A data storage apparatus is provided to include a memory device including memory cells for storing data; and an interface circuit coupled as an interface between the host device and the memory device and configured to transmit a transmission signal to the host. The interface circuit includes a delay circuit configured to generate a delay code and is configured to generate an additional signal to be combined with the transmission signal based on the delay code.

A method of operating a memory device includes receiving a duty training request, performing first training for a write path in a first period, storing a result value of the first training, performing second training for a write path in a second period, storing a result value of the second training, transmitting the result value of the first training to an external device, and receiving a duty cycle adjuster (DCA) code value corresponding to the first training result value from the external device.

Provided is an anti-fuse memory circuit. The anti-fuse memory circuit includes a memory array, a bit line (BL), and a word line (WL); an anti-fuse memory cell (FsBIn) electrically connected to the bit line (BL) through a first switch transistor (1Add); a second switch transistor (2Add) configured to connect the bit line (BL) to a transmission wire (100); a third switch transistor (3Add) configured to discharge the transmission wire (100); a reading module (102) including a first input end (+) connected to the transmission wire (100), a second input end (−) for receiving a reference voltage (VTRIP), and a sampling input end (C) for receiving a sampling signal (CLK); and a compensation module (101), connected to the third switch transistor (3Add) and configured to slow down a drop speed of a voltage at the transmission wire (100).

A microelectronic device comprises a microelectronic device structure comprising a section comprising page buffers, and an additional section horizontally neighboring the section and comprising page buffer drivers and a timing delay chain coupled to the page buffer drivers. Each of the page buffer drivers is coupled to different group of the page buffers than each other of the page buffer drivers. The timing delay chain comprises timing delay circuits coupled in series with one another. Each of the timing delay circuits is configured to adjustably delay propagation of a control signal therethrough. Memory devices, methods of operating memory devices, and electronic systems are also described.

A memory device includes a command interface configured to receive a two-cycle command from a host device via multiple command address bits. The memory device also includes a command decoder configured to decode a first portion of the multiple command address bits in a first cycle of the two-cycle command. The command decoder includes mask circuitry. The mask circuitry includes mask generation circuitry configured to generate a mask signal. The mask circuitry also includes multiplexer circuitry configured to apply the mask signal to block the command decoder from decoding a second portion of the multiple command address bits in a second cycle of the two-cycle command.

The present disclosure discloses a memory access interface device. A clock generation circuit generates a reference clock signal. A fake data strobe signal generation circuit receives the reference clock signal and delays a read enable signal from a memory access controller to enable an output of the reference clock signal to generate a fake data strobe signal. A real data strobe signal generation circuit receives a data strobe signal from a memory device and delays the read enable signal to enable an output of the data strobe signal to generate a real data strobe signal. A data reading circuit samples a data signal from the memory device according to a sampling signal to generate a read data signal to the memory access controller. A selection circuit selects the fake and the real data strobe signals as the sampling signal respectively under a single and a double data rate modes.

A storage system includes: a memory controller which provides a clock signal; a buffer which receives the clock signal and re-drives the clock signal, the buffer including a sampler which receives a data signal and a data strobe signal regarding the data signal, and which outputs a data stream; and a nonvolatile memory, including: a first duty cycle corrector, which receives the clock signal outputs a corrected clock signal by performing a first duty correction operation on the clock signal; and a data strobe signal generator, which generates the data strobe signal based on the corrected clock signal and provides the data strobe signal to the buffer. The buffer receives the data strobe signal output from the nonvolatile memory, senses a duty ratio of the data strobe signal input to the sampler, and performs a second duty correction operation on the duty ratio of the input data strobe signal.

A semiconductor memory device includes a quadrature error correction circuit, a clock generation circuit and a data input/output (I/O) buffer. The quadrature error correction circuit performs a locking operation to generate a first corrected clock signal and a second corrected clock signal by adjusting a skew and a duty error of a first through fourth clock signals generated based on a data clock signal and performs a relocking operation to lock the second corrected clock signal to the first corrected clock signal in response to a relock signal. The clock generation circuit generates an output clock signal and a strobe signal based on the first corrected clock signal and the second corrected clock signal. The data I/O buffer generates a data signal by sampling data from a memory cell array based on the output clock signal and transmits the data signal and the strobe signal to a memory controller.

Various embodiments described herein provide for operation of a memory sub-system based on a profile (also referred to herein as an operational profile) that causes the memory sub-system to have a specific set of operational characteristics. Additionally, some embodiments can provide dynamic switching between profiles based on a set of conditions being satisfied, such as current time of day or detection of a particular data input/out (I/O) pattern with respect to the memory sub-system.

The present technology relates to an electronic device. According to the present technology, a memory controller may include a training controller, a training data storage, and a machine learning processor. The training controller may perform training of correcting interface signals exchanged with a memory device, generate training data that is a result of the training, and output the training data as sample training data based on a comparison result of a training reference and the training data. The training data storage may store training history information including plural pieces of sample training data. The machine learning processor may update the training reference through machine learning based on the training history information.