Systems, methods, and devices for directed to duplex imaging techniques for combining high-resolution surface images obtained with a Scanning Fiber Endoscope (SFE), and high-resolution penetrating OCT images obtained through Optical Coherence Tomography (OCT), from a SFE, and interleaving frames to improve resolution and identify below surface information of biological structures.

Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.

Methods for performing imaging reflectometry measurements include determining a representative reflectance intensity value using multiple images of a measurement area that includes a particular structure and/or using a plurality of pixels each associated with the particular structure within the measurement area. A parameter associated with the particular structure is determined using the representative reflectance intensity value.

Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser or welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.

Sensor data is captured with a sensor. The sensor data includes a lens-position of a prescription lens relative to a reference point of an optical coherence tomography (OCT) system. A mirror of a reference arm of the OCT system is positioned at an optical pathlength between an eye region of the prescription lens based at least in part on the sensor data. An OCT signal is generated while the mirror is positioned at the optical pathlength. At least one depth profile is generated that includes the prescription lens and the eye region.

Systems, methods, and devices for directed to duplex imaging techniques for combining high-resolution surface images obtained with a Scanning Fiber Endoscope (SFE), and high-resolution penetrating OCT images obtained through Optical Coherence Tomography (OCT), from a SFE, and interleaving frames to improve resolution and identify below surface information of biological structures.

An inertial point-source matter-wave atom interferometer gyroscope includes an analyzer that receives fringe images of gyroscope atoms and includes: a first fringe image that includes a first fringe phase, a second fringe image that includes a second fringe phase; and a third fringe image that includes a third fringe phase, wherein the first fringe phase, the second fringe phase, and the third fringe phase are different; a phase mapper of the analyzer that produces a interferometric phase map for the gyroscope atoms from the fringe images of the gyroscope atoms; and a fitter of the analyzer in communication with the phase mapper and that receives the interferometric phase map from the analyzer and determines inertial parameters of the gyroscope atoms from the interferometric phase map, the inertial parameters including an acceleration and a rotation rate of the inertial point-source matter-wave atom interferometer gyroscope relative to the gyroscope atoms.

An ophthalmic apparatus of an exemplary embodiment is capable of applying OCT to the fundus of a subject's eye, and includes an optical system, an optical scanner, an optical path length changing device, and a controller. The optical system splits light output front a light source into measurement light and reference light, projects the measurement light onto the fundus, generates interference light by superposing returning light of the measurement light from the subject's eye on the reference light, and detects the interference light. The optical scanner deflects the measurement light for scanning the fundus. The optical path length changing device changes at least one of an optical path length of the measurement light and an optical path length of the reference light. The controller controls the optical scanner based on at least the optical path length.

A device for measuring the depth of a weld seam in real time during the welding or joining of a workpiece by means of radiation, including: its measuring light source, the light of which is coupled by a beam splitter into a reference arm and a measuring arm; a collimator module having at least one collimation lens for collimating a measuring light beam, which is fed to the collimator module via an optical waveguide in the measuring arm, and for imaging the measuring light beam, which is reflected from a workpiece to be processed, on an exit/entry surface of the optical waveguide; a coupling element for coupling the measuring light beam into the beam path of a processing beam; a focusing lens for the joint focusing of the measuring light beam and the processing beam on the workpiece and for the collimating of the reflected measuring light beam; and an analysis unit for determining the depth of a weld seam, into which the measuring light reflected from the workpiece is guided with the superimposed, reflected light from the reference arm. The collimator module includes a device for setting the axial focal position of the measuring light beam, and for setting the lateral focal position of the measuring light beam, and a field lens, which is arranged between the exit/entry surface of the optical waveguide and the collimation lens and defines the beam widening of the measuring light beam and therefore the focus diameter of the measuring light beam.

A method for defect inspection of a transparent substrate comprises (a) providing an optical system for performing a diffraction process of object wave passing through a transparent substrate, (b) interfering and wavefront recording for the diffracted object wave and a reference wave to reconstruct the defect complex images (including amplitude and phase) of the transparent substrate, (c) characteristics analyzing, features classifying and sieving for the defect complex images of the transparent substrate, and (d) creating defect complex images database based-on the defect complex images for comparison and detection of the defect complex images of the transparent substrate.