A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.

An illuminator for a viewing unit of an optical inspection machine for the quality control of parts, in particular gaskets, comprises a diffusion chamber, a diffuse illumination source, a low-angle illumination source, a direct illumination source placed in the diffusion chamber, and an annular reflective element placed in the diffusion chamber. The annular reflective element is integral to the direct illumination source so that together they form a chamber closure assembly delimiting the upper end of the diffusion chamber. The chamber closure assembly can move axially by translational movement in the diffusion chamber both toward and away from the diffuse illumination source.

An inspection device for inspecting a state of a coating agent applied to a target surface having a protruding portion includes: an image capture device configured to capture an image of a predetermined inspection target region of the target surface; and an illumination device configured to emit light possible to be captured by the image capture device, toward the inspection target region, wherein the illumination device includes: a first light source configured to emit diffuse light toward an entirety of the inspection target region; and a second light source configured to emit direct light toward a shadow that is cast by the protruding portion due to emission of the diffuse light by the first light source.

A device, system and method for inspecting containers by detecting a reflected light beam are described. A light source emits a directed light beam through a container. One or more cameras are oriented to detect and measure portions of the directional light beam reflected by one or more fragments contained within the container.

Disclosed is a lighting box for taking an exposure of an object, having a casing defining a closed housing for an object to be examined and including a bottom and a cover, a lighting system including a plurality of light sources disposed around the casing, the casing acting as a light guide over its entire extent in order to ensure substantially uniform lighting of the housing.

An imaging device configured to image a printed state of a target surface of a target object for inspection includes: a first light source; a diffuser including an inner periphery surface covered with a diffuse reflection material, and configured to diffusely reflect light emitted from the first light source and emit diffusely reflected light to the target surface; and a line sensor configured to receive light resulting from reflecting the diffusely reflected light from the target surface.

A method of determining a physical characteristic of an adhesive material on a semiconductor device element using structured light is provided. The method includes the steps of: (1) applying a structured light pattern to an adhesive material on a semiconductor device element; (2) creating an image of the structured light pattern using a camera; and (3) analyzing the image of the structured light pattern to determine a physical characteristic of the adhesive material. Additional methods and systems for determining physical characteristics of semiconductor devices and elements using structured light are also provided.

Wide-angled incoherent millimeter or sub-millimeter electromagnetic waves from an extended active source are used to probe substrates and their protective coatings or outer layers, such as paint or thermal insulation. The incoherent waves provide dispersion and angular variation with respect to angular incidence to the substrate. Illumination of the substrate permits differentiation between un-corroded and corroded sections of the sample because reflectivity, emissivity and/or transmissivity from the substrate or protective coating various according to its homogeneousness. A detector/camera is arranged to identify and resolve differences in detected power within an observed frequency range of the area under test, with this contrast in power being relative to either adjacent areas or anticipated reference levels. The power differences therefore signify the presence or lack of corrosion or, indeed, the presence of anomalies within or on the substrate or in or under the protective coating or layer applied to the substrate.

Wide-angled incoherent millimetre or sub-millimetre electromagnetic waves from an extended active source are used to probe substrates and their protective coatings or outer layers, such as paint or thermal insulation. The incoherent waves provide dispersion and angular variation with respect to angular incidence to the substrate. Illumination of the substrate permits differentiation between un-corroded and corroded sections of the sample because reflectivity, emissivity and/or transmissivity from the substrate or protective coating various according to its homogeneousness. A detector/camera is arranged to identify and resolve differences in detected power within an observed frequency range of the area under test, with this contrast in power being relative to either adjacent areas or anticipated reference levels. The power differences therefore signify the presence or lack of corrosion or, indeed, the presence of anomalies within or on the substrate or in or under the protective coating or layer applied to the substrate.

A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.