A memory device includes a memory cell array having a plurality of memory cell strings, and a plurality of bit lines connected to at least one of the plurality of memory cell strings; and a plurality of page buffers connected to the plurality of bit lines, wherein each of the plurality of page buffers includes a plurality of latches sharing one data transfer node and exchanging data with each other through the data transfer node; and a pass transistor setting a connection between the data transfer node and another data transfer node of another page buffer.

A memory device including a memory array operatively coupled to an array data bus and a deserializer circuit operatively coupled with the array data bus. The deserializer circuit includes a first ring counter including a first set of flip-flops to sequentially output a set of rising edge clock signals based on a reference clock input and a second ring counter portion including a second set of flip-flop circuits to sequentially output a set of falling edge clock signals based on the reference clock input. A rising data circuit portion of the deserializer circuit includes a set of flip-flops that each receive a rising data portion from a respective latch circuit in response to a rising edge clock signal. A falling data circuit portion of the deserializer circuit includes a set of flip-flops that each receive a falling data portion from a respective latch circuit in response to a falling edge clock signal. The third set of flip-flops outputs the set of rising data portions and the fourth set of flip-flop circuits outputs the set of falling data portions to generate a synchronized data stream to output to the array data bus in response to a common clock signal.

A latch circuit device includes: a latch circuit configured to latch an input signal to a microcomputer; a detection circuit configured to detect that the input signal is input to the latch circuit during a sleep period in which the microcomputer is in a sleep state; a wake-up circuit configured to transmit a wake-up signal to the microcomputer when an input of the input signal is detected during the sleep period; a sampling circuit configured to read the input signal from the latch circuit; a transmission circuit configured to transmit the input signal read by the sampling circuit to the microcomputer returned from the sleep state based on the wake-up signal; and a release circuit configured to release a latch state of the latch circuit after the input signal is read.

Disclosed is a memory device which includes a memory cell array including memory cells, data latches connected with a sensing node and storing data in a first memory cell of the memory cells, a sensing latch connected with the sensing node, a temporary storage node, a switch connected between the sensing latch and the temporary storage node and configured to operate in response to a temporary storage node setup signal, a first precharge circuit configured to selectively precharge a first bit line corresponding to the first memory cell depending on a level of the temporary storage node, and a control logic circuit configured to control a dump operation between the data latches, the sensing latch, and the temporary storage node. The control logic circuit performs the dump operation from the data latches to the sensing latch while the first precharge circuit selectively precharges the first bit line.

Embodiments provide a semiconductor device, and a data processing circuit and method. A chip select signal and a plurality of command signals are received through an input terminal of the data processing circuit, and a sampling signal is obtained by a receiver based on a clock signal. The chip select signal and the plurality of command signals are sampled by a latch based on the sampling signal to obtain an internal select signal and an internal command signal. The command decoder decodes the internal select signal and the internal command signal to obtain a data manipulation command.

An apparatus includes an in-memory compute circuit that includes a memory circuit configured to generate a set of products by combining received input values with respective weight values stored in rows of the memory circuit, and to combine the set of products to generate an accumulated output value. The in-memory compute circuit may further include a control circuit and a plurality of routing circuits, including a first routing circuit coupled to a first set of rows of the memory circuit. The control circuit may be configured to cause the first routing circuit to route groups of input values to different ones of the first set of rows over a plurality of clock cycles, and the memory circuit to generate, on a clock cycle following the plurality of clock cycles, a particular accumulated output value that is computed based on the routed groups of input values.

A memory circuit includes a NAND logic gate configured to receive a first bit line signal and a second bit line signal, and to generate a first signal. The memory circuit further includes a first N-type transistor coupled to the NAND logic gate, and configured to receive a first pre-charge signal. The memory circuit further includes a second N-type transistor coupled to the first N-type transistor and a reference voltage supply, and configured to receive a first clock signal. The memory circuit further includes a first latch coupled to the NAND logic gate, and configured to latch the first signal in response to at least the first clock signal or the first pre-charge signal.

The disclosed embodiments relate to logging activities of memory devices and adjusting the operation of a controller based on the activities. In one embodiment, a method comprises monitoring, by a memory device, die temperatures and data sizes of commands issued to the memory device; determining, by the memory device, a target size for a buffer based on the die temperatures and data sizes; and adjusting, by the memory device, a current size of the buffer to meet the target size.

A static random access memory (SRAM) includes fast SRAM bit cells and fast multiplexer circuits that are formed in a first row of fast cells in a hybrid standard cell architecture. Slow SRAM bit cells and slow multiplexer circuits are formed in a second row of slow cells. The slow multiplexer circuits provide a column output for the fast SRAM bit cells and the fast multiplexer circuits provide a column output for the slow SRAM bit cells. Thus, one SRAM column has fast bit cells and slow multiplexer stages while the adjacent SRAM column has slow bit cells and fast multiplexer stages to thereby provide an improved performance balance when reading the SRAM.

A page buffer circuit includes a plurality of page buffers connected to a plurality of bitlines. Each of the plurality of page buffers includes a bitline selection transistor configured to connect a corresponding bitline of the plurality of bitlines to a sensing node, a precharge circuit configured to precharge the sensing node, and a dynamic latch circuit configured to store data in a storage node. Each of the plurality of page buffers is configured to refresh the data stored in the storage node through charge sharing between the storage node and the sensing node.