Patent classifications
G11C11/40
Almost ready memory management
A method includes determining, via status polling at a first interval, an indicator of an almost ready status of a set of memory cells of a memory device, based on the indicator of the almost ready status, determining the set of memory cells of the memory device is almost ready to complete execution of an operation on the set of memory cells of the memory device, and responsive to determining the set of memory cells of the memory device is almost ready to complete execution of the operation, performing status polling at a second interval.
Semiconductor memory device managing flexible refresh skip area
A semiconductor memory device having a flexible refresh skip area includes a memory cell array including a plurality of rows to store data, a row decoder connected to the memory cell array, a refresh area storage unit to store a beginning address and an end address of a memory area that is to be refreshed in which the memory area that is to be refreshed does not include a refresh skip area having a size is selectively and/or adaptively changed, and a refresh control circuit connected to the row decoder and the refresh area storage unit. The refresh control circuit controls a refresh operation for the area that is to be refreshed and not for the refresh skip area.
Semiconductor memory device, electronic device and method for setting the same
An electronic device includes a semiconductor memory device configured to store process information and to output the process information to the outside; and a host configured to read the process information from the semiconductor memory device, and to select one of a plurality of operation modes depending on the process information so as to be set to an operation mode of the semiconductor memory device. The plurality of operation modes may define one or more of power consumption of the semiconductor memory device or a response characteristic of the semiconductor memory device.
Conductance drift corrections in neuromorphic systems based on crossbar array structures
A method of operating a neuromorphic system is provided. The method includes applying voltage signals across input lines of a crossbar array structure, the crossbar array structure including rows and columns interconnected at junctions via programmable electronic devices, the rows including the input lines for applying voltage signals across the electronic devices and the columns including output lines for outputting currents. The method also includes correcting, via a correction unit connected to the output lines, each of the output currents obtained at the output lines according to an affine transformation to compensate for temporal conductance variations in the electronic devices.
Conductance drift corrections in neuromorphic systems based on crossbar array structures
A method of operating a neuromorphic system is provided. The method includes applying voltage signals across input lines of a crossbar array structure, the crossbar array structure including rows and columns interconnected at junctions via programmable electronic devices, the rows including the input lines for applying voltage signals across the electronic devices and the columns including output lines for outputting currents. The method also includes correcting, via a correction unit connected to the output lines, each of the output currents obtained at the output lines according to an affine transformation to compensate for temporal conductance variations in the electronic devices.
Reducing duty cycle degradation for a signal path
Methods, systems, and devices for reducing duty cycle degradation for a signal path are described. In some examples, a memory system may alternate a polarity of a signal line or signal path that includes a set of transistors during successive active periods of the memory system. In some cases, the memory device may include an inversion control component configured to operate the signal using either a first polarity or a second polarity. The inversion control component may receive an indication when the memory system enters an active period, and may accordingly alternate or the polarity of the signal path during successive active periods. In some examples, the signal path may be coupled with one or more output components which may uninvert signals from the signal path when the inversion control component has inverted the polarity of the signal path.
Memory devices with selective page-based refresh
Several embodiments of memory devices and systems with selective page-based refresh are disclosed herein. In one embodiment, a memory device includes a controller operably coupled to a main memory having at least one memory region comprising a plurality of memory pages. The controller is configured to track, in one or more refresh schedule tables stored on the memory device and/or on a host device, a subset of memory pages in the plurality of memory pages configured to be refreshed according to a refresh schedule. In some embodiments, the controller is further configured to refresh the subset of memory pages in accordance with the refresh schedule.
SEMICONDUCTOR DEVICE
A semiconductor device capable of holding analog data is provided. Two holding circuits, two bootstrap circuits, and one source follower circuit are formed with use of four transistors and two capacitors. A memory node is provided in each of the two holding circuits; a data potential is written to one of the memory nodes and a reference potential is written to the other of the memory nodes. At the time of data reading, the potential of the one memory node is increased in one of the bootstrap circuits, and the potential of the other memory node is increased in the other of the bootstrap circuits. A potential difference between the two memory nodes is output by the source follower circuit. With use of the source follower circuit, the output impedance can be reduced.
SEMICONDUCTOR DEVICE
A semiconductor device capable of holding analog data is provided. Two holding circuits, two bootstrap circuits, and one source follower circuit are formed with use of four transistors and two capacitors. A memory node is provided in each of the two holding circuits; a data potential is written to one of the memory nodes and a reference potential is written to the other of the memory nodes. At the time of data reading, the potential of the one memory node is increased in one of the bootstrap circuits, and the potential of the other memory node is increased in the other of the bootstrap circuits. A potential difference between the two memory nodes is output by the source follower circuit. With use of the source follower circuit, the output impedance can be reduced.
Victim row refreshes for memories in electronic devices
An electronic device includes a memory having a plurality of memory rows and a memory refresh functional block that performs a victim row refresh operation. For the victim row refresh operation, the memory refresh functional block selects one or more victim memory rows that may be victims of data corruption caused by repeated memory accesses in a specified group of memory rows near each of the one or more victim memory rows. The memory refresh functional block then individually refreshes each of the one or more victim memory rows.