A non-volatile memory device, a method of operating the non-volatile memory device, and a memory system including the non-volatile memory device are provided. A non-volatile memory device includes a memory cell array including a plurality of memory cells configured to be each programmed to one state of a plurality of states, a page buffer circuit including a plurality of page buffers configured to each store received data as state data indicating a target state of a corresponding one of the plurality of memory cells, the page buffer circuit being configured to perform a state data reordering operation of changing a first state data order into a second state data order during performance of a program operation on selected memory cells of the plurality of memory cells, and a reordering control circuit configured to control the page buffer circuit to perform the state data reordering operation simultaneously with the program operation.

Disclosed in some examples are improvements to data placement architectures in NAND that provide additional data protection through an improved NAND data placement schema that allows for recovery from certain failure scenarios.

The present disclosure stripes data diagonally across page lines and planes to enhance the data protection. Parity bits are stored in SLC blocks for extra protection until the block is finished writing and then the parity bits may be deleted.

A memory system includes a nonvolatile memory configured to execute one of a plurality of read operations, including a first read operation and a second read operation, and a memory controller configured to issue a read command to the nonvolatile memory to cause the nonvolatile memory to execute one of the plurality of read operations. The memory controller is configured to receive a read request, estimate a reliability level of a result of a read operation to be executed by the nonvolatile memory to read data from a physical address specified in the read request, select one of the first and second read operations to be executed first in a read sequence corresponding to the read request by the nonvolatile memory based on the estimated reliability level, and instruct the nonvolatile memory to execute the selected read operation.

A non-volatile memory device is provided. The memory device includes: word lines stacked on a substrate; a string select lines on the word lines, the string select lines being spaced apart from each other in a first horizontal direction and extending in a second horizontal direction; and a memory cell array including memory blocks, each of which includes memory cells connected to the word lines and the string select lines. The string select lines include a first string select line, and a second string select line which is farther from a word line cut region than the first string select line, and a program operation performed on second memory cells connected to a selected word line and the second string select line is performed before a program operation performed on first memory cells connected to the selected word line and the first string select line.

One embodiment of a memory device includes an array of multiple-level memory cells and a controller. The controller is configured to program the multiple-level memory cells via a multiple-pass programming operation, the multiple-pass programming operation to program lower page data in a first pass and program higher page data in a second pass such that memory cells to be programmed to a higher level are programmed in parallel with memory cells to be programmed to a lower level.

A memory device includes a memory structure including at least one non-volatile memory cell capable of storing multi-bit data, and a control device configured to perform a program verification after a first program pulse is applied to the at least one non-volatile memory cell, determine a program mode for the at least one non-volatile memory cell based on a result of the program verification, and change a level of a pass voltage, applied to another non-volatile memory cell coupled to the at least one non-volatile memory cell, from a first level to a second level which is higher than the first level, or a setup time for changing a potential of a bit line coupled to the at least one non-volatile memory cell, according to the program mode.

A memory management method, a memory storage device, and a memory control circuit unit are provided. The method includes: reading first data from a first physical unit by using a first read voltage level according to first management information among multiple candidate management information; decoding the first data and recording first error bit information of the first data; and adjusting sorting information related to the candidate management information according to the first error bit information. The sorting information reflects a usage order of the candidate management information in a decoding operation.

A non-volatile memory device, a method of operating the non-volatile memory device, and a memory system including the non-volatile memory device are provided. A non-volatile memory device includes a memory cell array including a plurality of memory cells configured to be each programmed to one state of a plurality of states, a page buffer circuit including a plurality of page buffers configured to each store received data as state data indicating a target state of a corresponding one of the plurality of memory cells, the page buffer circuit being configured to perform a state data reordering operation of changing a first state data order into a second state data order during performance of a program operation on selected memory cells of the plurality of memory cells, and a reordering control circuit configured to control the page buffer circuit to perform the state data reordering operation simultaneously with the program operation.

A non-volatile storage system includes a control circuit connected to non-volatile memory cells provides for progressive writing of data. That is, existing data is overwritten by new data without performing a traditional erase operation that changes the threshold voltage of the memory cells back to the traditional or original erase state. In one example, new data is written on top of old data using shifted threshold voltage distributions. Some embodiments include writing MLC data over SLC data, using intermediate erase threshold voltage distributions and/or automatically detecting which threshold voltage distributions are currently being used to store data.

A semiconductor memory device includes a memory string and a control circuit. The memory string includes a first memory cell connected to a first word line and a second memory cell adjacent to the first memory cell and connected to a second word line. The control circuit is configured to perform a multi-bit-data writing with respect to each of the first and second memory cells. The multi-bit-data writing includes, in order, a first programming to program the first memory cell, the first programming with respect to the second memory cell, a reading of first data from the first memory cell, a second programming to program the second memory cell, and a verification of data programmed in the second memory cell. The control circuit is configured to set a verify voltage to be applied to the second word line during the verification based on the first data.