Apparatus for providing an interactive inspection map are disclosed. An example apparatus for providing an interactive inspection map of an inspection surface may include an inspection visualization circuit to provide an inspection map to a user device in response to inspection data provided by a plurality of sensors operationally coupled to an inspection robot traversing the inspection surface, wherein the inspection map corresponds to at least a portion of the inspection surface. The apparatus may further include a user interaction circuit to interpret a user focus value from the user device, and an action request circuit to determine an action in response to the user focus value. The inspection visualization circuit may further update the inspection map in response to the determined action.

Controllers for inspection robots traversing an obstacle are disclosed. An example controller may include an obstacle sensory data circuit to interpret obstacle sensory data provided by an obstacle sensor of an inspection robot, an obstacle processing circuit to determine refined obstacle data, and an obstacle notification circuit to generate and provide obstacle notification data to a user interface device. The example controller may further include a user interface circuit to interpret a user request value from the user interface device, and to determine an obstacle response command value in response to the user request value; and an obstacle configuration circuit to provide the obstacle response command value to the inspection robot during the interrogating of the inspection surface.

Various embodiments provide a thickness sensor and method for measuring a thickness of discrete conductive features, such as conductive lines and plugs. In one embodiment, the thickness sensor generates an Eddy current in a plurality of discrete conductive features, and measures the generated Eddy current generated in the discrete conductive features. The thickness sensor has a small sensor spot size, and amplifies peaks and valleys of the measured Eddy current. The thickness sensor determines a thickness of the discrete conductive features based on a difference between a minimum amplitude value and a maximum amplitude value of the measured Eddy current.

An eddy current sensor assembly includes an eddy current sensor and an output signal processing circuit that processes an output signal from the eddy current sensor. The output signal processing circuit includes a mixer circuit that accepts the output signal and a signal of the predetermined frequency as input, multiplies the two signals received as input, and outputs an output signal obtained by the multiplication, and a low-pass filter that accepts the output signal output by the mixer circuit as input, cuts a high-frequency signal included in the output signal received as input, and outputs at least a direct-current (DC) signal.

A system includes an inspection robot, comprising a plurality of wheels that engage an inspection surface; a plurality of sensors positioned to interrogate the inspection surface; and wherein the plurality of wheels each comprise a first magnetic hub coupled to a second magnetic hub, and wherein the plurality of wheels further define a channel between the magnetic hubs.

The eddy current sensor for measuring the film thickness of a conductive film formed on a substrate includes a core made of a magnetic material that has a base portion, and outer legs provided to the base portion at both end portions in a first direction of the base portion respectively, an excitation coil that is arranged on the core and forms an eddy current in the conductive film, and a detection coil that is arranged on the core and detects the eddy current formed in the conductive film. The length of the base portion in the first direction is not less than the length of the base portion in a second direction that is substantially orthogonal to the first direction.

A system includes an inspection robot having a plurality of input sensors comprising a plurality of magnetic induction sensors and configured to provide inspection data of an inspection surface, wherein the inspection data comprises electromagnetic (EM) induction data, and wherein the plurality of input sensors are distributed horizontally relative to the inspection surface; wherein at least a portion of the inspection surface comprises a ferrous substrate having a non-ferrous coating thereupon; a controller, comprising: an EM data circuit structured to interpret the EM induction data, and to determine a substrate distance value in response to the EM induction data; and a thickness processing circuit structured to determine a thickness value in response to the EM induction data, the thickness value comprising a thickness of the non-ferrous coating.

A method for measuring a non-magnetic coating thickness upon a non-magnetic gas turbine component, such as a hot gas path component, can comprise applying a magnetic coating, such as a ferrous coating, upon the non-magnetic gas turbine component, applying a non-magnetic coating, such as a metallic bond coating, upon the magnetic coating, and measuring a thickness of the non-magnetic coating with a magnetic induction probe. The magnetic induction probe can be calibrated to the magnetic coating before the non-magnetic coating is applied. Measuring of the thickness of the non-magnetic coating can be used to validate spray patterns of automated spray processes. The magnetic and non-magnetic coatings can be stripped from the gas turbine component and used to validate additional spray patterns.

According to one embodiment, an analysis apparatus includes a stage on which to place a sample, a light source, a film thickness measurement unit, and a controller. The light source generates a laser beam to irradiate the sample with the laser beam to cause vaporization of the sample. The film thickness measurer measures a thickness of the sample at a first position where the laser beam irradiates the sample. The controller controls at least one irradiation condition of the laser beam based on the measured thickness of the sample.

Apparatus and methods for real-time fusion of data acquired using ultrasonic and eddy current area sensors during nondestructive examination. The ultrasonic data is acquired using an array of ultrasonic transducer elements configured to enable the production and display of a C-scan of a small area. The ultrasonic transducer array may be one- or two-dimensional. The eddy current sensor can be a single pair of induction coils, a multiplicity of coil pairs, or a coil configuration in which the numbers of drive coils and sense coils are not equal. The eddy current sensor is able to provide data about the test material, such as material thickness or conductivity, to complement the ultrasonic data or enable auto-setup of the ultrasonic inspection device.