An electronic device for optically detecting an appearance of a product for defects includes a first camera device, a second camera device, at least one white light source, and at least one red light source. The first camera device is perpendicular to a plane of the product to be detected. When the red light source is activated, the first camera device captures images of edges of the plane of the product, when the white light source is activated, the second camera device captures images of the plane of the product. The electronic device detects the appearance of the plane of the product for defects according to the images captured by the first and second camera devices, the defects can include stair slope errors, scratches, sanding marks, and gas marks.

An inspection system for inspecting multiple surfaces of a substrate includes at least one illuminator that produces light at a first wavelength that is incident on the substrate at a first angle (e.g., normal) and light at a second wavelength directed that is obliquely incident on the substrate. An adjustment system adjusts the oblique angle. The substrate may be opaque to one of the wavelengths and at least partially transparent to the other wavelength. Detection optics collect backscattered light from the substrate and at least one detector generates a first image representative of the first surface of the substrate and a second image representative of a second surface or near the second surface of the substrate. The images may be compared to generate a third image representative of defects on or near the second surface of the substrate corrected for residual signals of defects on the first surface.

Information of plant based on color of a surface of plant is acquired from image data obtained by imaging plant, allowing to acquire information of plant at low cost, compared to chlorophyll meter or spectroscopic analyzer. In crop production like rice plant, fertilization management including fertilizer application management like fertilizer amount determination, or other agricultural works, is supported through a smart phone or the like based on data to be observed, like converted leaf color value is calculated from image data obtained by crop imaging. Camera is connected to smart phone. Converted leaf color value can be obtained from image data obtained by imaging leaf of rice plant by camera. Converted leaf color value is transmitted to management server, for example, amount information of applied fertilizer is required in case where converted leaf color value is less than standard, can be obtained as management information for fertilizer application management.

A wafer inspection apparatus includes: a stage configured such that a wafer is arranged on the stage; an optical apparatus configured to align the wafer on the stage and generate an optical intensity image including an optical intensity profile; a focus adjusting unit configured to align light incident onto the wafer to be in-focus; and an image processor configured to integrate the optical intensity image with vertical level data of the in-focus to generate and analyze a three-dimensional (3D) image.

Systems and methods of the present disclosure include at least one building component detection sensor device configured to be deployed within (or proximate to) a building comprised of a plurality of building components. The at least one building component detection sensor device is configured to detect data relating to at least one building component of the plurality of building components. In addition, a building component property determination system includes a processor configured to execute instructions stored in memory to determine one or more properties of the at least one building component based at least in part on the data detected by the at least one building component detection sensor device.

An inspection system includes an acquisition unit and a determination unit. The acquisition unit acquires an image representing a surface of an object. The determination unit performs color determination processing. The color determination processing is performed to determine a color of the surface of the object based on a plurality of conditions of reflection. The plurality of conditions of reflection are obtained from the image representing the surface of the object as acquired by the acquisition unit, and have a specular reflection component and a diffuse reflection component at respectively different ratios on the surface of the object.

Disclosed is a method of performing a measurement in an inspection apparatus, and an associated inspection apparatus and HHG source. The method comprises configuring one or more controllable characteristics of at least one driving laser pulse of a high harmonic generation radiation source to control the output emission spectrum of illumination radiation provided by the high harmonic generation radiation source; and illuminating a target structure with said illuminating radiation. The method may comprise configuring the driving laser pulse so that the output emission spectrum comprises a plurality of discrete harmonic peaks. Alternatively the method may comprise using a plurality of driving laser pulses of different wavelengths such that the output emission spectrum is substantially monochromatic.

A welding tip inspection apparatus and method to mom accurately inspect dressing quality and a foreign object attachment regarding a front end of a welding tip using a color sensing technique is provided. The welding tip inspection apparatus includes an inspection block on which a front end of a welding tip is mounted, a color sensor that is disposed within the inspection block, that is configured to irradiate light to the front end of the welding tip and that is configured to receive the reflected light from the front end of the welding tip. A controller is configured to analyze a wavelength of each color of the reflected light received by the color sensor.

An inspection apparatus for performing inspection of an object includes an illumination device configured to illuminate the object, an imaging device configured to image the object illuminated by the illumination device, and a processor configured to perform processing for the inspection based on an image obtained by the imaging device. The processor is configured to perform the processing based on a first image obtained by the imaging device under dark field illumination by the illumination device with light having a first wavelength and a second image obtained by the imaging device under dark field illumination by the illumination device with light having a second wavelength different from the first wavelength.

A binocular image analysis-based asphalt road surface damage detection system, comprising five sub-systems for crack development degree detection model establishment, information collection, information analysis, information transmission and information distribution. Specifically, road surface damage information detection is performed by means of a mobile platform, a processing end, a temperature measurement-type infrared thermal imaging instrument, an ordinary image collector, a vibration sensor, image processing technology, edge cloud computing technology, an embedded system, system integration technology and real-time positioning technology.