An exemplary optical apparatus has an OCT imaging apparatus with a first light source for low coherence light of wavelengths above a threshold wavelength and a signal detector that obtains an interference signal between low coherence light from the sample and low coherence light reflected from a reference. A surface contour imaging apparatus has a second light source that emits one or more wavelengths of surface illumination below the threshold wavelength, a camera to acquire images from illumination reflected from the sample. The exemplary optical apparatus and/or exemplary methods for using the same can provide reduced errors in generating a dental 3D surface mesh.

Techniques for measuring optical aberrations of the eye are disclosed. An example method comprises positioning the eye in a measurement location adjacent to a measurement arm of an optical coherence tomography (OCT) interferometer apparatus, so that source light from the measurement arm passes into the anterior segment of the eye and detecting an interference pattern, the interference pattern resulting from a combination of light reflected from the eye and light reflected from a reference arm of the OCT interferometer apparatus. Based on the interference pattern, an optical delay between a reference surface in the anterior segment of the eye and a measured surface in the eye is calculated, the reference surface being the anterior surface of the cornea or the lens, wherein said calculating comprises measuring an optical phase shift between the reference surface and the measured surface, based on the detected interference pattern.

The invention discloses a hybrid and scanning/snapshot spectral imager operating in both staring-spectral scanning and video snapshot spectral imaging modes. Snapshot spectral imaging operation at a set of selectable critical spectral bands comprise the basis for a machine learning-based estimation and video-rate display of a full hyperspectral cube, without compromising spatial resolution. Operating in the staring-type scanning mode, the disclosed hybrid spectral imager acquires sets of narrow band images at a given tuning step and for a plurality of tuning steps until completing a hyperspectral cube sampling. Scanning operation may be used for optimally configuring snapshot operation, such that redundant information present in the collected spectra is discarded. The disclosed hybrid spectral imager includes embodiments susceptible for miniaturization and low power operation, allowing for their integration into mobile phone and computer platforms. The invention is intended to address applications comprising, at least in part, nondestructive testing, real-time spectral and chemical mapping, noninvasive diagnosis and spectral photography.

The present patent application aims to teach apparatus, methods, and systems for providing accurate imaging in an OCT-Fluorescence imaging system, all the while decreasing lengthy processing times for the imaging, thus leading to a more accurate and timely delivery of data and images to the end user.

An image capturing apparatus for capturing an image of a workpiece held on a chuck table includes a camera, an objective lens having a minute hole defined centrally therein and disposed in facing relation to the workpiece held on the chuck table, an optical fiber having an end inserted in the minute hole in the objective lens, a light source optically coupled to another end of the optical fiber, and a beam splitter disposed in the optical fiber for branching off returning light reflected by the workpiece held on the chuck table. The image capturing apparatus further includes a calculating section for calculating a value representing a height or a thickness of the workpiece on the basis of the returning light branched off by the beam splitter, and a focusing mechanism for focusing the objective lens on the workpiece on the basis of the value calculated by the calculating section.

Detecting device and method, and liquid crystal dropping apparatus and method are provided. The detecting device is configured to detect a volume of an uneven region of a color filter substrate in a display area, and includes at least one collection unit and a processing circuit. The collection unit is configured to obtain a surface image of the color filter substrate in the display area, and output the obtained surface image to the processing circuit. The processing circuit is connected to the collection unit and configured to process the surface image to obtain a volume of the uneven region of the color filter substrate in the display area. The detecting device and the corresponding method can automatically obtain the volume of the uneven region of the color filter substrate in the display area, thereby obtaining an appropriate filling amount of liquid crystal and ensuring product quality.

An optical coherence tomography system for imaging a sample is configured so as to illuminate a region of interest of the sample with incident light from an optical source. The optical coherence tomography system is further configured so as to interfere, on an optical detector, reference light from the optical source with offset returning light emerging from the sample along an offset collection path which is spatially offset from the region of interest of the sample, thereby creating interference on the optical detector.

A method and system for determining a location of artefacts and/or inclusions in a gemstone, mineral or sample thereof, the method comprising the steps of: surface mapping a gemstone, mineral or sample thereof to determine surface geometry associated with at least a portion of a surface of the gemstone, mineral or sample thereof; sub-surface mapping the gemstone, mineral or sample thereof using an optical beam that is directed at the surface along an optical beam path, wherein the optical beam is generated by an optical source using an optical tomography process; determining a surface normal at the surface at an intersection point between the optical beam path and the determined surface geometry; determining relative positioning between the surface normal and the optical beam path; and determining the location of artefacts and/or inclusions in the gemstone, mineral or sample thereof based on the sub-surface mapping step and the determined relative positioning.

In a general aspect, a wavelength of light is measured. In some aspects, a wavelength measurement system includes an interferometer, a camera system, a sensor and a control system. The interferometer includes two reflective surfaces and a transmission medium between the two reflective surfaces. The interferometer is configured to receive an optical signal from a laser and produce an interferogram in response. The camera system is configured to receive the interferogram from the interferometer and generate interferogram data in response. The interferogram data represents the interferogram received from the interferometer. The sensor is configured to sense an environmental parameter of the transmission medium and generate sensor data in response. The control system is configured to perform operations including, receiving the interferogram data from the camera system and the sensor data from the sensor; and computing a wavelength of the laser based on the interferogram data and the sensor data.

Defects are detected using data acquired from an interference channel and a polarization modification channel in an interferometer. The interference objective splits a polarized illumination beam into a reference illumination that is reflected by a reference surface without modification to the polarization, and a sample beam that is reflected by a sample surface, that may modify the polarization. Light from the sample beam with no change in polarization is combined with the reference illumination and directed to the interference channel, which may measure the reflectivity and/or topography of the sample. Light from the sample beam with modified polarization is directed to the polarization modification channel. The intensity of the light detected at the polarization modification channel may be used, along with the reflectivity and topography data to identify defects or other characteristics of the sample.