A memory chip is described. The memory chip includes storage cells along a row of the memory chip's storage cell array to store a count value of the row's activations and error correction code (ECC) information to protect the count value. The memory chip includes ECC read logic circuitry to correct an error in the count value. The memory chip includes a comparator to compare the count value against a threshold. The memory chip includes circuitry to increment the count value if the count value is deemed not to have reached the threshold and ECC write logic circuitry to determine new ECC information for the incremented count value, and write driver circuitry to write the incremented count value and the new ECC information into the storage cells. The memory chip includes circuitry to cause the row to be refreshed if the count value is deemed to have reached the threshold.

Methods, systems and computer program products for providing access to a spare memory array element (“MAE”) are provided. Aspects include storing a row number a column number associated with a defective MAE of a plurality of MAEs. The plurality of MAEs are logically arranged in a plurality of rows and a plurality of columns. Aspects also include receiving a command to access a cache line. The cache line corresponds to a selected row of MAEs of the plurality of MAEs. Responsive to determining that the selected row matches the row number that is associated with the defective MAE, aspects include activating one or more column shifters to prevent access to the defective MAE and provide access to a spare MAE when accessing the cache line. The activation of the one of more column shifters is based on the column number that is associated with the defective MAE.

Embodiments of the disclosure are drawn to apparatuses and methods for generating multiple row hammer address refresh sequences. An example apparatus may include an address scrambler and a refresh control circuit. The address scrambler may receive a first address, output a second address in response to a first control signal, and output a third address in response to a second control signal. The second address may physically adjacent to the first address and the third address may physically adjacent to the second address. The refresh control circuit may perform a refresh operation on the second address when the first control signal is active and perform the refresh operation on the third address when the second control signal is active.

A buffer circuit is disclosed. The buffer circuit includes a command address (C/A) interface to receive an incoming activate (ACT) command and an incoming column address strobe (CAS) command. A first match circuit includes first storage to store failure row address information associated with the memory, and first compare logic. The first compare logic is responsive to the ACT command, to compare incoming row address information to the stored failure row address information. A second match circuit includes second storage to store failure column address information associated with the memory, and second compare logic. The second compare logic is responsive to the CAS command, to compare the incoming column address information to the stored failure column address information. Gating logic maintains a state of a matching row address identified by the first compare logic during the comparison carried out by the second compare logic.

The repair circuit is disposed in a memory including a normal memory area and a redundant memory area including a target repair unit immediately adjacent to the normal memory area, and the repair circuit being configured to control the target repair unit to repair an abnormal memory cell in the normal memory area. The repair circuit includes: a first control circuit, configured to receive signals at a target number of bits from low to high in a row address, process the received signals to obtain a control result, and output the control result, where the target number is associated with a number of Word Lines in the target repair unit; and a repair determination circuitry, connected to an output terminal of the first control circuit, and configured to receive the control result and output, in combination with the control result, a repair signal indicating whether to perform a repair operation.

Disclosed herein is an apparatus that includes first register circuits configured to store a first address, and a comparing circuit configured to compare the first address with a second address. The comparing circuit includes first and second circuit sections. In a first operation mode, the comparing circuit is configured to activate a match signal when the first circuit section detects that the first bit group of the first address matches with the third bit group of the second address and the second circuit section detects that the second bit group of the first address matches with the fourth bit group of the second address. In a second operation mode, the comparing circuit is configured to activate the match signal when the first circuit section detects that the first bit group matches with the third bit group regardless of the second and fourth bit groups.

Disclosed herein is an apparatus that includes first register circuits configured to store a first address, and a comparing circuit configured to compare the first address with a second address. The comparing circuit includes first and second circuit sections. In a first operation mode, the comparing circuit is configured to activate a match signal when the first circuit section detects that the first bit group of the first address matches with the third bit group of the second address and the second circuit section detects that the second bit group of the first address matches with the fourth bit group of the second address. In a second operation mode, the comparing circuit is configured to activate the match signal when the first circuit section detects that the first bit group matches with the third bit group regardless of the second and fourth bit groups.

A buffer circuit is disclosed. The buffer circuit includes a command address (C/A) interface to receive an incoming activate (ACT) command and an incoming column address strobe (CAS) command. A first match circuit includes first storage to store failure row address information associated with the memory, and first compare logic. The first compare logic is responsive to the ACT command, to compare incoming row address information to the stored failure row address information. A second match circuit includes second storage to store failure column address information associated with the memory, and second compare logic. The second compare logic is responsive to the CAS command, to compare the incoming column address information to the stored failure column address information. Gating logic maintains a state of a matching row address identified by the first compare logic during the comparison carried out by the second compare logic.

A memory core including a memory core including memory cells that are arranged in a plurality of rows and a plurality of columns; and a refresh target selection circuit suitable for storing an address and a risk score of each of activated rows among the rows, wherein the refresh target selection circuit is further suitable for increasing the risk score of a corresponding row whenever the corresponding row is activated, whenever a row at a ‘+2’ position of the corresponding row is activated, and whenever a row at a ‘−2’ position of the corresponding row is activated.

A memory device including: a memory cell array including a plurality of memory cell rows; an address buffer configured to store addresses of target rows of the plurality of memory cell rows, wherein the addresses of the target rows have been repeatedly accessed; a minimum access output circuit configured to select, when there are a plurality of rows having a same minimum access count among the target rows, any one of the plurality of rows having the same minimum access count as a minimum access row based on a selection command value, and to output an index value of the minimum access row; and a control circuit configured to output a command instructing replacement of an address corresponding to the index value of the minimum access row with an address of an access row and storage of the address of the access row in the address buffer.