register paths in a circuit by using the library, a minimum clock cycle under a condition of satisfying that a setup time margin and a hold time margin are both greater than zero is found by changing the setup slack and hold slack of the registers, thereby improving the performance of the circuit without changing the design of the circuit and without increasing the area overheads of the circuit.

A computer-implemented method of designing at least a portion of an electronic circuit schematic is described herein. The method comprises receiving requirements for an electronic circuit or at least a portion of an electronic circuit, creating a set of variables and constraints based on the requirements for the electronic circuit, wherein the constraints limit the possible value that may be assigned to the variables, assigning values to the variables using a solver such that the values of the variables satisfy the constraints, and outputting at least a portion of a designed electronic circuit schematic or circuit schematic specification that meets the requirements for the electronic circuit based on the assigned values of the variables.

A computer-implemented method of designing at least a portion of an electronic circuit schematic is described herein. The method comprises receiving requirements for an electronic circuit or at least a portion of an electronic circuit, creating a set of variables and constraints based on the requirements for the electronic circuit, wherein the constraints limit the possible value that may be assigned to the variables, assigning values to the variables using a solver such that the values of the variables satisfy the constraints, and outputting at least a portion of a designed electronic circuit schematic or circuit schematic specification that meets the requirements for the electronic circuit based on the assigned values of the variables.

A method and apparatus for device simulation are provided. The method includes: establishing a simulation model of a to-be-detected device, where the to-be-detected device includes a first resistor and a parasitic resistor, the parasitic resistor includes a second resistor and a contact resistor, the first resistor is a bulk resistor of the to-be-detected device, the second resistor is a terminal resistor of the to-be-detected device, and the contact resistor is an equivalent resistor of a contact plug on the to-be-detected device; determining temperature coefficients of resistance corresponding to the first resistor, the second resistor, and the contact resistor, and adding the temperature coefficients of resistance to the simulation model; and performing device simulation of Simulation Program with Integrated Circuit Emphasis (SPICE) according to the simulation model.

A method and apparatus for device simulation are provided. The method includes: establishing a simulation model of a to-be-detected device, where the to-be-detected device includes a first resistor and a parasitic resistor, the parasitic resistor includes a second resistor and a contact resistor, the first resistor is a bulk resistor of the to-be-detected device, the second resistor is a terminal resistor of the to-be-detected device, and the contact resistor is an equivalent resistor of a contact plug on the to-be-detected device; determining temperature coefficients of resistance corresponding to the first resistor, the second resistor, and the contact resistor, and adding the temperature coefficients of resistance to the simulation model; and performing device simulation of Simulation Program with Integrated Circuit Emphasis (SPICE) according to the simulation model.