The present invention discloses a non-interferometric, non-iterative complex amplitude reading method and apparatus. The reading method includes the following steps: diffracting a light beam containing amplitude information and phase information to obtain a diffraction pattern with intensity variations; constructing a diffraction intensity-complex amplitude model and training it based on the correlation between the diffraction pattern and amplitude information and phase information, and applying the trained model directly to new diffraction images to obtain amplitude information and phase information. The method can achieve detection of complex amplitude information, including amplitude and phase, from a single diffraction image, improve the stability and accuracy of phase reading results, increase the calculation speed, and simplify the optical system. It is suitable for applications in holographic storage, biomedical image processing, and microscopic imaging, among others.

A metrology system includes a first beam analysis system for analyzing at least one first measurement beam that was coupled from the excitation laser beam before a reflection on the target material and a second beam analysis system for analyzing at least one second measurement beam that was coupled from the excitation laser beam after a reflection on the target material. Each of the first beam analysis system and the second beam analysis system has at least one wavefront sensor system.

A laser absorptivity measurement device uses a linearly polarized incident beam, an optical configuration comprising an internal polarizing beamsplitter that transmits the linearly polarized incident beam and a quarter-wave plate that converts linearly polarized incident beam into a circularly polarized incident beam that is reflected off a processing substrate. The quarter-wave plate and polarizing beamsplitter can then direct the reflected light back into an integrating volume, where the power of the reflected light can be measured by a photodetector. The laser absorptivity measurement device is capable of making real-time absorption efficiency measurements of a variety of laser-based processes, including laser welding and brazing, additive manufacturing, and laser marking.

A measurement device for a light-emitting device includes a light attenuator, a photometric sphere, and a light detector. The light attenuator includes a first surface and a heat dissipator. A first light that is emitted from the first light-emitting device is incident on the first surface. The first surface is configured to absorb a portion of the first light. The heat dissipator is configured to dissipate heat of the first surface. The photometric sphere has an inner surface to reflect the first light reflected by the first surface. The light detector is configured to receive at least a portion of the first light reflected by the inner surface.

A flash detection device comprises at least a first and a second sensor module, wherein each of the sensor modules comprises at least a photodiode for detecting an irradiance emitted by a source, and the first sensor module comprises at least an angular efficiency attenuator configured for attenuating the irradiance received by the photodiode according to a predetermined angular efficiency profile, wherein the at least first and second sensor modules are configured for collecting light from substantially the same field of view, and the angular efficiency attenuator of the first sensor module causes the first and second sensor modules to have complementary predetermined angular efficiency profiles, so that, for angles of view within a common field of view of the first and second sensor modules, a combination of irradiance measurements of the first and second sensor modules enables to derive an irradiance source angle of the source.

A lighting fixture includes a light source, a housing coupled to the light source, a light sensor, and a sensor cover over the light sensor and coupled to the housing. The housing includes an opening through which light generated by the light source is emitted towards an area of interest, and an exposed surface that reflects light such that the housing appears at a first color. The sensor cover includes a front surface that reflects light such that the sensor cover appears at a second color, which is substantially similar to the first color, and has an average transmittance greater than 10% within a desired wavelength band. By providing the sensor cover with the reflectance and average transmittance as described, a functional sensor cover that aesthetically blends with a lighting fixture is achieved.

A light source device for calibrating an image sensor is provided. The light source device includes a light source unit for outputting light, a transform filter unit for controlling a color temperature according to a wavelength of the light received from the light source unit, and a plurality of diffusion plates for controlling a ratio of long-wavelength light to short-wavelength light, the long-wavelength light and the short-wavelength light being output from the light source unit.

An optical sensor package includes a substrate, a wall disposed upon the substrate, and a cover layer disposed on the wall. The substrate, the wall, and the cover layer at least partially define a cavity. The optical sensor package also includes a sensor disposed upon the substrate within the cavity. A cloaking layer is disposed upon to the cover layer. The cloaking layer is transmissive to at least a portion of a light spectrum and is configured to at least partially conceal the sensor. In some examples, the optical sensor package also includes a light source disposed upon the substrate within another cavity at least partially defined by the wall and the cover layer.

A display screen includes a first glass substrate including a color filter region and a light shielding region. The light shielding region includes a transparent region at a first position of the light shielding region. The display screen further includes a second glass substrate including a display control circuit. The display control circuit controls display statuses of the color filter region. The display screen also includes a light intensity sensor at a second position of the second glass substrate. The first position and the second position satisfy a preset relative positional correspondence to allow light transmitted through the first position to reach the light intensity sensor.

A method of patterning lithographic substrates, the method comprising using a free electron laser to generate EUV radiation and delivering the EUV radiation to a lithographic apparatus which projects the EUV radiation onto lithographic substrates, wherein the method further comprises reducing fluctuations in the power of EUV radiation delivered to the lithographic substrates by using a feedback-based control loop to monitor the free electron laser and adjust operation of the free electron laser accordingly.