An apparatus (100) for testing suction cups (138) mounted on a track (162) is disclosed. The apparatus (100) comprises a base (102) comprising a first surface (104) and a second surface (106) opposite the first surface (104). The apparatus further comprises ports (108) penetrating the base (102) from the first surface (104) to the second surface (106) and vacuum sensors (112) pneumatically coupled to the ports (108). The ports (108) in the base (102) are arranged in a geometric pattern (110).

Techniques for measuring vacuum pressure using a memristor element are described. A vacuum sensor can include a memristor element having a semiconductor substrate, a memristive material layer, and a conductive electrode. The off-state resistance of the memristor element can be sensitive to changes in ambient pressure at the element. The off-state resistance of the memristor element may also exhibit a well-defined increase at pressures below a threshold pressure. Measurement of the off-state resistance may be obtained with low power consumption and without changing the resistance or switching the state of the memristor element. The measurements may be used to both determine a leak rate of the ambient pressure within the volume of interest and determine if the sensor is exposed to vacuum pressure below the threshold pressure.

Techniques for measuring vacuum pressure using a memristor element are described. A vacuum sensor can include a memristor element having a semiconductor substrate, a memristive material layer, and a conductive electrode. The off-state resistance of the memristor element can be sensitive to changes in ambient pressure at the element. The off-state resistance of the memristor element may also exhibit a well-defined increase at pressures below a threshold pressure. Measurement of the off-state resistance may be obtained with low power consumption and without changing the resistance or switching the state of the memristor element. The measurements may be used to both determine a leak rate of the ambient pressure within the volume of interest and determine if the sensor is exposed to vacuum pressure below the threshold pressure.

A device is disclosed including a substrate and a floating blinded infrared detector and/or a shunted blinded infrared detector. The floating blinded infrared detector may include an infrared detector coupled to and thermally isolated from the substrate; and a blocking structure disposed above the infrared detector to block external thermal radiation from being received by the infrared detector; and wherein the blocking structure comprises a plurality of openings. The shunted blinded infrared detector may include an additional infrared detector coupled to the substrate; an additional blocking structure disposed above the infrared detector to block external thermal radiation from being received by the additional infrared detector; and a material that thermally couples the additional infrared detector to the substrate and the additional blocking structure. Methods for using and forming the device are also disclosed.

A plating method includes holding a substrate with a substrate holder while bringing a sealing member into pressure contact with a peripheral portion of the substrate to form an enclosed internal space in the substrate holder; performing a first-stage leakage test of the substrate holder by producing a vacuum in the internal space and checking whether pressure in the internal space reaches a predetermined vacuum pressure within a certain period of time; and if the substrate holder has passed the first-stage leakage test, performing a second-stage leakage test of the substrate holder by closing off the internal space after producing the vacuum therein and checking whether a change in the pressure in the internal space reaches a predetermined value within a certain period of time.

Provided is a controlled atmosphere container controller for a controlled atmosphere container. The controlled atmosphere container comprises a cargo space for storing cargo, and the controller is configured to perform a test for an air leak in the controlled atmosphere container. The test comprises the controlled atmosphere container controller causing a first characteristic of an atmosphere in the cargo space to have a first value, stopping causing the first characteristic to have the first value, receiving, in a time period following the stopping, a signal from a sensor configured to sense a second characteristic of the atmosphere in the cargo space, the signal representative of a value of the second characteristic of the atmosphere in the cargo space during the time period, and performing an action to permit determination of an air leak in the controlled atmosphere container, on the basis of the signal.

A testing device includes a test gas container, which is provided with a test leak for producing a test gas flow at a predefined leakage rate. The test leak includes at least one capillary tube, which connects the interior of the test gas container to the outer surroundings of the test gas container in a gas-conducting manner. The test gas container is at least partially made of a flexible material.

A leak test system and a leak test method are provided for testing whether a semi-finished product of a speaker has a leak. The semi-finished product of the speaker includes a case. An interface is installed on a surface of the case. The leak test system includes a covering element, a vacuum generator, and a pressure gauge. The covering element is attached on the surface of the case, so that the interface of the semi-finished product of the speaker is covered by the covering element. A negative pressure value of the covering element is generated by the vacuum generator. If the equilibrium pressure value is lower than a default negative pressure value, the leak test system judges that the semi-finished product of the speaker has the leak. Consequently, the testing efficiency is enhanced.

A leak test system and a leak test method are provided for testing whether a semi-finished product of a speaker has a leak. The semi-finished product of the speaker includes a case. An interface is installed on a surface of the case. The leak test system includes a covering element, a vacuum generator, and a pressure gauge. The covering element is attached on the surface of the case, so that the interface of the semi-finished product of the speaker is covered by the covering element. A negative pressure value of the covering element is generated by the vacuum generator. If the equilibrium pressure value is lower than a default negative pressure value, the leak test system judges that the semi-finished product of the speaker has the leak. Consequently, the testing efficiency is enhanced.

A plating method includes holding a substrate with a substrate holder while bringing a sealing member into pressure contact with a peripheral portion of the substrate to form an enclosed internal space in the substrate holder; performing a first-stage leakage test of the substrate holder by producing a vacuum in the internal space and checking whether pressure in the internal space reaches a predetermined vacuum pressure within a certain period of time; and if the substrate holder has passed the first-stage leakage test, performing a second-stage leakage test of the substrate holder by closing off the internal space after producing the vacuum therein and checking whether a change in the pressure in the internal space reaches a predetermined value within a certain period of time.