Disclosed is a 3D scanner for recording the 3D topography of an object, the 3D scanner including: a projector unit configured for projecting a structured beam of probe light onto the object; an imaging unit arranged to acquire 2D images of the object when the object is illuminated by the structured probe light beam; and an actuator unit arranged to control the position of the structured probe light beam at the object by rotating a movable portion of the projector unit around a pivoting axis, the actuator unit including a rotation motor including or arranged to drive a wheel, where the surface of the wheel operatively coupled to the movable portion of the projector unit has a radial distance from the axis of the rotation motor which changes with the rotation.

A method for optically inspecting a surface (10) of an object (1) and an inspection device (9) are described. With the method a temporally periodic pattern (13) with different illumination patterns (130) is generated on the surface (10) by means of a illumination device (8) of the inspection device (9) during an image recording sequence (13), and in the image recording sequence a number of images of the pattern (13) on the surface (10) are recorded by means of an image recording device (7) of the inspection device (9), wherein generating one of the different illumination patterns (130) is synchronised, respectively, with the image recording of one of the images of the pattern (13), the phase of the pattern (13) is determined from the succession of the recorded known illumination patterns (130) in at least one image point and defects (4, 5) on the surface (10) are detected from deviations of the recorded illumination pattern (130) from the generated known illumination pattern (130). The illumination device (8) and the image recording device (7) are arranged in the reflection angle (α), wherein the object (1) is moved relative to the inspection device (9) and the duration of the image recording sequence is chosen such that a sequence reflection zone (17) can be regarded as constant (FIG. 4b).

A method and an apparatus of inspecting a substrate with a component mounted thereon, which are capable of inspecting whether the component is properly mounted or not without additional setting or changing inspection condition, are provided. The method comprises measuring a three-dimensional shape by irradiating the pattern image toward the substrate through at least one illumination unit and by taking a reflected image through an imaging unit, extracting a shield region from the three-dimensional shape, and inspecting a component mounting defect in an area excluding the shield region in the three-dimensional shape.

A depth camera assembly (DCA) has a light source assembly, a mask, a camera assembly, and a controller. The light source assembly includes at least one light source. The mask is configured to generate an interference pattern that is projected into a target area. The mask has two openings configured to pass through light emitted by the at least one light source, and the light passed through the two openings forms an interference pattern across the target area. The interference pattern has a phase based on a position of the light source. The camera assembly is configured to capture images of a portion of the target area that includes the interference pattern. The controller is configured to determine depth information for the portion of the target area based on the captured images.

Apparatuses, methods and storage media for providing a depth image of an object are described. In some embodiments, the apparatus may include a projector to project a light pattern on an object, and to move the projected light pattern over the object, to swipe the object with the light pattern, and a camera coupled with the projector. The camera may include a dynamic vision sensor (DVS) device, to capture changes in at least some image elements that correspond to an image of the object, during the swipe of the object with the light pattern. The apparatus may further include a processor coupled with the projector and the camera, to generate a depth image of the object, based at least in part on the changes in the at least some image elements. Other embodiments may be described and claimed.

An embodiment is a three-dimensional measurement system including a projection device configured to generate a fringe pattern by interference between two light beams and project the fringe pattern onto an object, and a mobile terminal, wherein the projection device includes a fringe generation unit composed of a planar lightwave circuit including a phase modulator, the fringe generation unit being configured to generate the fringe pattern, and a phase control unit configured to control the phase modulator and change a phase of the fringe pattern, wherein the mobile terminal includes a camera configured to perform image-taking of the object, the fringe pattern being projected onto the object, and an image analysis unit configured to analyze a plurality of images which are taken by the camera and are different in the phase of the fringe pattern and calculate three-dimensional shape data of the object.

A three-dimensional measuring method and system for modulating three-dimensional codes at periodic edges are disclosed, the method includes: step A according to a number of phase levels and a composition rule of the three-dimensional codes, converting the number of phase levels into three-dimensional codes, modulating the three-dimensional codes to periodic edges; step B generating N pieces of modulated three-dimensional codes on periodic edges to form a sinusoidal fringe pattern, according to a N-step phase shift method; step C projecting N pieces of fringe patterns to a surface of an object, collecting the deformed N pieces of fringe patterns on the object surface; step D solving a wrapping phase and a mean intensity of N pieces of fringe patterns; step E since the mean intensities of the adjacent periodic edge codes are different, extracting edge coordinates from the mean intensities by using an edge extraction method.

Methods, systems, and apparatuses are provided for estimating a location on an object in a three-dimensional scene. Multiple radiation patterns are produced by spatially modulating each of multiple first radiations with a distinct combination of one or more modulating structures, each first radiation having at least one of a distinct radiation path, a distinct source, a distinct source spectrum, or a distinct source polarization with respect to the other first radiations. The location on the object is illuminated with a portion of each of two or more of the radiation patterns, the location producing multiple object radiations, each object radiation produced in response to one of the multiple radiation patterns. Multiple measured values are produced by detecting the object radiations from the location on the object due to each pattern separately using one or more detector elements. The location on the object is estimated based on the multiple measured values.

A calibration method of three-dimensional measurement system includes a projection device, a camera and a processor. The projection device projects structural light to a reference object including a first calibration surface and a second calibration surface. The camera photographs the reference object to obtain at least one reference object image. The processor performs decoding according to the at least one reference object image to obtain a plurality of pieces of phase data of the at least one reference object image. The processor computes a first phase corresponding to the first calibration surface and a second phase corresponding to the second calibration surface according to the phase data, calculates a surface phase difference between the first phase and the second phase, and computes according to the surface phase difference and a height of the second calibration surface relative to the first calibration surface to obtain a phase-height conversion parameter.

Systems and methods for 3D image scanner for real-time, dynamic 3D surface imaging are disclosed. Embodiments of the present system and methods describe a system and method including a first and/or second, camera, and projector projecting structured light with fringe patterns onto a 3D object, and a processor configured to extract a phase map and a texture image from the image, and to calculate depth information from the phase map by the processor. Embodiments further describe methods and systems for determining an wrapped phase from the images using the Hilbert transformation, generating an absolute phase from the wrapped phase using the combination of a quality-guidance path following algorithm, a double wavelength phase unwrap algorithm, or a Markov Random field method, and generating a phase map from the absolute phase to determine depth information of the 3D object. The captured 3D geometric surfaces are registered, tracked using algorithms of conformal map, optimal transportation map and a Teichmuller map.