Methods are provided for managing defects in Hard Disk Drive (HDD) storage devices. In particular, only a portion of the cylinders of an HDD is tested. Machine learning modeling is used to reconstruct the data for the untested cylinders. An HDD comprises a rotating disk and a read/write head actuated above the disk surface. The disk may be formatted into concentric data tracks, with each track being divided into sectors. The tracks may be organized into zones (groups of tracks called cylinders), and the axially parallel sectors in each cylinder may be organized into wedges. In a test mode, some portion of the cylinders is chosen for testing. Each wedge in the chosen cylinders is tested and labeled defective or non-defective. The test data for each defective wedge is run through a machine learning defect management logic, and inferences are made for the defective/non-defective status of the untested wedges.

A computer program product, according to one embodiment, includes a computer readable storage medium having program instructions embodied therewith. The computer readable storage medium is not a transitory signal per se. Moreover, the program instructions readable and/or executable by a controller to cause the controller to perform a method which includes: collecting, by the controller, data relating to operation of a tape drive; storing, by the controller, the collected data in wrap sections of a tape map; and storing, by the controller, a subset of the collected data in a slice region upon experiencing a first trigger condition and/or upon reaching a predefined location on a tape. Moreover, the wrap sections of the tape map correlate to physical lengths of tape. Other systems, methods, and computer program products are described in additional embodiments.

In an embodiment, a universal test cell includes a plurality of test slots configured to receive a plurality of universal test containers each including similar dimensions. Each universal test container is configured to enclose each of a plurality of different devices to test. Each universal test container includes an external electrical interface configured to couple to each of the plurality of different devices to test. The universal test cell is configured to test the plurality of different devices while each is located within a universal test container of the plurality of universal test containers. The universal test cell includes a plurality of universal electrical interfaces that are each configured to couple with the external electrical interface of each universal test container.

Example systems, data storage devices, testers, and methods for storage device configuration using mutual information are described. A data storage device may include channel circuit configuration settings for the encoding and decoding of data written to a non-volatile storage medium. Mutual information metrics may be calculated based on a multi-bit symbol size to compensate for inter-symbol interference and compared to mutual information thresholds to determine the configuration settings, such as bit and track densities, error correction codes, and modulation codes. Mutual information metrics may be used to characterize heads and media independent of the configuration settings.

Example systems, data storage devices, testers, and methods for storage device configuration using symbol context mutual information are described. A data storage device may include channel circuit configuration settings for the encoding and decoding of data written to a non-volatile storage medium. The configuration settings may be determined by determining a known pattern for a sector, determining a series of symbol contexts, determining mutual information for each symbol context, and using the symbol context mutual information to determine relationships among configuration settings, such as bit size, error correction code rate, and modulation code. Once determined, the configuration settings may be used to configure the modulation code and ECC rate for the channel circuit of the data storage device.

According to one embodiment, physical position information on errors on a recording medium is acquired, physical position relationship between the errors on the recording medium is calculated based on the position information, and a failure mode related to the errors is determined based on the position relationship.

A method includes receiving a first set of testing data associated with a first group of electronic devices. The first set of testing data is generated during a tuning test applying a first range of testing parameters. The method further includes receiving a second set of testing data associated with the first group of electronic devices. Further, the method includes determining, based on the first set of testing data and the second set of testing data, a second range of testing parameters that is less than the first range of testing parameters. The method includes testing a second group of electronic devices using a tuning test applying the second range of testing parameters.

In one embodiment, a universal test container can include a universal external electrical interface configured to couple to each of a plurality of different devices to test. In addition, the universal test container is configured to enclose each of the plurality of different devices to test.

A head-disk assembly device, mass spin-valve or gravitational rectifier and method of producing gravitomagnetic induction utilizing Nano-features fabricated on the surface of a hard disk is presented. The Nano-features may include Nano-bumps and Nano-pits. The device includes a computer hard disk, a piezoelectric glide head and/or a GMR read head, a typical hard drive's electronics, wherein defects are fabricated on the said disk using a Focused Ion Beam (FIB) by depositing requisite number of nanobumps of specified height, and etching equal number of nanopits of specified depth a few mils or mm apart on a pre-decided radius. By spinning the said nano-features disk produce (1) an associated mechanical force utilizing a piezoelectric glide head and/or (2) an associated magnetic force utilizing a GMR read head for (a) general use in surface characterization work and (b) for producing power by the presence or the absence of matter on a spinning disk.

Various embodiments for audibly mapping computing components in a computer storage system, by a processor device, are provided. In one embodiment, a method comprises creating a detectible audible pattern using an actuator arm and head assembly of a hard disk drive operating in the computer storage system for physically mapping the hard disk drive to a logical location within the computer storage system.