An inspection robot includes a robot body, at least two sensors, a drive module, a stability assist device and an actuator. The at least two sensors are positioned to interrogate an inspection surface and are communicatively coupled to the robot body. The drive module includes at least two wheels that engage the inspection surface. The drive module is coupled to the robot body. The stability assist device is coupled to at least one of the robot body or the drive module. The actuator is coupled to the stability assist device at a first end, and coupled to one of the drive module or the robot body at a second end. The actuator is structured to selectively move the stability assist device between a first position and a second position. The first position includes a stored position. The second position includes a deployed position.

Systems, apparatus and methods for providing an inspection map are disclosed. An apparatus for performing an inspection may include an inspection data circuit to interpret inspection data, a robot positioning circuit to interpret position data, and a processed data circuit to link the inspection data with the position data to determine position-based inspection data. The apparatus may further include a user interaction circuit to interpret an inspection visualization request for an inspection map and an inspection visualization circuit to determine the inspection map based on the position-based inspection data, and a provisioning circuit structured to provide the inspection map to a user device.

Disclosed is a film thickness detection device, including a common unit (1) and a detection unit (2); the common unit (1) comprises at least one common electrode (11); the detection unit (2) comprises at least one sensor chip (21) and a signal processing unit (23); the sensor chips (21) are opposite to the common unit (1) in a first direction and are arranged at intervals; the spaces between the common unit (1) and the sensor chips (21) form a transport channel for a to-be-tested film; each of the sensor chips (21) comprises at least one row of multiple detection electrodes (211) arranged along a second direction; the second direction is perpendicular to a moving direction of the to-be-tested film; the first direction is perpendicular to a first plane; the first plane is parallel to the second direction; the sensor chips (21) are configured to induce electrical signals on the common electrodes (11) and output the electrical signals; and the signal processing unit (23) is electrically connected with the sensor chips (21), processes the electrical signals output by the sensor chips (21) and outputs the electrical signals.

Systems, methods and apparatus for rapid development of an inspection scheme for an inspection robot are disclosed. An apparatus may include an inspection definition circuit to interpret an inspection description value, and a robot configuration circuit to determine an inspection robot configuration description in response to the inspection description value. The apparatus may further include a configuration implementation circuit, communicatively coupled to a configuration interface of an inspection robot, to provide at least a portion of the inspection robot configuration description to the configuration interface.

A system includes an inspection robot having a number of payloads, a number of arms mounted to the payloads, and a number of sleds mounted to the arms, where the sleds comprise an upper portion coupled to a replaceable lower portion, the replaceable lower portion having a bottom surface shaped to accommodate an inspection surface; and an inspection sensor coupled to the upper portion of the one of the plurality of sleds such that the sensor is operationally couplable to the inspection surface.

A system includes an inspection robot having a number of payloads, a number of arms mounted to the payloads, and a number of sleds mounted to the arms. The system includes a number of sensors, each mounted to a corresponding sled, such that the sensor is operationally coupleable to an inspection surface in contact with a bottom surface of the corresponding sled. A couplant chamber is provided within at least two of the sleds, the couplant chamber between a transducer of a sensor and the inspection surface. The system includes a biasing member for each of the arms, where the biasing member provides a down force on the corresponding sled.

Methods, systems, and non-transitory computer readable medium are described for prescriptive analytics in highly collinear response space. A method includes receiving film property data associated with manufacturing parameters of manufacturing equipment. The method further includes determining that the film property data is correlated and is different from target data. The method further includes selecting a set of data points of the film property data that are orthogonal to the target data. The method further includes performing feature extraction on the set of data points. The method further includes determining, based on the feature extraction, updates to one or more of the manufacturing parameters to meet the target data.

A system includes an inspection robot for performing an inspection on an inspection surface with an inspection robot, the apparatus comprising a position definition circuit structured to determine an inspection robot position on the inspection surface; a data positioning circuit structured to interpret inspection data, and to correlate the inspection data to the inspection robot position on the inspection surface; and wherein the data positioning circuit is further structured to determine position informed inspection data in response to the correlating of the inspection data with the inspection robot position, wherein the position informed inspection data comprises absolute position data.

A method for contactless and non-destructive determination of the layer thicknesses of lacquer layers of vehicle parts is disclosed. In addition, the invention relates to a device to determine and measure the lacquer layers of vehicle part, the device constructed for performing optical coherence tomography and includes at least one radiation source for providing electromagnetic radiation and the electromagnetic radiation provides a wavelength () of 100 nm-15.Math.10.sup.3 nm and in particular 380 nm to 800 nm.

A sensor system includes an eddy current sensor including at least one coil with excitation electronics coupled across the coil. An optical displacement sensor is secured to the eddy current sensor so that a vertical distance between the sensors is fixed. The optical displacement sensor is located on top of and concentric with the coil so that a measurement axis of the optical displacement sensor is collinear with an axis of symmetry of the coil. A computing device including a processor and memory is coupled to receive sensor data from the eddy current sensor and the optical displacement sensor that is adapted for analyzing the sensor data obtained from measuring a coated substrate including a coating layer on at least one side of a metal substrate to determine at least a thickness of the coating layer.